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The accuracy of metric judgements: Perception of surface normalPORRILL, John; DUKE, Philip A; TAROYAN, Naira A et al.Vision research (Oxford). 2010, Vol 50, Num 12, pp 1140-1157, issn 0042-6989, 18 p.Article

A new approach to constructing optimal parallel prefix circuits with small depthLIN, Yen-Chun; HSIAO, Jun-Wei.Journal of parallel and distributed computing (Print). 2004, Vol 64, Num 1, pp 97-107, issn 0743-7315, 11 p.Article

Inconsistency of perceived 3D shapeDI LUCA, M; DOMINI, F; CAUDEK, C et al.Vision research (Oxford). 2010, Vol 50, Num 16, pp 1519-1531, issn 0042-6989, 13 p.Article

SIMS depth profiling of deuterium labeled polymers in polymer multilayersHARTON, Shane E; STEVIE, Fred A; GRIFFIS, Dieter P et al.Applied surface science. 2006, Vol 252, Num 19, pp 7224-7227, issn 0169-4332, 4 p.Conference Paper

A monocular approach to depth maps generationHAO SHI; FAZEL NAGHDY; COOK, C. D et al.Computers in industry. 1994, Vol 25, Num 1, pp 15-30, issn 0166-3615Article

Visual constraints for the perception of quantitative depth from temporal interocular unmatched featuresRUI NI; LIN CHEN; ANDERSEN, George J et al.Vision research (Oxford). 2010, Vol 50, Num 16, pp 1571-1580, issn 0042-6989, 10 p.Article

Applications of SIMS to cultural heritage studiesADRIAENS, A; DOWSETT, M. G.Applied surface science. 2006, Vol 252, Num 19, pp 7096-7101, issn 0169-4332, 6 p.Conference Paper

Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper

Temporal dynamics of stereo correspondence bi-stabilityGOUTCHER, Ross; MAMASSIAN, Pascal.Vision research (Oxford). 2006, Vol 46, Num 21, pp 3575-3585, issn 0042-6989, 11 p.Article

Influence of nonstationary atomic mixing on depth resolution in sputter depth profilingWANG, J. Y; LIU, Y; HOFMANN, S et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 569-572, issn 0142-2421, 4 p.Article

The pursuit theory of motion parallaxNAWROT, Mark; JOYCE, Lindsey.Vision research (Oxford). 2006, Vol 46, Num 28, pp 4709-4725, issn 0042-6989, 17 p.Article

Some applications of SIMS in conservation science, archaeometry and cosmochemistryMCPHAIL, D. S.Applied surface science. 2006, Vol 252, Num 19, pp 7107-7112, issn 0169-4332, 6 p.Conference Paper

Depth propagation and surface construction in 3-D visionGEORGESON, Mark A; YATES, Tim A; SCHOFIELD, Andrew J et al.Vision research (Oxford). 2009, Vol 49, Num 1, pp 84-95, issn 0042-6989, 12 p.Article

Deconvolution of very low primary energy SIMS depth profilesFARES, B; GAUTIER, B; DUPUY, J. C et al.Applied surface science. 2006, Vol 252, Num 19, pp 6478-6481, issn 0169-4332, 4 p.Conference Paper

AES depth profiling and interface analysis of C/Ta bilayersZALAR, A; KOVAE, J; PRAEEK, B et al.Applied surface science. 2005, Vol 252, Num 5, pp 2056-2062, issn 0169-4332, 7 p.Article

The use of zinc and iron emission lines in the depth profile analysis of zinc-coated steelNOVOTNY, K; VACULOVIC, T; GALIOVA, M et al.Applied surface science. 2007, Vol 253, Num 8, pp 3834-3842, issn 0169-4332, 9 p.Article

Surprisingly large apparent profile shifts of As and Sb markers in Si bombarded with ultra-low-energy Cs ion beamsKATAOKA, Y; SHIGENO, M; TADA, Y et al.Applied surface science. 2003, Vol 203-04, pp 329-334, issn 0169-4332, 6 p.Conference Paper

An analytical depth resolution function for the MRI modelLIU, Y; HOFMANN, S; WANG, J. Y et al.Surface and interface analysis. 2013, Vol 45, Num 11-12, pp 1659-1660, issn 0142-2421, 2 p.Article

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Characterizing high-k and low-k dielectric materials for semiconductors : Progress and challengesBENNETT, J; QUEVEDO-LOPEZ, M; SATYANARAYANA, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 7167-7171, issn 0169-4332, 5 p.Conference Paper

Comparative study of negative cluster emission in sputtering of Si, Ge and their oxidesPEREGO, M; FERRARI, S; FANCIULLI, M et al.Applied surface science. 2006, Vol 252, Num 19, pp 7236-7238, issn 0169-4332, 3 p.Conference Paper

Sodium and hydrogen analysis of room temperature glass corrosion using low energy Cs SIMSFEARN, S; MCPHAIL, D. S; MORRIS, R. J. H et al.Applied surface science. 2006, Vol 252, Num 19, pp 7070-7073, issn 0169-4332, 4 p.Conference Paper

Fishing down the deep: Accounting for within-species changes in depth of fishingWATSON, Reg A; MORATO, Telmo.Fisheries research. 2013, Vol 140, pp 63-65, issn 0165-7836, 3 p.Article