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Proceedings of the 26th International Conference on Defects in Semiconductors 26th ICDSEVANS-FREEMAN, Jan; VERNON-PARRY, Karen; ALLEN, Martin et al.Physica. B, Condensed matter. 2012, Vol 407, Num 15, issn 0921-4526, 242 p.Conference Proceedings

Transverse instability of line defects of period-2 spiral wavesPARK, Jin-Sung; WOO, Sung-Jae; LEE, Kyoung J et al.Physical review letters. 2004, Vol 93, Num 9, pp 098302.1-098302.4, issn 0031-9007Article

Dislocation polarization and screening effectsKHANNANOV, SH. KH.Physics of metals and metallography. 1992, Vol 74, Num 4, pp 334-338, issn 0031-918XArticle

Recognition of defect structure of Si(A4) by on-line support vector machineDZIEDZIC, Tomasz; BEDKOWSKI, Janusz; JANKOWSKI, Stanisław et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6937, pp 69371W.1-69371W.5, issn 0277-786X, isbn 978-0-8194-7124-6 0-8194-7124-0, 2Conference Paper

Detection of dislocations in strongly absorbing crystals by projection x-ray topography in back reflectionSHUL'PINA, I. L; ARGUNOVA, T. S.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A47-A49, issn 0022-3727Conference Paper

Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafersOSTAPENKO, S; TARASOV, I; KALEJS, J. P et al.Semiconductor science and technology. 2000, Vol 15, Num 8, pp 840-848, issn 0268-1242Article

Deviations from Volterra dislocationsSCHOECK, G.Philosophical magazine letters. 1998, Vol 77, Num 3, pp 141-146, issn 0950-0839Article

Observation of complicated surface defects by photoacoustic microscopy and nondestructive evaluationENDOH, H; HIWATASHI, Y; HOSHIMIYA, T et al.Japanese journal of applied physics. 1997, Vol 36, Num 5B, pp 3312-3317, issn 0021-4922, 1Conference Paper

Microwave anisotropies from cosmic defectsCOULSON, D; FERREIRA, P; GRAHAM, P et al.Nature (London). 1994, Vol 368, Num 6466, pp 27-31, issn 0028-0836Article

Interstitial-oxygen induced localized vibrational properties in alpha-quartzKISLOV, A. N; ZATSEPIN, A. F.Journal of non-crystalline solids. 2013, Vol 362, pp 69-72, issn 0022-3093, 4 p.Article

Influence of high pressure and temperature on defect structure of silicon crystals implanted with N or Si ionsBAK-MISIUK, J; MISIUK, A; RATAJCZAK, J et al.Journal of alloys and compounds. 2004, Vol 362, pp 275-281, issn 0925-8388, 7 p.Conference Paper

New study of defect structure in nonstoichiometric lithium tantalateMASAIF, N; JEBBARI, S; BENNANI, F et al.Ferroelectrics. Letters section. 2005, Vol 32, Num 1-2, pp 7-22, issn 0731-5171, 16 p.Article

Defect-related light emission from processed He-implanted siliconBAK-MISIUK, J; MISIUK, A; ROMANOWSKI, P et al.Journal of luminescence. 2006, Vol 121, Num 2, pp 383-386, issn 0022-2313, 4 p.Conference Paper

Studies of the optical band positions, spin-Hamiltonian parameters and defect structure for Cr3+ in CdIn2S4 crystalZHENG, Wen-Chen; MEI YANG; LI WEI et al.Optical materials (Amsterdam). 2013, Vol 35, Num 6, pp 1261-1263, issn 0925-3467, 3 p.Article

Vibrations induced by different charged oxygen vacancies in quartz-like GeO2KISLOV, A. N; ZATSEPIN, A. F.Computational materials science. 2013, Vol 74, pp 12-16, issn 0927-0256, 5 p.Article

Theoretical calculations of the optical band positions and spin-Hamiltonian parameters for Cr3+ ions in Y2Ti2O7 crystalMEI YANG; YU-GUANG, Yang; WEN-CHEN, Zheng et al.Physica. B, Condensed matter. 2012, Vol 407, Num 18, pp 3881-3883, issn 0921-4526, 3 p.Article

Correlation of microstructure and electrical conduction behaviour with defect structure of niobium doped barium stannateSINGH, Prabhakar; SEBASTIAN, C. Peter; KUMAR, Devendra et al.Journal of alloys and compounds. 2007, Vol 437, Num 1-2, pp 34-38, issn 0925-8388, 5 p.Article

Oxygen potentials of (U0.685Pu0.270Am0.045)O2-x solid solutionOSAKA, Masahiko; SATO, Isamu; NAMEKAWA, Takashi et al.Journal of alloys and compounds. 2005, Vol 397, Num 1-2, pp 110-114, issn 0925-8388, 5 p.Article

Defect structure and defect-induced expansion of doped perovskite La0.7Sr0.3Co0.9Fe0.1O3-δZUEV, A. Yu; SEREDA, V. V; TSVETKOV, D. S et al.International journal of hydrogen energy. 2014, Vol 39, Num 36, pp 21553-21560, issn 0360-3199, 8 p.Conference Paper

Mixed (Sr1-xCax)33Bi14Al48O141 fullerenoids : the defect structure analysed by (S)TEM techniquesLEBEDEV, Oleg I; BALS, Sara; VAN TENDELOO, Gustaaf et al.International journal of materials research. 2006, Vol 97, Num 7, pp 978-984, issn 1862-5282, 7 p.Article

Finite-size effects on the structure of grain boundariesMARQUIS, E. A; HAMILTON, J. C; MEDLIN, D. L et al.Physical review letters. 2004, Vol 93, Num 15, pp 156101.1-156101.4, issn 0031-9007Article

Influence of the a-Si:H structural defects studied by positron annihilation on the solar cells characteristicsAMARAL, A; LAVAREDA, G; NUNES DE CARVALHO, C et al.Thin solid films. 2002, Vol 403-04, pp 539-542, issn 0040-6090Conference Paper

Misfit dislocations in wire composite solidsGUTKIN, M. Yu; OVID'KO, I. A; SHEINERMAN, A. G et al.Journal of physics. Condensed matter (Print). 2000, Vol 12, Num 25, pp 5391-5401, issn 0953-8984Article

Disclinations at grain boundary triple junctions : Between Bollmann disclinations and Volterra disclinationsMÜLLNER, P.Materials science forum. 1999, pp 353-356, issn 0255-5476, isbn 0-87849-823-0Conference Paper

Accessing the excess : An atomistic approach to excesses at planar defects and dislocations in ordered compoundsFINNIS, M. W.Physica status solidi. A. Applied research. 1998, Vol 166, Num 1, pp 397-416, issn 0031-8965Article

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