Influence of nonstationary atomic mixing on depth resolution in sputter depth profilingWANG, J. Y; LIU, Y; HOFMANN, S et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 569-572, issn 0142-2421, 4 p.Article

An investigation of the distribution of minor components in complex polymeric paint formulations using ToF-SIMS depth profilingHINDER, Steven J; WATTS, John F; SIMMONS, Garnett C et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 436-440, issn 0142-2421, 5 p.Conference Paper

Comparison of urban and rural particulate air pollution characteristics obtained by SIMS and SSMSKONARSKI, P; HAŁUSZKA, J; CWIL, M et al.Applied surface science. 2006, Vol 252, Num 19, pp 7010-7013, issn 0169-4332, 4 p.Conference Paper

SIMS depth profiling of deuterium labeled polymers in polymer multilayersHARTON, Shane E; STEVIE, Fred A; GRIFFIS, Dieter P et al.Applied surface science. 2006, Vol 252, Num 19, pp 7224-7227, issn 0169-4332, 4 p.Conference Paper

Combined AES and TOF-SIMS analysis of a thermally treated Ag/Ti/Al metallization systemSCHEITHAUER, U; TREICHLER, R.Surface and interface analysis. 2006, Vol 38, Num 4, pp 296-299, issn 0142-2421, 4 p.Conference Paper

Applications of SIMS to cultural heritage studiesADRIAENS, A; DOWSETT, M. G.Applied surface science. 2006, Vol 252, Num 19, pp 7096-7101, issn 0169-4332, 6 p.Conference Paper

Depth profiling of emerging materials for semiconductor devicesRONSHEIM, P. A.Applied surface science. 2006, Vol 252, Num 19, pp 7201-7204, issn 0169-4332, 4 p.Conference Paper

Some applications of SIMS in conservation science, archaeometry and cosmochemistryMCPHAIL, D. S.Applied surface science. 2006, Vol 252, Num 19, pp 7107-7112, issn 0169-4332, 6 p.Conference Paper

Site specific and regional estimates of methane uptake by tropical rainforest soils in north eastern AustraliaKIESE, R; WOCHELE, S; BUTTERBACH-BAHL, K et al.Plant and soil. 2008, Vol 309, Num 1-2, pp 211-226, issn 0032-079X, 16 p.Conference Paper

Availability of layered certified reference materials for industrial application of glow discharge spectrometric depth profilingWINCHESTER, M; BECK, U.Surface and interface analysis. 1999, Vol 27, Num 10, pp 930-935, issn 0142-2421Article

Glow discharge spectroscopy for depth profile analysis : from micrometer to sub-nanometer layersPISONERO, Jorge.Analytical and bioanalytical chemistry. 2006, Vol 384, Num 1, pp 47-49, 3 p.Article

An analytical depth resolution function for the MRI modelLIU, Y; HOFMANN, S; WANG, J. Y et al.Surface and interface analysis. 2013, Vol 45, Num 11-12, pp 1659-1660, issn 0142-2421, 2 p.Article

Influence of non-Gaussian roughness on sputter depth profilesLIU, Y; JIAN, W; WANG, J. Y et al.Applied surface science. 2013, Vol 276, pp 447-453, issn 0169-4332, 7 p.Article

Influence of multi-hit capability on quantitative measurement of NiPtSi thin film with laser-assisted atom probe tomographyKINNO, T; AKUTSU, H; TAKENO, S et al.Applied surface science. 2012, Vol 259, pp 726-730, issn 0169-4332, 5 p.Article

The simulation of nanoscale sputter depth profiles using molecular dynamicsKAROLEWSKI, M. A.Applied surface science. 2009, Vol 255, Num 16, pp 7226-7233, issn 0169-4332, 8 p.Article

Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidationKOVAC, J; BIZJAK, M; PRACEK, B et al.Applied surface science. 2007, Vol 253, Num 9, pp 4132-4136, issn 0169-4332, 5 p.Article

Nitrogen depth profiling in thin oxynitride layers on siliconBUDREVICH, A; GLADKIKH, A; KAGANE, E et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 267-271, issn 0142-2421, 5 p.Conference Paper

Interdiffusion in microstructurally different Si/Al multilayered structuresWANG, J. Y; HE, D; ZALAR, A et al.Surface and interface analysis. 2006, Vol 38, Num 4, pp 773-776, issn 0142-2421, 4 p.Conference Paper

Caesium/xenon dual beam depth profiling : Velocity of the sputtered atom and ionization probabilityBRISON, J; DOUHARD, B; HOUSSIAU, L et al.Applied surface science. 2006, Vol 252, Num 19, pp 6440-6443, issn 0169-4332, 4 p.Conference Paper

Room temperature corrosion of museum glass: an investigation using low-energy SIMSFEARN, Sarah; MCPHAIL, David S; OAKLEY, Victoria et al.Applied surface science. 2004, Vol 231-32, pp 510-514, issn 0169-4332, 5 p.Conference Paper

Quantitative detection of purines in biologically relevant films with TOF-Secondary Ion Mass SpectrometryJACKSON, Lauren M; HUE, Jonathan J; WINOGRAD, Nicholas et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 237-239, issn 0142-2421, 3 p.Conference Paper

Depth profiling in secondary ion mass spectrometry for ultra-thin layer with nanometer order thickness by mesa-structure fabricationSEKI, S; TAMURA, H; WADA, Y et al.Surface and interface analysis. 2012, Vol 44, Num 5, pp 614-617, issn 0142-2421, 4 p.Article

Combination of high-resolution RBS and angle-resolved XPS : accurate depth profiling of chemical statesKIMURA, Kenji; NAKAJIMA, Kaoru; VANDERVORST, Wilfried et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 423-426, issn 0142-2421, 4 p.Conference Paper

Molecular depth profiling of multi-layer systems with cluster ion sourcesJUAN CHENG; WINOGRAD, Nicholas.Applied surface science. 2006, Vol 252, Num 19, pp 6498-6501, issn 0169-4332, 4 p.Conference Paper

Characterizing high-k and low-k dielectric materials for semiconductors : Progress and challengesBENNETT, J; QUEVEDO-LOPEZ, M; SATYANARAYANA, S et al.Applied surface science. 2006, Vol 252, Num 19, pp 7167-7171, issn 0169-4332, 5 p.Conference Paper