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THE AVOIDANCE OF MULTIPLE DIFFRACTION ERRORS IN SINGLE CRYSTAL INTENSITY MEASUREMENTS OF LOW TEMPERATURES.HINE R; RICHARDS JPG; TICHY K et al.1975; J. APPL. CRYSTALLOGR.; DENM.; DA. 1975; VOL. 8; NO 1; PP. 37-41; BIBL. 5 REF.Article

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A SINGLE-CRYSTAL AUTOMATIC INDEXING PROCEDURE.JACOBSON RA.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 2; PP. 115-118; BIBL. 7 REF.Article

A LEED GONIOMETER.DE BERSUDER L.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 12; PP. 1569-1572; BIBL. 5 REF.Article

SIZE AND SHAPE OF 5 S RIBOSOMAL RNACONNORS PG; BEEMAN WW.1972; J. MOLEC. BIOL.; G.B.; DA. 1972; VOL. 71; NO 1; PP. 31-37; BIBL. 21REF.Serial Issue

THE PHASE PROBLEM IN CRYSTALLOGRAPHY: PROPOSAL FOR AN EXPERIMENTAL SOLUTION.COTTERILL RMJ; GERWARD L; LINDEGAARD ANDERSEN A et al.1978; PHYS. SCRIPTA; SUEDE; DA. 1978; VOL. 17; NO 4; PP. 461-462; BIBL. 10 REF.Article

L'ISOLEMENT DES PARTICULES FIBREUSES D'ORIGINE PULMONAIRE ET LEUR IDENTIFICATION PAR DIFFRACTION DES RAYONS X ET DES ELECTRONSLE BOUFFANT L; DURIF S; MARTIN JC et al.1972; REV. TUBERC. PNEUMOL.; FR.; DA. 1972; VOL. 36; NO 8; PP. 1237-1248; ABS. ANGL.; BIBL. 13REF.Serial Issue

DIFFRAKTOMERWINKEL FUR DIE MESSUNG DER INTEGRALEN INTENSITAETEN DICHT BENACHBARTER REFLEXE MIT EINEM VIER-KREIS-DIFFRAKTOMETER. = ANGLE DU DIFFRACTOMETRE POUR LA MESURE DES INTENSITES INTEGREES DE REFLEXIONS VOISINES AVEC UN DIFFRACTOMETRE A 4 CERCLESROTHBAUER R.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 209-211; ABS. ANGL.; BIBL. 3 REF.Article

ERRORS IN DEFORMATION-DENSITY AND VALENCE-DENSITY MAPS: THE SCALE-FACTOR CONTRIBUTION.REES B.1978; ACTA CRYSTALLOGR., A; DANEM.; DA. 1978; VOL. 34; NO 2; PP. 254-256; BIBL. 5 REF.Article

THE INFLUENCE OF THE PRIMARY BEAM SHAPE ON THE EXTINCTION CORRECTION.URBAN JP.1976; ACTA CRYSTALLOGR., A; DANEM.; DA. 1976; VOL. 32; NO 4; PP. 631-635; BIBL. 4 REF.Article

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A SIMPLE GEOMETRICAL INTERPRETATION OF THE SUPERSTRUCTURES RACP X RACP (P=3, 7, 19, 31, 49,...) OBSERVED ON SURFACES WITH HEXAGONAL SYMMETRY BY MEANS OF LEED AND RHEEDDE RIDDER R; VAN DYCK D; AMELINCKX S et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 50; NO 1; PP. K67-K71; BIBL. 15 REF.Article

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A differential reflection high energy electron diffraction measurement systemCHANG, C. E; CHIN, T. P; TU, C. W et al.Review of scientific instruments. 1991, Vol 62, Num 3, pp 655-659, issn 0034-6748Article

A simple positioning device for LEED opticsTAYLOR, J. S. G; NORRIS, C.Journal of physics. E. Scientific instruments. 1988, Vol 21, Num 6, pp 620-621, issn 0022-3735Article

Improved LEED system using positio-sensitive detectionMALIC, R. A.Review of scientific instruments. 1988, Vol 59, Num 9, pp 1951-1953, issn 0034-6748Article

KRISTALLSTRUKTURUNTERSUCHUNGEN AN FETTALKOHOLEN UND FETTSAEUREN MIT ELEKTRONEN- UND ROENTGENBEUGUNG. I. = ETUDE DE LA STRUCTURE CRISTALLINE DES ALCOOLS GRAS ET DES ACIDES GRAS A L'AIDE DE LA DIFFRACTION ELECTRONIQUE ET DES RAYONS X. IPRECHT D.1976; FETTE SEIFEN ANSTRICHMITTEL; DTSCH.; DA. 1976; VOL. 78; NO 4; PP. 145-149; ABS. ANGL.; BIBL. 18 REF.Article

A NOVEL DEVICE FOR THE DIRECT RECORDING OF DIFFRACTOGRAMSFREEMAN LA.1980; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1980; VOL. 120; NO 1; PP. 105-107; BIBL. 4 REF.Article

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COMPUTER PROGRAMS FOR RADIAL DISTRIBUTION ANALYSES OF X-RAY AND ELECTRON DIFFRACTION DATA.RENNINGER AL; KAPLOW R.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 253-254; BIBL. 1 REF.Article

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Effects of energy filtering in LACBED patternsJORDAN, I. K; ROSSOUW, C. J; VINCENT, R et al.Ultramicroscopy. 1991, Vol 35, Num 3-4, pp 237-243, issn 0304-3991Article

Instrumentation for low-energy electron diffractionLAGALLY, M. G; MARTIN, J. A.Review of scientific instruments. 1983, Vol 54, Num 10, pp 1273-1288, issn 0034-6748Article