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HOLOGRAPHIC CONTOURING BY DISPLACING THE OBJECT AND THE ILLUMINATION BEAM.DEMATTIA P; FOSSATI BELLANI V.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 26; NO 1; PP. 17-21; BIBL. 8 REF.Article

EXTENSIONS OF DUAL PLATE-HOLOGRAPHIC INTERFEROMETRY.HANNAH BW; KING WL JR.1977; A.I.A.A.J., NEW YORK; U.S.A.; DA. 1977; VOL. 15; NO 5; PP. 725-727; BIBL. 3 REF.Article

HOLOGRAPHISCHE EXPERIMENTE MIT DER BEUGUNGSWELLE. = EXPERIENCE HOLOGRAPHIQUE AVEC L'ONDE DE DIFFRACTIONKIRCHNER M.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 1; PP. 75-82; ABS. ENG; BIBL. 9 REF.Article

NONLINEAR CROSS-TALK IN TWO-REFERENCE-BEAM HOLOGRAPHIC INTERFEROMETRY.DANDLIKER R; INEICHEN B.1976; OPT. COMMUNIC.; NETHERL.; DA. 1976; VOL. 19; NO 3; PP. 365-369; BIBL. 7 REF.Article

HOLOGRAM INTERFEROMETRY AND SPECKLE PHOTOGRAPHY COMBINED FOR STRESS ANALYSISCHANDRA SHAKHER; SIROHI RS.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 2; PP. 141-146; ABS. GER; BIBL. 23 REF.Article

ANALYSIS OF MANY-COMPONENT MOTION BY DOUBLE EXPOSURE HOLOGRAPHYVIKRAM CS.1978; OPT. QUANTUM ELECTRON.; GBR; DA. 1978; VOL. 10; NO 6; PP. 527-528; BIBL. 6 REF.Article

MAPPATURA DI SUPERFICI MEDIANTE OLOGRAFIA A DOPPIA ESPOSIZIONE CON SPOSTAMENTO DELL' OGGETTO ET DEL FASCIO DI ILLUMINAZIONE = COURBE NIVEAU D'UNE SURFACE A L'AIDE D'HOLOGRAPHIE PAR DOUBLE EXPOSITION AVEC DEPLACEMENT DE L'OBJET ET DU FAISCEAUDE MATTIA P; BELLANI VF.1980; QUAD. RIC. SCI.; ITA; DA. 1980; NO 105; PP. 89-91; BIBL. 5 REF.Conference Paper

MEASUREMENT OF AN ARBITRARY PARALLEL DISPLACEMENT OF A RIGID BODY BY USING POLYCHROMATIC SPECKLE PATTERNS.VU NGOC THINH; TANAKA D.1977; OPT. COMMUNIC.; NETHERL.; DA. 1977; VOL. 20; NO 3; PP. 367-369; BIBL. 7 REF.Article

PRODUCTION OF BINARY AMPLITUDE GRATINGS WITH ARBITRARY OPENING RATIO AND VARIABLE PERIODPATORSKI K.1980; OPT. LASER TECHNOL.; ISSN 0030-3992; GBR; DA. 1980; VOL. 12; NO 5; PP. 267-270; BIBL. 11 REF.Article

INFLUENCE DES ABERRATIONS DU SYSTEME OPTIQUE DANS LES EXPERIENCES DE DOUBLE PHOTOGRAPHIE "SPECKLE"MENU M; ROBLIN ML.1979; J. OPT.; FRA; DA. 1979; VOL. 10; NO 1; PP. 1-11; ABS. ENG; BIBL. 9 REF.Article

DIRECTION-SENSITIVE DISPLACEMENT ANALYSIS BY MULTIPLE FREQUENCY HOLOGRAPHIC INTERFEROMETRY.HOLLOWAY DC; PATACCA AM; FOURNEY WL et al.1978; APPL. OPT.; U.S.A.; DA. 1978; VOL. 17; NO 8; PP. 1213-1219; BIBL. 14 REF.Article

DOUBLE EXPOSURE HOLOGRAPHY FOR THE ANALYSIS OF QUADRATIC MOTION.VIKRAM CS.1977; OPT. QUANTUM ELECTRON.; G.B.; DA. 1977; VOL. 9; NO 4; PP. 353; BIBL. 4 REF.Article

SIMULTANEOUS DETECTION OF DIRECTION OF MOTION AND FRINGE ORDER DETERMINATION IN HOLOGRAPHIC DISPLACEMENT MEASUREMENT.GUPTA PC; AGGARWAL AK.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 12; PP. 2961-2963; BIBL. 3 REF.Article

GENERALITES SUR L'HOLOGRAPHIE ET SAS APPLICATIONS.SMIGIELSKI P.1976; ISL-CO-209-76; FR.; DA. 1976; PP. 1-22; H.T. 21; BIBL. 4 P. 1/2Report

FRANGES ISOPAQUES HOLOGRAPHIQUESAPOSTOL D; MARIS Z; NICOLAU S et al.1976; STUD. CERC. FIZ.; ROMAN.; DA. 1976; VOL. 28; NO 2; PP. 203-207; ABS. ANGL.; BIBL. 2 REF.Article

TESTING THE TRUENESS OF CIRCULAR SURFACES: A SIMPLE HOLOGRAPHIC METHODVIKRAM CS; VEDAM K.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 5; PP. 627-630; BIBL. 3 REF.Article

DETERMINATION DES ABERRATIONS D'UN SYSTEME OPTIQUE PAR INTERFEROMETRIE "SPECKLE"MENU M; ROBIN ML.1979; J. OPT.; FRA; DA. 1979; VOL. 10; NO 2; PP. 71-78; ABS. ENG; BIBL. 7 REF.Article

CONTOURING METHOD BY PARALLEL LIGHT MOIRE HOLOGRAPHY.ASAI K.1978; JAP. J. APPL. PHYS.; JAP.; DA. 1978; VOL. 17; NO 2; PP. 383-389; BIBL. 7 REF.Article

DETERMINATION DES LIGNES DE NIVEAU PAR DOUBLE PHOTOGRAPHIE EN LUMIERE COHERENTE.EL DESSOUKI T; MENU M; ROBLIN ML et al.1977; OPT. COMMUNIC.; NETHERL.; DA. 1977; VOL. 22; NO 3; PP. 307-311; ABS. ANGL.; BIBL. 7 REF.Article

INTERFEROMETRIE DIFFERENTIELLE DES ABERRATIONS D'UN SYSTEME OPTIQUE PAR PHOTOGRAPHIE DE SPECKLES.ROBLIN ML; SCHALOW G; CHOURABI B et al.1977; J. OPT.; FR.; DA. 1977; VOL. 8; NO 3; PP. 149-158; ABS. ANGL.; BIBL. 7 REF.Article

MEASUREMENT OF INPLANE DISPLACEMENTS BY LASER SPECKLE PHOTOGRAPHY.GUPTA PC; AGGARWAL AK.1976; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1976; VOL. 14; NO 8; PP. 670-673; BIBL. 17 REF.Article

PARTICLE VELOCITY DISTRIBUTION MEASUREMENT BY HOLOGRAPHYEWAN BCR.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 18; PP. 3156-3160; BIBL. 9 REF.Article

DOUBLE-EXPOSURE SPECKLE INTERFEROMETRY WITH "INSTANT" POLAROID FILMHARIHARAN P.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 26; NO 3; PP. 325-326; BIBL. 5 REF.Article

GENERATION OF UNIAXIAL MEDIUM FROM BLEACHED PHOTOGRAPHIC PLATESJONATHAN JMC; KINANY R.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 1; PP. 61-64; BIBL. 5 REF.Article

HOLOGRAPHIC INTERFEROMETRY WITH INCREASED SENSITIVITY FOR DIFFUSELY REFLECTING OBJECTS.TOYOOKA S.1977; APPL. OPT.; U.S.A.; DA. 1977; VOL. 16; NO 4; PP. 1054-1057; BIBL. 5 REF.Article

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