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ON THE INFLUENCE OF THE DISTORTION DISTRIBUTION ON THE DETERMINATION OF ROENTGENOGRAPHIC PARTICLE SIZES AND DISTORTIONS. I. INTRODUCTION AND CALCULATION OF DISTORTION DISTRIBUTIONSROELL H; SCHULZ H.1982; CRYST. RES. TECHNOL. (1979); ISSN 0232-1300; DDR; DA. 1982; VOL. 17; NO 5; PP. 651-658; BIBL. 11 REF.Article

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SOME PRACTICAL ASPECTS OF THE FOURIER DECONVOLUTIONCERNANSKY M.1983; JOURNAL OF APPLIED CRYSTALLOGRAPHY; ISSN 0021-8898; DNK; DA. 1983; VOL. 16; NO 1; PP. 103-112; BIBL. 2 P.Article

EIN ELEKTRONENINTERFEROMETER ZUR PHASENBESTIMMUNG IN BEUGUNGSBILDERN NATUERLICHER KRISTALLE = UN INTERFEROMETRE ELECTRONIQUE POUR LA DETERMINATION DE LA PHASE DANS LES DIAGRAMMES DE DIFFRACTION DES CRISTAUX NATURELSBERNDT H; DOLL R.1983; OPTIK (STUTTGART); ISSN 0030-4026; DEU; DA. 1983; VOL. 64; NO 4; PP. 349-366; ABS. ENG; BIBL. 8 REF.Article

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RANDOM SET MODELS IN THE INTERPRETATION OF SMALL-ANGLE SCATTERING DATASONNTAG U; STOYAN D; HERMANN H et al.1981; PHYSICA STATUS SOLIDI. (A). APPLIED RESEARCH; ISSN 0031-8965; DDR; DA. 1981; VOL. 68; NO 1; PP. 281-288; ABS. GER; BIBL. 12 REF.Article

New electron diffraction techniques using electronic hollow-cone illuminationKONDO, Y; ITO, T; HARADA, Y et al.Japanese journal of applied physics. 1984, Vol 23, Num 3, pp L178-L180, issn 0021-4922, 2Article

COMPUTATIONAL TRIALS FOR PHASE RETRIEVAL IN ELECTRON MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERNSXIMEN JI YE; YAN JI WEN.1983; OPTIK (STUTTGART); ISSN 0030-4026; DEU; DA. 1983; VOL. 64; NO 4; PP. 331-340; ABS. GER; BIBL. 17 REF.Article

IDENTIFICATION OF POLYTYPES OF MX₂-TYPE COMPOUNDS. II: STRUCTURES OF 20 NEW POLYTYPES OF CADMIUM IODIDEPALOSZ B.1983; ACTA CRYSTALLOGRAPHICA. SECTION C. CRYSTAL STRUCTURE COMMUNICATIONS; ISSN 51277X; DNK; DA. 1983; VOL. 39; NO 5; PP. 521-528; BIBL. 11 REF.Article

Affinement de réseaux à partir de diagrammes de diffraction de profil totalSERYKH, V. P; VERKHOROBIN, L. F.Kristallografiâ. 1986, Vol 31, Num 1, pp 173-174, issn 0023-4761Article

General aspects of beam threshold effects in leedGAUBERT, C; BAUDOING, R; GAUTHIER, Y et al.Surface science. 1984, Vol 147, Num 1, pp 162-178, issn 0039-6028Article

An improved technique for examining Bragg reflections in Δω, Δ2Θ^(δ) spaceMATHIESON, A. M; STEVENSON, A. W.Australian journal of physics. 1984, Vol 37, Num 6, pp 657-665, issn 0004-9506Article

Precession Electron CrystallographyDORSET, Doug; GILMORE, Chris.Zeitschrift für Kristallographie. 2010, Vol 225, Num 2-3, issn 0044-2968, 82 p.Serial Issue

X-ray powder diffraction profile fitting in quantitative determination of two polymorphs from their powder mixtureTANNINEN, V. P; YLIRUUSI, J.International journal of pharmaceutics. 1992, Vol 81, Num 2-3, pp 169-177, issn 0378-5173Article

Image resolution enhancement by combining information from electron diffraction pattern and micrographFAN HAI-FU; XIANG SHI-BIN; LI FANG-HUA et al.Ultramicroscopy. 1991, Vol 36, Num 4, pp 361-365, issn 0304-3991Article

X-ray particle-size broadeningRAO, S; HOUSKA, C. R.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, pp 6-13, issn 0108-7673, 1Article