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ROTATION BETWEEN MICROGRAPHS FROM THE SCANNING ELECTRON MICROSCOPE AND ELECTRON CHANNELLING PATTERNS.VAN ESSEN CG; VERHOEVEN JD.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 9; PP. 768-770; BIBL. 4 REF.Article

A DISTORTION-FREE MAP FOR USE WITH ELECTRON CHANNELLING PATTERNS.STOTT DE; WISE MLH; HUTCHINSON WB et al.1975; J. MICR.; G.B.; DA. 1975; VOL. 105; NO 3; PP. 305-307; BIBL. 5 REF.Article

ROTATION BETWEEN SEM MICROGRAPH AND ELECTRON CHANNELLING PATTERNS.DAVIDSON DL.1976; J. PHYS. E; G.B.; DA. 1976; VOL. 9; NO 5; PP. 341-343; BIBL. 4 REF.Article

THEORETICAL MODEL FOR THE ENERGY DEPENDENCE OF ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY.SANDSTROEM R; SPENCER JF; HUMPHREYS CJ et al.1974; J. PHYS. D; G.B.; DA. 1974; VOL. 7; NO 7; PP. 1030-1046; BIBL. 31 REF.Article

ZUM BILDKONTRAST KRISTALLINER OBJEKTE IN DER RASTERELEKTRONENMIKROSKOPIE. = CONSTRASTE DE L'IMAGE D'OBJETS CRISTALLINS EN MICROSCOPIE ELECTRONIQUE A BALAYAGEWERNER U; BETHGE H; HEYDENREICH J et al.1974; KRISTALL U. TECH.; DTSCH.; DA. 1974; VOL. 9; NO 2; PP. 97-105; ABS. ANGL.; BIBL. 6 REF.Article

A NOTE CONCERNING ELECTRON-DIFFRACTION SYMMETRIESEADES JA.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 4; PP. 368-369; BIBL. 2 REF.Article

ELECTRON CHANNELLING PATTERNS IN SCANNING ELECTRON MICROSCOPY.SCHULSON EM.1977; J. MATER. SCI.; G.B.; DA. 1977; VOL. 12; NO 6; PP. 1071-1087; BIBL. 1 P. 1/2Article

QUALITATIVE ASSESSMENT OF ION EROSION DAMAGE BY MEANS OF ELECTRON CHANNELING PATTERNS.NEWBURY DE.1976; NATION. BUR. STAND., SPEC. PUBL.; U.S.A.; DA. 1976; NO 400-23; PP. 61-63; BIBL. 6 REF.Article

THE USE OF P & ID'S IN THE DESIGN OF WASTEWATER TREATMENT PLANTSSMITH RH.1980; ISA 80. ADVANCES IN INSTRUMENTATION. 35. INTERNATIONAL INSTRUMENTATION-AUTOMATION CONFERENCE AND EXHIBIT/1980/HOUSTON TX; USA; RESEARCH TRIANGLE PARK NC: INSTRUMENT SOCIETY OF AMERICA; DA. 1980; PP. 403-408Conference Paper

A NOTE ON THE CONTRAST MECHANISM OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON MICROSCOPY.YAMAMOTO T.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 43; NO 1; PP. K53-K56; BIBL. 8 REF.Article

CAN GRAVITATIONAL TORQUES BE USED TO STUDY GRAIN BOUNDARY ENERGY ANISOTROPY.MYKURA H; GLEITER H.1979; SCRIPTA METALLURG.; USA; DA. 1979; VOL. 13; NO 2; PP. 137-140; BIBL. 11 REF.Article

CONTRAST MECHANIMS IN ELECTRON-CHANNELLING PATTERNS AND LATTICE-DEFECT IMAGES OBTAINED WITH A SCANNING ELECTRON MICROSCOPEYAMAMOTO T; MORI M; ISHIDA Y et al.1978; PHILOS. MAG., A; GBR; DA. 1978; VOL. 38; NO 4; PP. 439-461; BIBL. 2 P.Article

SELECTED-AREA ELECTRON-CHANNELING PATTERNS FROM GEOLOGICAL MATERIALS: SPECIMEN PREPARATION, INDEXING AND REPRESENTATION OF PATTERNS AND APPLICATIONSLLOYD GE; HALL MG; COCKAYNE B et al.1981; CAN. MINERAL.; ISSN 0008-4476; CAN; DA. 1981; VOL. 19; NO 4; PP. 505-518; ABS. FRE; BIBL. 2 P.Article

GROSSWINKEL-ELEKTRONEN-CHANNELING-DIAGRAMME ZUR UNTERSUCHUNG EPITAKTISCH HERGESTELLTER SCHICHTEN. = DIAGRAMME DE CANALISATION D'ELECTRONS A GRAND ANGLE POUR L'ETUDE DE COUCHES GROSSIES PAR EPITAXIEBRUNNER M; KOHL HJ; NIEDRIG H et al.1978; OPTIK; DTSCH.; DA. 1978; VOL. 49; NO 4; PP. 477-485; ABS. ANGL.; BIBL. 16 REF.Article

AXIAL CHANNELING IN ELECTRON DIFFRACTION.ICHIMIYA A; LEHMPFUHL G.1978; Z. NATURFORSCH., A; DTSCH.; DA. 1978; VOL. 33; NO 3; PP. 269-281; BIBL. 19 REF.Article

THE INVESTIGATION OF ION IMPLANTED LAYERS BY SCANNING ELECTRON MICROSCOPY.ROTHEMUND W; FRITZSCHE CR.1976; APPL. PHYS.; GERM.; DA. 1976; VOL. 10; NO 2; PP. 111-119; BIBL. 8 REF.Article

AN EXPERIMENTAL PROOF OF THE DEPENDENT BLOCH WAVE MODEL BY LARGE-ANGLE ELECTRON SCATTERING FROM THIN CRYSTALSHAGEMANN P; REIMER L.1979; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1979; VOL. 40; NO 3; PP. 367-375; BIBL. 9 REF.Article

Théorie de la formation de figures de canalisation en microscopie électronique à balayage des cristauxDUDAREV, S. L.Kristallografiâ. 1987, Vol 32, Num 2, pp 320-327, issn 0023-4761Article

Many-beam effects and phase information in electron channelling patternsMARTHINSEN, K; HØIER, R.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, Num 6, pp 484-492, issn 0108-7673Article

SINGLE CRYSTAL SILICON FILMS ON AMORPHOUS INSULATORS: GROWTH BY LATERAL NUCLEATED EPITAXY USING SCANNING LASER AND ELECTRON BEAMS AND EVALUATION BY ELECTRON BACKSCATTERING CONTRASTSEDGWICK TO; GEISS RH; DEPP SW et al.1982; JOURNAL OF THE ELECTROCHEMICAL SOCIETY; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 12; PP. 2802-2808; BIBL. 17 REF.Article

ZEROORDER LINES IN ELECTRON CHANNELING PATTERNS FROM CRYSTALS OF ALUMINUM AND IRON AT VARIOUS TEMPERATURES = RAIES D'ORDRE ZERO DANS LES DIAGRAMMES DE CANALISATION D'ELECTRONS A PARTIR DE CRISTAUX D'ALUMINIUM ET DE FER A DIVERSES TEMPERATURESYAMASHITA T.1981; J. ELECTRON MICROSC.; ISSN 0022-0744; JPN; DA. 1981; VOL. 30; NO 4; PP. 298-304; BIBL. 6 REF.Article

EXPERIMENTAL ASPECTS OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON MICROSCOPY. I. MEASUREMENT OF CONTRAST.YAMAMOTO T.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 44; NO 1; PP. 137-146; ABS. ALLEM.; BIBL. 27 REF.Article

PRODUCTION OF LARGE-AREA SINGLE-CRYSTAL WAFERS OF CUBIC SIC FOR SEMICONDUCTOR DEVICESNISHINO S; POWELL JA; WILL HA et al.1983; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1983; VOL. 42; NO 5; PP. 460-462; BIBL. 12 REF.Article

SCANNING ELECTRON MICROSCOPY 1981, CONFERENCE, (DALLAS TX, APRIL 14-18), 1981 = MICROSCOPIE ELECTRONIQUE A BALAYAGE 1981. CONFERENCE TENUE A DALLAS, TEXAS, DU 14 AU 18 AVRIL 19811981; SCANNING ELECTRON MICROSCOPY 1981. CONFERENCE/1981-04-14/DALLAS TX; USA; AMF O'HARE: SCANNING ELECTRON MICROSCOPY; DA. 1981; VOL. 1,4; 2 VOL.; 29 CMConference Proceedings

ELECTRON MICROSCOPY SOCIETY OF AMERICA. ANNUAL MEETING. 34TH, MIAMI BEACH FLORIDA, AUGUST 9-13 19741976; BATON ROUGE; CLAITOR'S PUBL.; DA. 1976; PP. 1-659; BIBL. DISSEM.Conference Proceedings

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