VISUAL PRINTED WIRING BOARD FAULT DETECTION BY A GEOMETRICAL METHODKRAKAUER L; PAVLIDIS T.1979; COMPSAC 79. INTERNATIONAL COMPUTER SOFTWARE AND APPLICATIONS CONFERENCE. 3/1979/CHICAGO IL; USA; NEW YORK: IEEE; DA. 1979; PP. 260-265; BIBL. 6 REF.Conference Paper

WHEN TO USE RANDOM TESTINGAGRAWAL VD.1978; I.E.E.E. TRANS. COMPUTERS; USA; DA. 1978; VOL. 27; NO 11; PP. 1054-1055; BIBL. 15 REF.Article

DETECTION BY PILOTS OF SYSTEM FAILURES DURING INSTRUMENT LANDINGS.EPHRATH AR; CURRY RE.1977; I.E.E.E. TRANS. SYST. MAN CYBERN.; U.S.A.; DA. 1977; VOL. 7; NO 12; PP. 841-848; BIBL. 18 REF.Article

DETERMINATION DU MINIMUM NECESSAIRE DE TESTS, POUR LE DIAGNOSTIC DES PROTECTIONS COMPLEXES A RELAISPOLYAKOV VE; FEDOTOV VP; ORLOV VA et al.1975; ELEKTRICHESTVO; S.S.S.R.; DA. 1975; NO 9; PP. 78-81; BIBL. 5 REF.Article

F-8 DFBW SENSOR FAILURE IDENTIFICATION USING ANALYTIC REDUNDANCY.DECKERT JC; DESAI MN; DEYST JJ et al.1977; I.E.E.E. TRANS. AUTOMAT. CONTROL; U.S.A.; DA. 1977; VOL. 22; NO 5; PP. 795-803; BIBL. 23 REF.Article

SPECIFIC FAILURE IDENTIFICATION ALGORITHMS FOR THE F-8.HARTMANN GL; STEIN G.1976; IN: CONF. DECIS. CONTROL. SYMP. ADAPT. PROCESSES. 15. PROC.; CLEARWATER, FLA.; 1976; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1976; PP. 29-31; BIBL. 5 REF.Conference Paper

OPTIMISATION DES ERREURS DANS UNE PROCEDURE DE CONTROLE EN DEUX ETAPESFOMIN LA; CHERNOSKUTOV AI.1975; AVTOMAT. VYCHISLIT. TEKH., LATV. S.S.R.; S.S.S.R.; DA. 1975; NO 3; PP. 34-36; BIBL. 5 REF.Article

A PRACTICAL APPROACH TO FAULT DETECTION IN COMBINATIONAL NETWORKSTZIDON A; BERGER I; YOELI M et al.1978; I.E.E.E. TRANS. COMPUTERS; USA; DA. 1978; VOL. 27; NO 10; PP. 968-971; BIBL. 7 REF.Article

OPTIMUM DETECTION OF FAILURES IN AN N-COMPONENT SYSTEM. = DETECTION OPTIMALE DES PAUVRES DANS UN SYSTEME A N COMPOSANTSASHOK KUMAR.1975; Z. ANGEW. MATH. MECH.; DTSCH.; DA. 1975; VOL. 55; NO 11; PP. 679-680; BIBL. 1 REF.Article

POSSIBILITES CONDITIONNELLES DE CONTROLE DES COMBINAISONS D'ENTREE D'UN ELEMENT A MEMOIRESKLYAREVICH AN.1975; AVTOMAT. VYCHISLIT. TEKHNOL., LATV. S.S.R.; S.S.S.R.; DA. 1975; NO 5; PP. 34-42; BIBL. 1 REF.Article

CONSTRUCTION D'UNE SEQUENCE D'ENTREE DETECTANT UNE PANNE DONNEE D'UN DISPOSITIF DISCRETKARIBSKIJ VV.1972; AVTOMAT. I TELEMEKH.; S.S.S.R.; DA. 1972; NO 5; PP. 153-162; ABS. ANGL.; BIBL. 4 REF.Serial Issue

PROPRIETES DES PANNES MULTIPLES DANS LES CIRCUITS LOGIQUES A CONTACTSMELKADZE TG; SAPOZHNIKOV VV; SAPOZHNIKOV VV et al.SAPOZHNIKOV VV; SAPOZHNIKOV VV et al.1981; AVTOM. TELEMEH.; ISSN 0005-2310; SUN; DA. 1981; NO 11; PP. 139-146; ABS. ENG; BIBL. 2 REF.Article

CASCADE STRUCTURE IN TOTALLY SELF-CHECKING NETWORKS.KOLUPAEV S.1977; IN: FTCS-7. ANNU. INT. CONF. FAULT-TOLERANT COMPUT. 7; LOS ANGELES; 1977; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1977; PP. 150-154; BIBL. 4 REF.Conference Paper

FAILURE ACCOMODATION IN DIGITAL FLIGHT CONTROL SYSTEMS BY BAYESIAN DECISION THEORY.MONTGOMERY RC; CAGLAYANT AK.1976; J. AIRCR.; U.S.A.; DA. 1976; VOL. 13; NO 2; PP. 69-75; BIBL. 8 REF.Article

FAULT DETECTION IN A TWO LEVEL NEGATIVE GATE NETWORK.PAL A; PALIT A; PAL S et al.1975; J. INSTIT. ELECTRON. TELECOMMUNIC. ENGRS; INDIA; DA. 1975; VOL. 21; NO 2; PP. 58-65; BIBL. 8 REF.Article

CONSTRUCTION DES TESTS DES CIRCUITS COMBINATOIRES. II. TEST MINIMAL POUR LA VERIFICATION DE LA SORTIE DU CIRCUITAMBRAZYAVICHYUS RM.1975; LIET. T.S.R. MOKSLU AKAD. DARB., B; S.S.S.R.; DA. 1975; NO 2; PP. 121-127; ABS. LITU. ANGL.; BIBL. 4 REF.Article

DIAGNOSIS AND FAULT EQUIVALENCE IN COMBINATIONAL CIRCUITS.ROY BK.1974; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1974; VOL. 23; NO 9; PP. 955-963; BIBL. 16 REF.Article

GO/NO-GO TESTING. A THING OF THE PAST..1974; IN: IEEE INTERCON. INT. CONV. EXPO. INST. ELECTR. ELECTRON. ENG.; NEW YORK; 1974; NEW YORK; I.E.E.E.; DA. 1974; PP. (18P.)Conference Paper

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RELIABILITY CHARACTERISTICS OF ALTERNATIVE CHECK UP SCHEDULES FOR DETECTING HIDDEN FAILURESGERTSBAKH IB.1978; J. OPERAT. RES. SOC.; GBR; DA. 1978; VOL. 29; NO 12; PP. 1219-1229; BIBL. 2 REF.Article

SOME CONCEPTION OF FAULT DIAGNOSIS IN ANALOG ELECTRONIC CIRCUITSZIELONKO R; KROLIKOWSKI A; HOJA J et al.1978; ROZPH. ELEKTROTECH.; POL; DA. 1978; VOL. 34; NO 3; PP. 511-524; ABS. POL/FRE/GER/RUS; BIBL. 17 REF.Article

A RELIABLE DUAL-REDUNDANT SENSOR FDI SYSTEM FOR THE NASA F8C-DFBW AIRCRAFT.DECKERT JC; DESAI MN; DEYST JJ JR et al.1976; IN: CONF. DECIS. CONTROL. SYMP. ADAPT. PROCESSES. 15. PROC.; CLEARWATER, FLA.; 1976; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1976; PP. 32-37; BIBL. 3 REF.Conference Paper

FAULT ISOLATION VIA COMPONENTS SIMULATIONSAEKS R; SUDARSHAN PAL SINGH; RUEY WEN LIU et al.1972; I.E.E.E. TRANS. CIRCUIT THEORY; U.S.A.; DA. 1972; VOL. 19; NO 6; PP. 634-640; BIBL. 8 REF.Serial Issue

ELABORATION DE TESTS DE DETECTION DE PANNES DANS LES SYSTEMES SEQUENTIELSCOURVOISIER M.1972; AUTOMATISME; FR.; DA. 1972; VOL. 17; NO 10; PP. 297-304; ABS. ANGL.; BIBL. 10 REF.Serial Issue

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