EXAMINATION OF ALUMINUM COPPER FILMS DURING ANODIC OXIDATION. I. CORROSION STUDIES.STREHBLOW HH; DOHERTY CJ.1978; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1978; VOL. 125; NO 1; PP. 30-33; BIBL. 9 REF.Article

NUCLEATION-CONTROLLED OVERGROWTH OF SILICON ON SILICALEAMY HJ; DOHERTY CJ.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 11; PP. 1028-1030; BIBL. 5 REF.Article

VACUUM-EVAPORATED FILMS OF CHROMIUM WITH THE A-15 STRUCTURE.DOHERTY CJ; POATE JM; VOORHOEVE RJH et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 5; PP. 2050-2054; BIBL. 11 REF.Article

CHARGE COLLECTION MICROSCOPY ON P-WSE₂: RECOMBINATION SITES AND MINORITY CARRIER DIFFUSION LENGTHLEWERENZ HJ; FERRIS SD; DOHERTY CJ et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 2; PP. 418-423; BIBL. 34 REF.Article

RESISTIVITIES OF THIN FILM TRANSITION METAL SILICIDESMURARKA SP; READ MH; DOHERTY CJ et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 2; PP. 293-301; BIBL. 32 REF.Article

GRAIN-BOUNDARY DIFFUSION OF AG THROUGH CU FILMSSCHOEN JM; POATE JM; DOHERTY CJ et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 11 PART. 1; PP. 6910-6914; BIBL. 10 REF.Article

THE USE OF NOVEL PTSI THIN FILM STRUCTURES IN PREFERENTIAL SPUTTERING MEASUREMENTSLIAU ZL; DOHERTY CJ; MELLIAR SMITH CM et al.1978; THIN SOLID FILMS; NLD; DA. 1978; VOL. 55; NO 1; PP. 83-88; BIBL. 12 REF.Article

LASER FORMATION OF PT-SI SCHOTTKY BARRIERS ON SILICONDOHERTY CJ; CRIDER CA; LEAMY HJ et al.1980; J. ELECTRON. MATER.; ISSN 0361-5235; USA; DA. 1980; VOL. 9; NO 2; PP. 453-458; BIBL. 8 REF.Article

HYDROGEN PASSIVATION OF POINT DEFECTS IN SILICONBENTON JL; DOHERTY CJ; FERRIS SD et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 36; NO 8; PP. 670-671; BIBL. 18 REF.Article