REVOLUTION CHIMIQUE ET REVOLUTION FRANCAISE. LE DISCOURS PRELIMINAIRE AU TRAITE ELEMENTAIRE DE CHIMIE DE LAVOISIERDELHEZ R.COMITE BELGE D'HISTOIRE DES SCIENCES. NOTES BIBLIOGRAPHIQUES. 1973, Vol 78, 7 p.Article

REVOLUTION CHIMIQUE ET REVOLUTION FRANCAISE. LE DISCOURS PRELIMINAIRE AU TRAITE ELEMENTAIRE DE CHIMIE DE LAVOISIERDELHEZ R.REVUE DES QUESTIONS SCIENTIFIQUES. 1972, Vol 143, Num 1, pp 3-26Article

CONCENTRATION VARIATIONS WITHIN SMALL CRYSTALLITES STUDIED BY X-RAY DIFFRACTION LINE PROFILE ANALYSISMITTEMEIJER EJ; DELHEZ R.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 7; PP. 3875-3878; BIBL. 22 REF.Article

THE ELIMINATION OF AN APPROXIMATION IN THE WARREN-AVERBACH ANALYSIS.DELHEZ R; MITTEMEIJER EJ.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 233-234; BIBL. 4 REF.Article

ON THE ANALYSIS OF X-RAY-DIFFRACTION LINE PROFILES FROM SMALL EPITAXIAL BINARY DIFFUSION COUPLES: DETERMINATION OF CONCENTRATION PROFILE AND INFLUENCE OF TDSDELHEZ R; MITTEMEIJER EJ.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 8; PP. 4770-4775; BIBL. 34 REF.Article

A NOTE ON THE KINEMATICAL THEORY OF X-RAY DIFFRACTION FROM CONCENTRATION PROFILES.MITTEMEIJER EJ; DELHEZ R.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 4; PP. 1702-1703; BIBL. 7 REF.Article

OPTICAL AND X-RAY CHARACTERIZATION OF THE LAYER TYPE PEROVSKITES (C_NH_2N+1NH₃)₂ CUCL₄ IN RELATION TO THEIR GROWTH.MISCHGOFSKY FH; DELHEZ R.1978; J. CRYST. GROWTH; NLD; DA. 1978; VOL. 44; NO 2; PP. 145-156; BIBL. 17 REF.Article

LA PHYSICO-CHIMIE DE L'EAU.OR L D'; DELHEZ R.1964; LIVRE.DE.L'EAU.CENTRE.ET.DOC.EAUX.LIEGE.; 1964, VOL. 1, P. 13 A 71Miscellaneous

L'ELUCTABLE METAMORPHOSE, ESSAI SUR LA DEMARCHE PEDAGOGIQUECASTELAIN P; DELHEZ R; JOUDOT J et al.1971, 198 p.Book

THE X-RAY DIFFRACTION LINE BROADENING DUE TO THE DIFFRACTOMETER CONDITION AS A FUNCTION OF 2 THETADELHEZ R; DE KEIJSER TH; MITTEMEIJER EJ et al.1978; J. PHYS. E; GBR; DA. 1978; VOL. 11; NO 7; PP. 649-652; BIBL. 15 REF.Article

Proceedings of the third European powder diffraction conference (Vienna, September 25-28, 1993)Delhez, R; Mittemeijer, E.J.Materials science forum. 1994, issn 0255-5476, isbn 0-87849-682-3, 2Vol, 806 p., isbn 0-87849-682-3Conference Proceedings

EPDIC 6 : 6th European powder diffraction conference (Budapest, 22-25 August 1998)Delhez, R; Mittemeijer, E.J.Materials science forum. 2000, issn 0255-5476, isbn 0-87849-847-8, 2Vol, XXVIII, 1153 p.$ cill., index, isbn 0-87849-847-8Conference Proceedings

Proceedings of the fifth European powder diffraction conference (Parma, 25-28 May 1997)Delhez, R; Mittemeijer, E.J.Materials science forum. 1998, issn 0255-5476, isbn 0-87849-807-9, 2Vol, XXIII, 944 p, isbn 0-87849-807-9Conference Proceedings

Proceedings of the second European powder diffraction conference (Enschede, July 30 - August 1, 1992)Delhez, R; Mittemeijer, E.J.Materials science forum. 1993, issn 0255-5476, isbn 0-87849-661-0, 2Vol, 954 p., isbn 0-87849-661-0Conference Proceedings

Seventh European powder diffraction conference (Barcelona, 20-23 May 2000)Delhez, R; Mittemeijer, E.J.Materials science forum. 2001, issn 0255-5476, isbn 0-87849-886-9, XXV, [464] p, isbn 0-87849-886-9Conference Proceedings

Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulationsKAMMINGA, J.-D; DELHEZ, R.Journal of applied crystallography. 2000, Vol 33, pp 1122-1127, issn 0021-8898, 4Article

AN X-RAY DIFFRACTION STUDY OF DIFFUSIONAL HOMOGENIZATION IN RBCL-KCL POWDER BLENDS.VAN DEN BERGEN EA; DELHEZ R; MITTEMEIJER EJ et al.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 44; NO 2; PP. 517-524; ABS. ALLEM.; BIBL. 22 REF.Article

ON TWINNING IN CRYSTALLIZED COPPER LAYERS ON A 111 NICKEL SURFACE.MITTEMEIJER EJ; DELHEZ R; VAN ROOIJEN R et al.1976; J. CRYST. GROWTH; NETHERL.; DA. 1976; VOL. 36; NO 2; PP. 249-254; BIBL. 10 REF.Article

Microstructure of polycrystalline natural samples from the peak profile analysis of diffraction dataBERTI, Giovanni.Materials science forum. 2000, pp 309-314, issn 0255-5476, isbn 0-87849-855-9Conference Paper

European powder diffraction (Chester, July 10-14, 1995)Cernik, R.J; Delhez, R; Mittemeijer, E.J et al.Materials science forum. 1996, issn 0255-5476, isbn 0-87849-742-0, 2Vol, XXVII, 920 p, isbn 0-87849-742-0Conference Proceedings

Role of X-ray diffraction analysis in surface engineering: investigation of microstructure of nitrided iron and steels = Rôle des analyses par diffraction RX dans l'ingénierie des surfaces: étude de la microstructure des aciers et du fer nitrurésDELHEZ, R; DE KEIJSER, T. H; MITTEMEIJER, E. J et al.Surface engineering. 1987, Vol 3, Num 4, pp 331-342, issn 0267-0844Article

Line broadening analysis using integral breadth methods: a critical reviewSCARDI, P; LEONI, M; DELHEZ, R et al.Journal of applied crystallography. 2004, Vol 37, pp 381-390, issn 0021-8898, 10 p., 3Article

New experimental technique for measuring deformation of thin plates during laser surface remeltingGRUM, Janez; STURM, Roman.Materials science forum. 2000, pp 459-464, issn 0255-5476, isbn 0-87849-855-9Conference Paper

Residual stress measurement in cracked components : Capabilities and limitations of the cut compliance methodSCHINDLER, Hans-Jakob.Materials science forum. 2000, pp 150-155, issn 0255-5476, isbn 0-87849-855-9Conference Paper

Predicting residual stresses due to solidification in cast plasticsTROPSA, V; IVANKOVIC, A; WILLIAMS, J. G et al.Materials science forum. 2000, pp 259-264, issn 0255-5476, isbn 0-87849-855-9Conference Paper