CALCUL DE L'INFLUENCE DE LA CORRELATION DES DONNEES EXPERIMENTALES SUR LA MATRICE D'ERREURS DES PARAMETRES POUR LA DIFFRACTOMETRIE ELECTRONIQUE EN PHASE VAPEURANASHKIN MG; BERSHOV VA.1974; IZVEST. VYSSH. UCHEBN. ZAVED., KHIM. KHIM. TEKHNOL.; S.S.S.R.; DA. 1974; VOL. 17; NO 9; PP. 1319-1322; BIBL. 4 REF.Article

A LEED GONIOMETER.DE BERSUDER L.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 12; PP. 1569-1572; BIBL. 5 REF.Article

LA DIFFRACTION DES ELECTRONS LENTS: ESPOIRS ET LIMITES.ABERDAM D.1975; VIDE; FR.; DA. 1975; VOL. 30; NO 176; PP. 76-85; ABS. ANGL.; BIBL. 28 REF.Article

IMPROVED METHOD FOR LEED INTENSITY MEASUREMENTS.FELTER TE; ESTRUP PJ.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 1; PP. 158-160; BIBL. 5 REF.Article

ERROR ANALYSIS AND ADJUSTMENT OF THE LEED GONIOMETER.ABERDAM D; BAUDOING R; DE BERSUDER L et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 12; PP. 1573-1579; BIBL. 7 REF.Article

APPLICATION OF THE GRAIN-COUNTING TECHNIQUE TO ELECTRON DIFFRACTION EXPERIMENTS.TURMAN B; ANDERSEN P.1974; ACTA CHEM. SCAND., A; DANEM.; DA. 1974; VOL. 28; NO 2; PP. 229-232; BIBL. 6 REF.Article

A SIMPLE GEOMETRICAL INTERPRETATION OF THE SUPERSTRUCTURES RACP X RACP (P=3, 7, 19, 31, 49,...) OBSERVED ON SURFACES WITH HEXAGONAL SYMMETRY BY MEANS OF LEED AND RHEEDDE RIDDER R; VAN DYCK D; AMELINCKX S et al.1978; PHYS. STATUS SOLIDI, A; DDR; DA. 1978; VOL. 50; NO 1; PP. K67-K71; BIBL. 15 REF.Article

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FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER CONTROLLED TELEVISION SYSTEM.HEILMANN P; LANG E; HEINZ K et al.1976; APPL. PHYS.; GERM.; DA. 1976; VOL. 9; NO 3; PP. 247-251; BIBL. 2 REF.Article

A QUICK METHOD FOR IDENTIFYING ELECTRON DIFFRACTION PATTERNS.DE HAAN CD; KOLKMAN HJ.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 10; PP. 796-797Article

ON THE INVESTIGATION OF SURFACE STRUCTURE BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTION (RHEED)NIELSEN PEH.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 194-210; BIBL. 26 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND. SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

LA PREVISION DU DIAGRAMME DE DIFFRACTION ELECTRONIQUE D'UN MICROCRISTAL.LARROQUE P; BRIEU M; LAFOURCADE L et al.1976; C.R. ACAD. SCI., B; FR.; DA. 1976; VOL. 282; NO 14; PP. 309-312; BIBL. 12 REF.Article

ELECTRON DIFFRACTION FROM SINGLE, FULLY-HYDRATED, OX-LIVER CATALASE MICROCRYSTALS.DORSET DL; PARSONS DF.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 2; PP. 210-215; H.T. 1; BIBL. 39 REF.Article

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INDEXING OF DIFFRACTING PLANES USING THE KIKUCHI PATTERN.WU W; CHEN LJ; WASHBURN J et al.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 2; PP. 563-566; BIBL. 7 REF.Article

ROLE OF UPPER-LAYER INTERACTIONS IN ELECTRON DIFFRACTION SYMMETRICS.GOODMAN P; STEEDS.1974; NATURE; G.B.; DA. 1974; VOL. 251; NO 5477; PP. 698-702; BIBL. 20 REF.Article

THE CHAIN METHOD OF LEED/MEED INTENSITY ANALYSIS FOR THE STUDY OF NACL STRUCTUREMASUD N; KINNIBURGH CG; TITTERINGTON DJ et al.1979; J. PHYS. C: SOLID STATE PHYS.; ISSN 0022-3719; GBR; DA. 1979; VOL. 12; NO 23; PP. 5263-5270; BIBL. 2 P.Article

APPAREILLAGES ET METHODE EXPERIMENTALE EN DIFFRACTION D'ELECTRONS LENTSZYRYANOV GK; KNYAZEV SA.1976; UCHEN. ZAP. LENINGRAD. GOS. UNIV., FIZ. NAUK; S.S.S.R.; DA. 1976; NO 19; PP. 36-60; BIBL. 6 P.Article

ON THE RESPONSE OF PHOTOGRAPHIC EMULSIONS TO ELECTRONS IN GAS-PHASE ELECTRON DIFFRACTION EXPERIMENTS.BEAGLEY B; FOORD A; ULBRECHT V et al.1978; J. PHYS. E; G.B.; DA. 1978; VOL. 11; NO 4; PP. 357-360; BIBL. 11 REF.Article

MODERNE METHODEN ZUR OBERFLAECHENANALYSE AN GLAESERN. = METHODES MODERNES D'ANALYSE DE SURFACE DES VERRES. IHAHNERT M; RAUSCHENBACH B.1977; SILIKATTECHNIK; DTSCH.; DA. 1977; VOL. 28; NO 12; PP. 369-371Article

MANIPULATEUR UNIVERSEL POUR ELECTRONOGRAPHE BASSE TENSIONBENEDIKTOV YU A; ZAKALOV BA.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 3; PP. 210-211; BIBL. 5 REF.Article

A FACILE LOCATION OF GONIOMETER TILT-AXIS POSITION WITH RESPECT TO A SINGLE-CRYSTAL ELECTRON-DIFFRACTION PATTERN ORIENTATION.DORSET DL.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 2; PP. 142-144; BIBL. 12 REF.Article

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