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A rotating sample mouting device for a Guinier powder diffractometerBRÜDERL, G; BURZLAFF, H; PERDIKATSIS, B et al.Journal of applied crystallography. 1994, Vol 27, pp 127-128, issn 0021-8898, 1Article

TRIPLE CRYSTAL DIFFRACTOMETER INVESTIGATIONS OF SILICON CRYSTALS WITH DIFFERENT COLLIMATOR-ANALYZER ARRANGEMENTS = DREIKRISTALLDIFFRAKTOMETER-UNTERSUCHUNGEN VON SILIZIUMKRISTALLEN MIT VERSCHIEDENEN KOLLIMATOR-ANALYSATOR-ANORDNUNGEN = EXAMEN DES CRISTAUX DE SILICIUM AU DIFFRACTOMETRE A TROIS CRISTAUX POUR DIFFERENTES POSITIONS DU COLLIMATEUR ET DE L'ANALYSEURZAUMSEIL P; WINTER U.1982; PHYS. STATUS SOLIDI (A), APPL. RES.; DDR; DA. 1982-04; VOL. 70; NO 2; PP. 497-505; BIBL. 12 REF.Article

THE INFLUENCE OF THE DISPERSION AND VERTICAL DIVERGENCE ON THE REFLECTION CURVE OF A DOUBLE-CRYSTAL ARRANGEMENT = DER EINFLUSS DER DISPERSION UND DER VERTIKALDIVERGENZ AUF DIE REFLEXIONSKURVE EINER DOPPELKRISTALLANORDNUNG = INFLUENCE DE LA DISPERSION ET DE LA DIVERGENCE VERTICALE SUR LA COURBE DE REFLEXION D'UNE STRUCTURE BICRISTALLINEBRUEMMER O; EISENSCHMIDT C; NIEBER J et al.1982; CRYST. RES. TECH.; DDR; DA. 1982-04; VOL. 17; NO 4; PP. 509-513; BIBL. 3 REF.Article

A laue diffractometer with δ geometryLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1992, Vol 25, pp 440-443, issn 0021-8898, 3Article

A theoretical model for the correction of intensity aberrations in Bragg-Brentano X-ray diffractometers - detailed description of the algorithmMATULIS, C. E; TAYLOR, J. C.Journal of applied crystallography. 1993, Vol 26, pp 351-356, issn 0021-8898, 3Article

Resolution investigations of X-ray three-crystal diffractometersBRÜGEMANN, L; BLOCH, R; PRESS, W et al.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 688-692, issn 0108-7673, 5Article

Angle calculations for a five-circle diffractometer used in surface X-ray diffraction experimentsWANG, S.-K; DAI, P; TAUB, H et al.Journal of applied crystallography. 1993, Vol 26, pp 697-705, issn 0021-8898, 5Article

A curved-crystal spectrometer for soft X-ray emission studies of metals and metallic alloys = Ein gekruemmtes Kristallspektrometer fuer die Untersuchung der Emission weicher Roentgenstrahlen von Metallen und LegierungenZSCHECH, E; BLAU, W; WEHNER, B et al.Crystal research and technology (1979). 1984, Vol 19, Num 7, pp 1007-1014, issn 0232-1300Article

A novel monochromator housing with completely shielded beam path from X-ray source to sampleIHRINGER, J; RÖTTGER, K.Journal of applied crystallography. 1994, Vol 27, pp 1063-1065, issn 0021-8898, 6Article

A novel Guinier diffractometer with automated adjustment and settingsIHRINGER, J; RÖTTGER, K.Journal of physics. D, Applied physics (Print). 1993, Vol 26, Num 4A, pp A32-A34, issn 0022-3727Article

Protection against goniostat collisions for the Huber 511 goniostat used in conjunction with the San Diego multiwire area detector systemLEIDICH, R; HAMILTON, P; BERNAL, V et al.Journal of applied crystallography. 1993, Vol 26, issn 0021-8898, p. 466, 3Article

A personal-computer-controlled single-crystal diffractometerSVENSSON, C; STAHL, K.Journal of applied crystallography. 1993, Vol 26, pp 728-729, issn 0021-8898, 5Article

Angle calculations for a six-circle surface X-ray diffractometerLOHMEIER, M; VLIEG, E.Journal of applied crystallography. 1993, Vol 26, pp 706-716, issn 0021-8898, 5Article

A PRINCIPAL DISTINCTION BETWEEN DIFFERENT KINDS OF X-RAY EQUIPMENT FOR RESIDUAL STRESS MEASUREMENTJAENSSON B.1980; MATER. SCI. ENG.; CHE; DA. 1980-04; VOL. 43; NO 2; PP. 169-176; BIBL. 4 REF.Article

HEXAMOLYBDATES DES TERRES RARESGOKHMAN LZ; LYSANOVA GV; DULIN DA et al.1974; ZH. NEORG. KHIM.; S.S.S.R.; DA. 1974; VOL. 19; NO 8; PP. 2018-2022; BIBL. 5 REF.Article

STRUCTURAL ANALYSIS OF MOLTEN LICL BY X-RAY DIFFRACTION = ETUDE PAR DIFFRACTOMETRIE X DE LA STRUCTURE DU LICL FONDUIWAMOTO N; UMESAKI N; ASAHINA T et al.1980; WELDING RESEARCH IN THE 1980'S. INTERNATIONAL CONFERENCE. POSTER SESSION/1980/OSAKA; JPN; OSAKA: JWRI; DA. 1980; PP. 43-45; BIBL. 2 REF.; LOC. ISConference Paper

Parallel-slit analyzer developed for the purpose of lowering tails of diffraction profilesFUJINAWA, G; TORAYA, H; STAUDENMANN, J.-L et al.Journal of applied crystallography. 1999, Vol 32, pp 1145-1151, issn 0021-8898, 6Article

An open-flow helium cryostat for single-crystal X-ray diffraction experimentsHARDIE, M. J; KIRSCHBAUM, K; MARTIN, A et al.Journal of applied crystallography. 1998, Vol 31, pp 815-817, issn 0021-8898, 5Article

Microcomputer-based acquisition system for the Philips PW1050 powder diffractometerGRIGG, M. W; KEATING, A; BROCKWELL, A et al.Journal of applied crystallography. 1992, Vol 25, pp 652-653, issn 0021-8898, 5Article

Axial divergence in a conventional X-ray powder diffractometer. II. Realization and evaluation in a fundamental-parameter profile fitting procedureCHEARY, R. W; COELHO, A. A.Journal of applied crystallography. 1998, Vol 31, pp 862-868, issn 0021-8898, 6Article

Angle calculations for a '2+2' surface X-ray diffractometerEVANS-LUTTERODT, K. W; MAU-TSU TANG.Journal of applied crystallography. 1995, Vol 28, pp 318-326, issn 0021-8898, 3Article

Synthesizing and fitting linear position-sensitive detector step-scanned line profilesCHEARY, R. W; COELHO, A.Journal of applied crystallography. 1994, Vol 27, pp 673-681, issn 0021-8898, 5Article

Scanning range and dimensions of diffraction spots for a generally inclined geometry considering the mosaic anisotropy and primary-beam divergenceRUBINSKII, S. V; KHEIKER, D. M; WESTER, D. W et al.Crystallography reports. 1993, Vol 38, Num 3, pp 315-319, issn 1063-7745Article

Ionization chambers for monitoring the position and tilt of X-ray beamsARNDT, U. W; KYTE, M. P.Journal of applied crystallography. 2000, Vol 33, pp 986-987, issn 0021-8898, 3Article

A vacuum chamber for low background diffraction experimentsNEDER, R. B; BURGHAMMER, M; GRASL, T et al.Zeitschrift für Kristallographie. 1996, Vol 211, Num 9, pp 591-593, issn 0044-2968Article

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