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Results 1 to 25 of 8050

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Depth profiling and secondary ion mass spectrometry relative sensitivity factors and systematics for polymers/organicsWILSON, R. G; LUX, G. E; KIRSCHBAUM, C. L et al.Journal of applied physics. 1993, Vol 73, Num 5, pp 2524-2529, issn 0021-8979Article

Influence of nonstationary atomic mixing on depth resolution in sputter depth profilingWANG, J. Y; LIU, Y; HOFMANN, S et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 569-572, issn 0142-2421, 4 p.Article

Changes in weathering effectiveness and community of culturable mineral-weathering bacteria along a soil profileQI WANG; RONG RONG WANG; LIN YAN HE et al.Biology and fertility of soils. 2014, Vol 50, Num 7, pp 1025-1034, issn 0178-2762, 10 p.Article

An investigation of the distribution of minor components in complex polymeric paint formulations using ToF-SIMS depth profilingHINDER, Steven J; WATTS, John F; SIMMONS, Garnett C et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 436-440, issn 0142-2421, 5 p.Conference Paper

Shave-off depth profiling : Depth profiling with an absolute depth scaleNOJIMA, M; MAEKAWA, A; YAMAMOTO, T et al.Applied surface science. 2006, Vol 252, Num 19, pp 7293-7296, issn 0169-4332, 4 p.Conference Paper

Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMSKONARSKI, P; HAŁUSZKA, J; CWIL, M et al.Applied surface science. 2006, Vol 252, Num 19, pp 7010-7013, issn 0169-4332, 4 p.Conference Paper

Deuterium depth profile quantification in a ASDEX Upgrade divertor tile using secondary ion mass spectrometryGHEZZI, F; CANIELLO, R; GIUBERTONI, D et al.Applied surface science. 2014, Vol 315, pp 459-466, issn 0169-4332, 8 p.Conference Paper

TOF-SIMS depth profiling study of corrosion propagation in coated hollow spheresORINAKOVA, Renata; ORINAK, Andrej; ARLINGHAUS, Heinrich F et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 833-837, issn 0142-2421, 5 p.Conference Paper

SIMS depth profiling of deuterium labeled polymers in polymer multilayersHARTON, Shane E; STEVIE, Fred A; GRIFFIS, Dieter P et al.Applied surface science. 2006, Vol 252, Num 19, pp 7224-7227, issn 0169-4332, 4 p.Conference Paper

Combined AES and TOF-SIMS analysis of a thermally treated Ag/Ti/Al metallization systemSCHEITHAUER, U; TREICHLER, R.Surface and interface analysis. 2006, Vol 38, Num 4, pp 296-299, issn 0142-2421, 4 p.Conference Paper

Applications of SIMS to cultural heritage studiesADRIAENS, A; DOWSETT, M. G.Applied surface science. 2006, Vol 252, Num 19, pp 7096-7101, issn 0169-4332, 6 p.Conference Paper

Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper

Heavy ion elastic recoil detection analysis of AlxOyfPt/AlxOy multilayer selective solar absorberNURU, Z. Y; MSIMANGA, M; ARENDSE, C. J et al.Applied surface science. 2014, Vol 298, pp 176-181, issn 0169-4332, 6 p.Article

Some applications of SIMS in conservation science, archaeometry and cosmochemistryMCPHAIL, D. S.Applied surface science. 2006, Vol 252, Num 19, pp 7107-7112, issn 0169-4332, 6 p.Conference Paper

Site specific and regional estimates of methane uptake by tropical rainforest soils in north eastern AustraliaKIESE, R; WOCHELE, S; BUTTERBACH-BAHL, K et al.Plant and soil. 2008, Vol 309, Num 1-2, pp 211-226, issn 0032-079X, 16 p.Conference Paper

Availability of layered certified reference materials for industrial application of glow discharge spectrometric depth profilingWINCHESTER, M; BECK, U.Surface and interface analysis. 1999, Vol 27, Num 10, pp 930-935, issn 0142-2421Article

Glow discharge spectroscopy for depth profile analysis : from micrometer to sub-nanometer layersPISONERO, Jorge.Analytical and bioanalytical chemistry. 2006, Vol 384, Num 1, pp 47-49, 3 p.Article

An analytical depth resolution function for the MRI modelLIU, Y; HOFMANN, S; WANG, J. Y et al.Surface and interface analysis. 2013, Vol 45, Num 11-12, pp 1659-1660, issn 0142-2421, 2 p.Article

Influence of non-Gaussian roughness on sputter depth profilesLIU, Y; JIAN, W; WANG, J. Y et al.Applied surface science. 2013, Vol 276, pp 447-453, issn 0169-4332, 7 p.Article

Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomographyKINNO, T; AKUTSU, H; TAKENO, S et al.Applied surface science. 2012, Vol 259, pp 726-730, issn 0169-4332, 5 p.Article

The simulation of nanoscale sputter depth profiles using molecular dynamicsKAROLEWSKI, M. A.Applied surface science. 2009, Vol 255, Num 16, pp 7226-7233, issn 0169-4332, 8 p.Article

Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidationKOVAC, J; BIZJAK, M; PRACEK, B et al.Applied surface science. 2007, Vol 253, Num 9, pp 4132-4136, issn 0169-4332, 5 p.Article

Nitrogen depth profiling in thin oxynitride layers on siliconBUDREVICH, A; GLADKIKH, A; KAGANE, E et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 267-271, issn 0142-2421, 5 p.Conference Paper

Interdiffusion in microstructurally different Si/Al multilayered structuresWANG, J. Y; HE, D; ZALAR, A et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 773-776, issn 0142-2421, 4 p.Conference Paper

Caesium/xenon dual beam depth profiling : Velocity of the sputtered atom and ionization probabilityBRISON, J; DOUHARD, B; HOUSSIAU, L et al.Applied surface science. 2006, Vol 252, Num 19, pp 6440-6443, issn 0169-4332, 4 p.Conference Paper

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