kw.\*:("DIFFRACTOMETRIE RX")
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ROENTGENOGRAPHISCHE BESTIMMUNG VON KRISTALLITGROEPEN UNTER BERUCKSICHTIGUNG VON GITTERVERZERRUNGEN. = DETERMINATION PAR LES RAYONS X DES TAILLES DE CRISTALLITES EN TENANT COMPTE DES DEFORMATIONS DE RESEAUGOLOB P; HORN H; KRAUTZ E et al.1974; ACTA PHYS. AUSTR.; AUSTR.; DA. 1974; VOL. 40; NO 2; PP. 104-118; ABS. ANGL.; BIBL. 19 REF.Article
UEBER MEHRSTELLIGE FEHLERGRENZEN. = SUR LA VALIDITE DES ECARTS TYPESMENZER G.1974; Z. KRISTALLOGR.; DTSCH.; DA. 1974; VOL. 140; NO 5-6; PP. 399-404; ABS. ANGLArticle
NOUVEAU PROCEDE D'INDEXATION DES PLANS ET DIRECTION DANS LE SYSTEME HEXAGONALVASIL'EV DM.1975; TRUDY L.P.I., LENINGRAD; S.S.S.R.; DA. 1975; NO 341; PP. 71-77; BIBL. 2 REF.Article
COMMENTS ON HIGH-PRECISION ORIENTATION OF CRYSTALS USING THE LAUE METHOD WITH CHARACTERISTIC X-RAYS BY G. CHRISTIANSEN, L. GERWARD AND I. ALSTRUP.MCINTYRE GJ; BARNEA Z; CHRISTIANSEN G et al.1976; ACTA CRYSTALLOGR., A; DENM.; DA. 1976; VOL. 32; NO 1; PP. 168; BIBL. 3 REF.Article
THE APPLICATION OF THE CONVOLUTION RELATIONS IN X-RAY LINE BREADTH ANALYSIS. II.NANDI RK; SEN GUPTA SP.1976; J. PHYS. D; G.B.; DA. 1976; VOL. 9; NO 4; PP. 593-600; BIBL. 4 REF.Article
THE PROBLEM OF WHITE RADIATION IN THE MEASUREMENT OF INTENSITIES WITH A SOLID-STATE DETECTOR.HOWARD HJ; JONES RDG.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 235; BIBL. 2 REF.Article
DEFINITION OF A PARAMETER WHICH MEASURES THE HOMOGENEITY OF A MATERIAL.DE BERGEVIN F.1975; J. PHYS., COLLOQ.; FR.; DA. 1975; NO 2; PP. 69-71; ABS. FR.; BIBL. 2 REF.; (STRUCT. COMPACTE DESORDONNEE. TABLE RONDE. EXPO. COMMUN.; ORSAY, FR.; 1974)Conference Paper
THE EFFECTS OF INSTRUMENTAL DISTORSTION IN X-RAY DIFFRACTION STUDIES OF LIQUIDS. I. A STUDY OF THE RELATIVE EFFECTIVENESS OF SEVERAL MONOCHROMATIZING TECHNIQUES.SMELSER SC; HENNINGER EH; PINGS CJ et al.1975; J. APPL. CRYSTALLOGR.; DENM.; DA. 1975; VOL. 8; NO 1; PP. 8-11; BIBL. 7 REF.Article
DATA COLLECTION IN PROTEIN CRYSTALLOGRAPHY: CAPILLARY EFFECTS AND BACKGROUND CORRECTIONS.KRIEGER M; CHAMBERS JL; CHRISTOPH GG et al.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 6; PP. 740-748; BIBL. 11 REF.Article
GEOMETRIC SOURCES OF REDUNDANCY IN INTENSITY DATA AND THEIR USE FOR PHASE DETERMINATION.BRICOGNE G.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 3; PP. 395-405; BIBL. 12 REF.Article
PROBABILITY DISTRIBUTION OF X-RAY INTENSITIES IN A NON-CENTROSYMMETRIC CRYSTAL WITH A DEGREE OF CENTROSYMMETRY.PARTHASARATHY S; PARTHASARATHI V.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 3; PP. 310-315; BIBL. 17 REF.Article
THE RESIDUAL AND ITS USE FOR PARTIAL STRUCTURE EVALUATION. A CRITICAL NOTE ON THE DISCRIMINATOR FUNCTION.LENSTRA ATH.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 31; NO 3; PP. 363-369; BIBL. 19 REF.Article
EINIGE NEUE ANSAETZE ZUR ROENTGENBEUGUNG, IM BESONDEREN ZUR RUECKSTRAHLDIFFRAKTOMETRIE. II. = SUR DE NOUVEAUX ASPECTS EN DIFFRACTION RX, EN PARTICULIER SUR LA DIFFRACTOMETRIE EN RETOURROBITSCH J.1974; JB. NATURWISSENSCH. ABTG JOANNEUM; OESTERR.; DA. 1974; PP. 86-95; BIBL. 8 REF.Article
AUTOMATED DIFFRACTOMETRY.SPINRAD R.1977; ACTA CRYSTALLOGR., B; DANEM.; DA. 1977; VOL. 33; NO 1; PP. 18-20; BIBL. 8 REF.Article
ACCURATE INTERPOLATION OF X-RAY SCATTERING FACTOR TABLES.DIETRICH H.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 238-239; BIBL. 3 REF.Article
THE APPLICATION OF THE CONVOLUTION RELATIONS IN THE X-RAY LINE BREADTH ANALYSIS. I.NANDI RK; SEN GUPTA SP.1975; J. PHYS. D; G.B.; DA. 1975; VOL. 8; NO 7; PP. 731-737; BIBL. 14 REF.Article
ANHARMONIC THERMAL VIBRATIONS IN GERMANIUM.MAIR SL; BARNEA Z.1975; J. PHYS. SOC. JAP.; JAP.; DA. 1975; VOL. 38; NO 3; PP. 866-869; BIBL. 21 REF.Article
EVALUATION OF THE ABSORPTION FACTOR.PASZKOWSKA J.1974; ZASTOSOW. MAT.; POLSKA; DA. 1974; VOL. 14; NO 2; PP. 245-275; ABS. POL.; BIBL. 1 REF.Article
INTENSITY DETERMINATION BY PROFILE FITTING APPLIED TO PRECESSION PHOTOGRAPHS.FORD GC.1974; J. APPL. CRYSTALLOGR.; DENM.; DA. 1974; VOL. 7; NO 6; PP. 555-564; BIBL. 27 REF.Article
PRIMARY AND SECONDARY EXTINCTION.LAWRENCE JL.1974; ACTA CRYSTALLOGR., A; DANEM.; DA. 1974; VOL. 30; NO 3; PP. 454-455; BIBL. 8 REF.Article
AN EXTRAPOLATION PROCEDURE FOR THE DERIVATION OF UNIT CELL DIMENSIONS.COWLAM N; GILLOTT L.1974; J. PHYS. E; G.B.; DA. 1974; VOL. 7; NO 9; PP. 725-728; BIBL. 12 REF.Article
A CRYSTALLOGRAPHIC PROGRAM SYSTEM FOR AN IBM 360/75 COMPUTER. SOME FURTHER DEVELOPMENTS.NORD AG.1973; UNIV. STOCKHOLM CHEM. COMMUNIC.; SWED.; DA. 1973; NO 15; PP. 1-32; BIBL. 3 P. 1/2Article
AN X-RAY METHOD FOR LATTICE PARAMETERS.KHANDURI NC.1973; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1973; VOL. 11; NO 5; PP. 328-330; BIBL. 4 REF.Article
ON THE DETERMINATION OF UNIT-CELL DIMENSIONS FROM IN ACCURATE POWDER DIFFRACTION DATA.WERNER PE.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 216-219; BIBL. 5 REF.Article
ON THE UNIQUE SOLUTION OF KOSSEL PATTERNS.CABRERA E; GORDILLO T.1976; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1976; VOL. 33; NO 1; PP. K19-K22; BIBL. 6 REF.Article