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Results 1 to 25 of 3754

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Characterization of Surface Defects on Pulse-Electrodeposited Nickel Tubes = Charakterisierung von Oberflächenfehlern auf mittels gepulster Elektrodeposition beschichteten NickelrohrenKLEMENT, Uta; YIMING YAO; Seyedeh NOOSHIN MORTAZAVI et al.Praktische Metallographie. 2013, Vol 50, Num 12, pp 789-798, issn 0032-678X, 10 p.Article

Investigation of strand surface defects using mould instrumentation and modellingTHOMAS, B. G; JENKINS, M. S; MAHAPATRA, R. B et al.Ironmaking & steelmaking. 2004, Vol 31, Num 6, pp 486-494, issn 0301-9233, 9 p.Article

The necking of the rectangular block with surface imperfectionHAO TIAN-HU.Mechanics research communications. 1986, Vol 13, Num 6, pp 309-315, issn 0093-6413Article

The laser surfacing of local surface defects in components made of 30KhGSN2A steelYURKEVICH, S. N; FOMIKHINA, I. V.Welding international. 2005, Vol 19, Num 5, pp 415-416, issn 0950-7116, 2 p.Article

Control of Surface Defects and Agglomeration Mechanism of Layered Double Hydroxide NanoparticlesYONGSHAN ZHOU; XIAOMING SUN; KAI ZHONG et al.Industrial & engineering chemistry research. 2012, Vol 51, Num 11, pp 4215-4221, issn 0888-5885, 7 p.Article

EUV mask absorber defect size requirement at 100 nm design rulesYAN, P.-Y; GUOJING ZHANG; CHOW, J et al.SPIE proceedings series. 1998, pp 638-645, isbn 0-8194-2776-4Conference Paper

A noise robust method based on completed local binary patterns for hot-rolled steel strip surface defectsKECHEN SONG; YUNHUI YAN.Applied surface science. 2013, Vol 285, pp 858-864, issn 0169-4332, 7 p., bArticle

Surface defect gap solitons in one-dimensional chirped optical latticesXIE, Jia-Ning; HE, Ying-Ji; WANG, He-Zhou et al.Journal of the Optical Society of America. B, Optical physics (Print). 2010, Vol 27, Num 3, pp 484-487, issn 0740-3224, 4 p.Article

Charged defects on Ge(111)-c(2 × 8) : characterization using STMLEE, G; MAI, H; CHIZHOV, I et al.Surface science. 2000, Vol 463, Num 1, pp 55-65, issn 0039-6028Article

Fullerene functionalized scanning tunneling microscope tips- preparation, characterization and applicationsKELLY, K. F; SARKAR, D; OLDENBURG, S. J et al.Synthetic metals. 1997, Vol 86, Num 1-3, pp 2407-2410, issn 0379-6779Conference Paper

Surface defects of KBr produced by electron irradiationMABUCHI, T.Journal of the Physical Society of Japan. 1990, Vol 59, Num 2, pp 649-656, issn 0031-9015Article

Variation du mode de croissance initiale de SiO2 sur Si(001) en fonction de la température de substratLUTZ, F; BISCHOFF, J. L; BOLMONT, D et al.Revue de physique appliquée. 1990, Vol 25, Num 9, pp 923-929, issn 0035-1687Article

Propagation of LIL/LMJ beams under the interaction with contamination particles and component surface defectsMAINGUY, S; LE GARREC, B.Journal de physique. IV. 2006, Vol 133, pp 653-655, issn 1155-4339, 3 p.Conference Paper

Stochastic geometry of defect systemsHOLZ, A; VIGREN, D. T.Physica. A. 1988, Vol 149, Num 3, pp 561-605, issn 0378-4371Article

Structural and morphological characterization of alumina supported Pd nanoparticles obtained by colloïdal synthesisRAMOS-FERNANDEZ, M; NORMAND, L; SORBIER, L et al.Oil & gas science and technology. 2007, Vol 62, Num 1, pp 101-113, issn 1294-4475, 13 p.Article

A classification scheme for visual defects arising in semiconductor wafer inspectionRAO, A. R; JAIN, R.Journal of crystal growth. 1990, Vol 103, Num 1-4, pp 398-406, issn 0022-0248Conference Paper

Competition between intrinsic and extrinsic nucleation kinetics at solid surfacesTOMELLINI, M; FANFONI, M.Surface science. 1997, Vol 393, Num 1-3, pp L99-L105, issn 0039-6028Article

A model for longitudinal splitting from surface defects in anisotropic filamentsWAGNER, H. D.Journal of materials science letters. 1986, Vol 5, Num 2, pp 229-230, issn 0261-8028Article

Regular defects on the Si(111)-(7 × 7) surface studied by scanning tunneling microscopyYANG, H. Q; GAO, J. N; ZHAO, Y. F et al.Surface science. 1998, Vol 406, Num 1-3, pp 229-234, issn 0039-6028Article

Determination of the local density of vibrational states of surface point defects by the Bethe-Peierls approximate methodKAMINSKI, B; KAPELEWSKI, J.Journal of Technical Physics. 1986, Vol 27, Num 4, pp 387-397, issn 0324-8313Article

Photoluminescence characterization of nano-size defects in sub-surface region of silicon wafersTANAHASHI, Katsuto; YAMADA-KANETA, Hiroshi.Surface and interface analysis. 2005, Vol 37, Num 2, pp 208-210, issn 0142-2421, 3 p.Conference Paper

In situ electron spin resonance of initial oxidation processes of Si surfacesUMEDA, T; YAMASAKI, S; NISHIZAWA, M et al.Applied surface science. 2000, Vol 162-63, pp 299-303, issn 0169-4332Conference Paper

First-principles investigation of functionalization-defects on silicon surfacesCUCINOTTA, C. S; BONFERRONI, B; FERRETTI, A et al.Surface science. 2006, Vol 600, Num 18, pp 3892-3897, issn 0039-6028, 6 p.Conference Paper

Laser ultrasonic measurement of surface defects based on ratio methodGANG LI; HEDONG YU; GUOPING ZHANG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6420-1, Vol 2, 634439.1-634439.6Conference Paper

Dielectric properties of defects on wood surfacesFORRER, J. B; FUNCK, J. W.Holz als Roh- und Werkstoff. 1998, Vol 56, Num 1, pp 25-29, issn 0018-3768Article

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