INFLUENCE DE LA TAILLE DES GRAINS SUR LA DISTANCE INTERATOMIQUE DES TERRES RARES LOURDES.VERGAND F.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 31; NO 3; PP. 537-550; ABS. ANGL.; BIBL. 12 REF.Article

CALCULATION OF THE EXPANSION IN A GRAPHITE CRYSTAL BY C_N INTERSTITIALS.ENRIQUEZ F; QUINTAS MAG; SANTOS E et al.1975; CARBON; G.B.; DA. 1975; VOL. 13; NO 3; PP. 225-231; BIBL. 21 REF.Article

THE PRECISION OF INTERPLANAR DISTANCES MEASURED BY AN ENERGY-DISPERSIVE DIFFRACTOMETERFUKAMACHI T; HOSOYA S; TERASAKI O et al.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 117-122; BIBL. 8 REF.Serial Issue

THE RELATIVE ACCURACY OF AXIAL AND NON-AXIAL METHODS FOR THE MEASUREMENT OF LATTICE SPACINGSHALL DJ; SELF PG; STOBBS WM et al.1983; JOURNAL OF MICROSCOPY (OXFORD); ISSN 0022-2720; GBR; DA. 1983; VOL. 130; NO 2; PP. 215-224; BIBL. 18 REF.Article

THE X-RAY SPECTROSCOPIC TRUE 2D_CR VALUE AND THE CONCEPT OF "EFFECTIVE" 2D VALUES OF BRAGG CRYSTALS EXEMPLIFIED BY OHM CRYSTALSULMER K.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 58; NO 1; PP. K7-K11; BIBL. 5 REF.Article

PRECISION LATTICE PARAMETER MEASUREMENT BY THE X-RAY DIVERGENT BEAM TECHNIQUEARISTOV VV; SHMYTKO IM.1978; J. APPL. CRYSTALLOGR.; DNK; DA. 1978; VOL. 11; NO 5; PP. 662-668; BIBL. 12 REF.Conference Paper

AXIS: A SEMI-AUTOMATED X-RAY INTENSITY AND D-SPACING ANALYSER FOR FIBER DIFFRACTION PATTERNSMEADER D; ATKINS EDT; ELDER M et al.1980; A.C.S. SYMP. SER.; ISSN 0097-6156; USA; DA. 1980; NO 141; PP. 113-138; BIBL. 21 REF.Article

UEBER DIE RICHTIGKEIT UNF GENAUIGKEIT BEI DER MESSUNG VON NETZEBENENABSTAENDEN = EXACTITUDE ET PRECISION AU COURS DE LA MESURE DES DISTANCES INTERRETICULAIRESVAVRDA J.1979; KRISTALL U. TECH.; DDR; DA. 1979; VOL. 14; NO 6; PP. 753-755; ABS. ENG; BIBL. 8 REF.Article

SOME REMARKS ON THE CORRECTION OF INTERPLANAR SPACINGS FROM GUINIER POWDER PHOTOGRAPHS.FICHTNER SCHMITTLER H.1978; KRISTALL U. TECH.; DTSCH.; DA. 1978; VOL. 13; NO 1; PP. K12-K14; BIBL. 5 REF.Article

METHODE DE DETERMINATION PRECISE DES DISTANCES DES PLANS RETICULAIRES D'APRES LES DIAGRAMMES ELECTRONIQUES EN REFLEXIONPCHELYAKOV OP; STENIN SI.1978; KRISTALLOGRAFIJA; SUN; DA. 1978; VOL. 23; NO 5; PP. 1031-1032; BIBL. 5 REF.Article

ABSOLUTE MEASUREMENT OF THE (220) LATTICE PLANE SPACING IN A SILICON CRYSTALBECKER P; DORENWENDT K; EBELING G et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 46; NO 23; PP. 1540-1543; BIBL. 19 REF.Article

A PROPOS DES DISTANCES DES PLANS RETICULAIRES AU VOISINAGE DES FACES DE CRISTAUX IONIQUES ET DES FORCES DE REPULSION AGISSANT ENTRE LES IONSYAKOVLEV NK.1979; KRISTALLOGRAFIJA; SUN; DA. 1979; VOL. 24; NO 1; PP. 154-155; BIBL. 5 REF.Article

A ¹³C N.M.R. AND X-RAY STUDY OF THE RELATIONSHIP BETWEEN THE DISTRIBUTION OF NITRATE ESTER GROUPS AND INTERCHAIN D(110) SPACINGS IN A SERIES OF CELLULOSE NITRATESCLARK DT; STEPHENSON PJ.1982; POLYMER; ISSN 0032-3861; GBR; DA. 1982; VOL. 23; NO 9; PP. 1295-1299; BIBL. 5 REF.Article

ELECTRICAL CONDUCTANCE OF FAST EXTRUSION FURNACE CARBON BLACK-LOADED STYRENE-BUTADIENE RUBBER DURING SWELLING IN KEROSENEHASSAN HH; NASR GM.1982; J. MACROMOL. SCI., CHEM.; ISSN 0022-233X; USA; DA. 1982; VOL. 18; NO 4; PP. 535-543; BIBL. 15 REF.Article

Precision interplanar spacing measurements of boron-doped siliconSOARES, D. A. W; PIMENTEL, C. A.Journal of applied crystallography. 1983, Vol 16, Num 5, pp 486-492, issn 0021-8898Article

Erreur de mesure des distances des plans réticulaires par suite de la non-uniformité de la déformation du réseauPROKOSHKIN, S. D; KAPUTKINA, L. M; BERNSHTEJN, M. L et al.Kristallografiâ. 1986, Vol 31, Num 2, pp 390-391, issn 0023-4761Article

Etude par rayons X du tétrahydrate de nitrite de calciumMANDRYKA, L. A; MITKEVICH, EH. M; PANASENKO, N. M et al.Žurnal neorganičeskoj himii. 1985, Vol 30, Num 4, pp 1091-1092, issn 0044-457XArticle

ASSESSMENT OF SYNCHROTRON ELECTRON-BEAM DAMAGE IN DIAMOND BY OPTICAL, CATHODOLUMINESCENCE AND X-RAY TOPOGRAPHIC METHODSZHEN HONG M; LANG AR.1980; J. APPL. CRYSTALLOGR.; ISSN 0021-8898; DNK; DA. 1980; VOL. 13; NO 1; PP. 78-87; BIBL. 19 REF.Article

A NEW APPROACH FOR AN ABSOLUTE DETERMINATION OF 2D VALUES OF SPECTROMETER CRYSTALS.FOLL H; ULMER K.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 41; NO 1; PP. 113-116; ABS. ALLEM.; BIBL. 8 REF.Article

POLY(VINYLIDENE FLUORIDE)-GAMMA FE₂O₃ MAGNETIC COMPOSITESREICH S; GOLDBERG EP.1983; JOURNAL OF POLYMER SCIENCE. POLYMER PHYSICS EDITION; ISSN 0098-1273; USA; DA. 1983; VOL. 21; NO 6; PP. 869-879; BIBL. 7 REF.Article

TEMPERATURE DEPENDENCE OF D-SPACING AND DIELECTRIC RELAXATION OF GAMMA -FORM POLY(VINYLIDENE) FLUORIDEITOH T; SAKAOKU K; MAKINO T et al.1981; REP. PROG. POLYM. PHYS. JPN.; ISSN 0486-4476; JPN; DA. 1981; VOL. 24; PP. 371-372; BIBL. 8 REF.Article

MEASUREMENT OF LOCAL VARIATIONS IN SPACING AND ORIENTATION OF LATTICE PLANE OF SYNTHETIC QUARTZYOSHIMURA J; MIYAZAKI T; WADA T et al.1979; CRYST. GROWTH; NLD; DA. 1979; VOL. 46; NO 5; PP. 691-700; BIBL. 9 REF.Article

NATIVE METALS AND INTERMETALLIC COMPOUNDS IN SEDIMENTS OF THE NORTHEASTERN PART OF THE PACIFIC OCEAN = METAUX NATIFS ET COMPOSES INTERMETALLIQUES DANS LES SEDIMENTS DE LA PARTIE NORD-EST DE L'OCEAN PACIFIQUESHTERENBERG LE; VASIL'EVA GL.1979; LITHOL. MINER. RESOUR.; ISSN 0024-4902; USA; DA. 1979; VOL. 14; NO 2; PP. 234-239; BIBL. 11 REF.; DE RUS; 11 ANAL.; 2 TAB. ; TABL./ILL./ANAL.;[LITOL. POLEZN. ISKOPAEM.; SUN; DA. 1979; NO 2; PP. 133-139]Article

X-ray powder diffraction data for 12 drugs in current useKOUNDOURELLIS, John E; MALLIOU, Eleftheria T; SULLIVAN, R. A. L et al.Journal of chemical and engineering data (Print). 2000, Vol 45, Num 6, pp 1001-1006, issn 0021-9568Article

X-ray characterization of 12 vasodilators in current useKOUNDOURELLIS, J. E; MALLIOU, E. T; SULLIVAN, R. A. L et al.Journal of chemical and engineering data (Print). 1999, Vol 44, Num 4, pp 656-660, issn 0021-9568Article