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Aluminium thin film growth on a Ru(0001) surfaceCEBALLOS, G; THEIS, M; PELZER, T et al.Surface science. 1995, Vol 331-333, pp 952-956, issn 0039-6028, bConference Paper

STM study of the Ge growth mode on Si(001) substratesTOMITORI, M; WATANABE, K; KOBAYASHI, M et al.Applied surface science. 1994, Vol 76-77, Num 1-4, pp 322-328, issn 0169-4332Conference Paper

Design and performance of a cylindrical reflection mirror analyzer for low energy ion scattering studiesYI-SHA KU; CHING-SHEN SU.Review of scientific instruments. 1991, Vol 62, Num 6, pp 1471-1474, issn 0034-6748, 4 p.Article

Preparation of low-energy reference electron source with ¹⁶⁹YbKAWAKAMI, H; NISIMURA, K; NAGAFUCHI, T et al.Japanese journal of applied physics. 1988, Vol 27, Num 8, pp 1488-1891, issn 0021-4922, 1Article

Obtention de revêtements de zirconium par un procédé «iodure» dans un système à circulationDUDNIK, S. F; MIROSHNICHENKO, K. V; SAGALOVICH, V. V et al.Fizika i himiâ obrabotki materialov. 1986, Num 4, pp 58-60, issn 0015-3214Article

Inorganic layers on polymeric films: Influence of defects and morphology on barrier propertiesHANIKA, Markus; LANGOWSKI, Horst-Christian; MOOSHEIMER, Ulrich et al.Chemical engineering & technology. 2003, Vol 26, Num 5, pp 605-614, issn 0930-7516, 10 p.Article

Reinigen vor dem Vakuumbeschichter = Cleaning for vacuum coatingsKOCH, H.Metalloberfläche. 1999, Vol 53, Num 6, pp 21-23, issn 0026-0797Article

Vacuum arc deposition as a complementary technology to laser processingVERSHININ, N. F; GLEBOVSKY, V. G; STRAUMAL, B. B et al.Applied surface science. 1997, Vol 109-10, pp 437-441, issn 0169-4332Conference Paper

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Performance of vacuum sealing system in continuous zinc vapor deposition line = Utilisation d'un dispositif étanche au vide dans une ligne continue de dépôt de vapeur de zincMAEDA, M; NAKAMURA, K; ITO, T et al.Revue de métallurgie (Paris). 1988, Vol 85, Num 4, pp 341-350, issn 0035-1563Conference Paper

Design and implementation of a magnetic drive retrofit to the Vacuum Generator's venetian style viewport shutter assemblyROULEAU, C. M; PARK, R. M.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 2, pp 464-465, issn 0734-2101Article

Application of centrifugal vacuum concentrators in residue analysisMALISCH, R.Fresenius' journal of analytical chemistry. 1991, Vol 341, Num 7-8, pp 449-456, issn 0937-0633Article

Web metallizing with dense, directional and energetic Al-vapour jets : a challenge to conventional evaporatorsDE RUDNAY, A.Vacuum. 1991, Vol 42, Num 10-11, pp 649-655, issn 0042-207XArticle

Un regard scientifique sur les traitements de surfaceGalvano organo. Le professionnel des traitements de surface. 1991, Vol 60, Num 620, pp 1003-1008Article

Optimierung von aluminiumbedampftem Bandstahl (EBAL) = Optimation of steel strip vapour coated with aluminium (EBAL)ANTON, K.Neue Hütte. 1987, Vol 32, Num 2, pp 69-70, issn 0028-3207Article

Development of latent fingerprints using preferential DC sputter depositionKENT, K; STOILOVIC, M.Forensic science international. 1995, Vol 72, Num 1, pp 35-42, issn 0379-0738Article

Two-dimensional overgrowth in the low submonolayer range : the case of c(2×2)-Pb/Cu(110)DE BEAUVAIS, C; ROUXEL, D; MICHAILOV, M et al.Surface science. 1995, Vol 324, Num 1, pp 1-7, issn 0039-6028Article

Filtered arc evaporationMARTIN, P. J.Surface engineering. 1993, Vol 9, Num 1, pp 51-58, issn 0267-0844Article

Growth kinetics of the Pt(111) surface during low temperature vacuum depositionALNOT, M; BARNARD, J. A; EHRHARDT, J. J et al.Journal of crystal growth. 1990, Vol 102, Num 3, pp 629-634, issn 0022-0248Article

In-situ scanning tunneling microscopy on vapor deposited polyaniline thin filmsCORNELISON, D. M; DILLINGHAM, T. R; BULLOCK, E et al.Surface science. 1995, Vol 343, Num 1-2, pp 87-94, issn 0039-6028Article

Design of organic electroluminescent displays with ultraviolet-shielding filtersRONG HO LEE; CHEN YANG HUANG; CHEN, Chin-Ti et al.Journal of applied polymer science. 2004, Vol 92, Num 3, pp 1432-1436, issn 0021-8995, 5 p.Article

Vacuum metal deposition : factors affecting normal and reverse development of latent fingerprints on polyethylene substratesJONES, Naomi; STOILOVIC, Milutin; LENNARD, Chris et al.Forensic science international. 2001, Vol 115, Num 1-2, pp 73-88, issn 0379-0738Article