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POSSIBILITES DE FOCALISATION SIMULTANEE EN ANGLE ET EN ENERGIE DE MASSES VOISINES DANS DES SPECTROMETRES DE MASSE A DEUX CASCADES ET A IMAGE INTERMEDIAIRESACHENKO VD; GALL RN; FRIDLYANSKIJ GV et al.1979; ZH. TEKH. FIZ.; SUN; DA. 1979; VOL. 49; NO 7; PP. 1491-1497; BIBL. 3 REF.Article

A NEW LINKED SCAN FOR REVERSED GEOMETRY MASS SPECTROMETERSBOYD RK; PORTER CJ; BEYNON JH et al.1981; ORG. MASS SPECTROM.; ISSN 0030-493X; GBR; DA. 1981; VOL. 16; NO 11; PP. 490-494; BIBL. 22 REF.Article

MODIFICATION OF A DOUBLE FOCUSING MASS SPECTROMETER FOR ANGULAR RESOLUTION.FRANCHETTI V; CARMODY JJ; KRAUSE DA et al.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 4; PP. 353-358; BIBL. 5 REF.Article

ADAPTATEUR A ANALYSEUR ELECTROSTATIQUE POUR SPECTROMETRES DE MASSE D'UNE SERIE UNIQUEIVANOV VP; SYSOEV AA; SAMSONOV GA et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 4; PP. 215-216; BIBL. 3 REF.Article

A SEQUENTIAL PULSING TECHNIQUE FOR THE PRODUCTION OF MONOENERGETIC ION BEAMS OF LOW ENERGY.OLUBUYIDE O; MASSON AJ; HENCHMAN MJ et al.1977; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1977; VOL. 24; NO 4; PP. 399-401; BIBL. 5 REF.Article

A NOVEL MASS MARKER FOR METASTABLE ION SCANS IN A DOUBLE FOCUSING MASS SPECTROMETERPORTER CJ; BRENTON AG; BEYNON JH et al.1980; ORG. MASS SPECTROM.; ISSN 0030-493X; GBR; DA. 1980; VOL. 15; NO 11; PP. 564-567; BIBL. 10 REF.Article

INFLUENCE OF IMPERFECT ALIGNMENT OF MEDIAN PLANES ON FOCUSING PROPERTIES.MATSUDA H; MATSUO T; TAKAHASHI N et al.1977; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1977; VOL. 25; NO 12; PP. 229-236; BIBL. 4 REF.Article

MODULATED-FIELD LINKED SCAN STUDIES OF METASTABLESHUSHAN B; BOYD RK.1980; INTERNATION. J. MASS. SPECTROM. ION PHYS.; NLD; DA. 1980; VOL. 34; NO 1-2; PP. 37-62; BIBL. 17 REF.Article

MASS ANALYZED ION KINETIC ENERGY SPECTROMETRY WITH A MODIFIED AE1 MS 902 SPECTROMETERMAQUESTIAU A; VAN HAVERBEKE Y; FLAMMANG R et al.1978; BULL. SOC. CHIM. BELGES; BEL; DA. 1978; VOL. 87; NO 10; PP. 765-770; BIBL. 15 REF.Article

THE MEASUREMENT OF BETA -SPECTRE WITH AN IRON-FREE, DOUBLE FOCUSING PI RAC2 SPECTROMETERCHRISTMAS P; CROSS P.1978; METROLOGIA; DEU; DA. 1978; VOL. 14; NO 4; PP. 147-156; BIBL. 17 REF.Article

MODELE CYLINDRIQUE NON-TRANSITIF D'UN SEPARATEUR PLASMO-OPTIQUE DE MASSES AVEC UNE DOUBLE FOCALISATIONLEBEDEV SV.1978; ZH. TEKH. FIZ.; SUN; DA. 1978; VOL. 48; NO 9; PP. 1967-1969; BIBL. 4 REF.Article

HIGH-PERFORMANCE SECONDARY ION MASS SPECTROMETERCOLTON RJ; CAMPANA JE; BARLAK TM et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 12; PP. 1685-1689; BIBL. 14 REF.Article

SPECTROMETRE DE MASSE A DOUBLE FOCALISATION A LENTILLES HEXAPOLAIRES ELECTROSTATIQUES DE CORRECTION DE L'IMAGECUNA C; IOANOVICIU D.1980; REV. ROUM. PHYS.; ISSN 0035-4090; ROM; DA. 1980; VOL. 25; NO 7; PP. 751-758; ABS. ENG; BIBL. 7 REF.Article

AN ACCELERATING VOLTAGE SCANNING MASS SPECTROMETERTAKEDA T; SHIBATA S; MATSUDA H et al.1980; SHITSURYO BUNSEKI; ISSN 0542-8645; JPN; DA. 1980; VOL. 28; NO 3; PP. 217-226; BIBL. 4 REF.Article

A SIMPLE DOUBLE-FOCUSING MASS SPECTROMETER.TAYA S; KANOMATA I; HIROSE H et al.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 3; PP. 237-250; BIBL. 2 REF.Article

MODIFICATION OF A MATTAUCH-HERZOG MASS SPECTROMETER FOR ION KINETIC ENERGY MEASUREMENTSVASCAJ V; KRAMER V; MEDVED M et al.1980; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1980; VOL. 33; NO 4; PP. 409-416; BIBL. 10 REF.Article

UN NOUVEAU SYSTEME D'OPTIQUE IONIQUE POUR UN SPECTROMETRE DE MASSE A HAUTE RESOLUTION ET HAUTE SENSIBILITEMATSUDA H.1980; SHITSURYO BUNSEKI; ISSN 0542-8645; JPN; DA. 1980; VOL. 28; NO 3; PP. 211-215; ABS. ENG; BIBL. 12 REF.Article

Advantages of a second electric sector on a double-focusing mass spectrometer of reversed configurationGUILHAUS, M; BOYD, R. K; BRENTON, A. G et al.International journal of mass spectrometry and ion processes. 1985, Vol 67, Num 2, pp 209-227, issn 0168-1176Article

THE OBSERVATION OF METASTABLE TRANSITIONS IN A DOUBLE-FOCUSSING MASS SPECTROMETER USING A LINKED SCAN OF THE ELECTRIC SECTOR AND MAGNETIC SECTOR FIELDS.BRUINS AP; JENNINGS KR.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 4; PP. 395-404; BIBL. 13 REF.Article

A STIGMATIC, SECOND-ORDER, DOUBLE-FOCUSING MASS SPECTROMETER.TAYA S; TSUYAMA H; KANOMATA I et al.1978; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1978; VOL. 26; NO 1; PP. 77-90; BIBL. 13 REF.Article

FIELD IONISATION KINETICS: SIGNIFICANCE OF ENERGY RESOLUTION IN THE MEASUREMENT OF ION TRANSLATIONAL ENERGY.BALDWIN MA; DERRICK PJ; MORGAN RP et al.1976; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1976; VOL. 21; NO 1-2; PP. 193-204; BIBL. 12 REF.Article

A DOUBLE-FOCUSING SOFT X-RAY SPECTROMETER WITH INDEPENDENT ADJUSTMENT OF BRAGG AND OBSERVATION ANGLES.MARTIN FW; CACAK RK.1976; J. PHYS, E; G.B.; DA. 1976; VOL. 9; NO 8; PP. 662-670; BIBL. 17 REF.Article

ION CURRENT SURFACE FOR A DOUBLE FOCUSING MASS SPECTROMETER OF REVERSED GEOMETRYLACEY MJ; MACDONALD CG; DONCHI KF et al.1981; ORG. MASS. SPECTROM.; ISSN 0030-493X; GBR; DA. 1981; VOL. 16; NO 8; PP. 351-357; BIBL. 26 REF.Article

A NEW FAST-SCANNING METHOD FOR MIKE SPECTRABOZORGZADEH MH; BEYNON JH; MORGAN RP et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1979; VOL. 29; NO 2; PP. 191-193; BIBL. 4 REF.Article

AUTOMATIC ACQUISITION AND SHAPE ANALYSIS OF METASTABLE PEAKSMANDLI H; ROBBIANI R; KUSTER T et al.1979; INTERNATION. J. MASS SPECTROM. ION PHYS.; NLD; DA. 1979; VOL. 31; NO 1-2; PP. 57-64; BIBL. 16 REF.Article

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