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The method of early fault identification in a wind turbineBLAGITKO, B; BRIGYLEVICH, V; JARMOLOVSKYJ, I et al.Mathematical Methods in Electromagnetic Theory : MMET '06. 2006, isbn 1-424-40490-8, 1Vol, p. 327Conference Paper

Contrôle: Détection des défauts: la vision très affûtéeMOUSSET, Anne-Katell.Process (Cesson-Sévigné). 2011, Num 1285, pp 92-94, issn 0998-6650, 3 p.Article

Reducing fault latency in concurrent on-line testing by using checking functions over internal linesPOMERANZ, Irith; REDDY, Sudhakar M.IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. 2004, pp 183-190, isbn 0-7695-2241-6, 1Vol, 8 p.Conference Paper

Defect diagnosis based on pattern-dependent stuck-at faultsPOMERANZ, Irith; VENKATARAMAN, Srikanth; REDDY, Sudhakar M et al.International Conference on Embedded Systems DesignInternational Conference on VLSI Design. 2004, pp 475-480, isbn 0-7695-2072-3, 1Vol, 6 p.Conference Paper

Defect detection: in the spotlightFLETCHER, John.World pipelines. 2011, Vol 11, Num 7, issn 1472-7390, 57-60 [4 p.]Article

Phase sensitive digitized frequency modulated thermal wave imaging and pulse compression for NDE applicationsMULAVEESALA, Ravibabu; TULI, Suneet.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 620515.1-620515.10, issn 0277-786X, isbn 0-8194-6261-6, 1VolConference Paper

Anomalous effects in silicon solar cell irradiated by 1-MeV protonsKACHARE, R; ANSPAUGH, B. E.Journal of applied physics. 1989, Vol 66, Num 6, pp 2662-2666, issn 0021-8979, 5 p.Article

Parallel Decentralized Damage Detection of a Structure with Subsets of ParametersLAW, S. S; NI, P. H; LI, J et al.AIAA journal. 2014, Vol 52, Num 3, pp 650-656, issn 0001-1452, 7 p.Article

Robust decentralized fault detection in leader-to-follower formations of uncertain linearly parameterized systemsLECHEVIN, Nicolas; ALAIN RABBATH, Camille.Journal of guidance, control, and dynamics. 2007, Vol 30, Num 5, pp 1528-1535, issn 0731-5090, 8 p.Article

The use of a new technology for enhanced Detection of crystalline defects on silicon wafersDOU, L; KESLER, D; GROSE, R et al.SPIE proceedings series. 1998, pp 138-144, isbn 0-8194-2714-4Conference Paper

Formation of intrinsic surface defects during 248 nm photoablation of polyimideKRAJNOVICH, D. J; VAZAQUEZ, J. E.Journal of applied physics. 1993, Vol 73, Num 6, pp 3001-3008, issn 0021-8979Article

Enhancing the multiple-fault detection of single-fault test setsKUO, T;-Y; WANG, J.-F; LEE, J.-Y et al.Computer-aided design. 1992, Vol 24, Num 5, pp 243-250, issn 0010-4485Article

Qualitätssicherung in einem Werk des ElektromaschinenbausSPERLING, P.VDI-Z. 1991, Vol JUN, pp 60-65, issn 0042-1766, NSArticle

Sensor fault detection and localization using decorrelation methodsKROSCHEL, K; WERNZ, A.Sensors and actuators. A, Physical. 1991, Vol 25, Num 1-3, pp 43-50Article

A vision system for automated crack detection in weldsHO, S. K; WHITE, R. M; LUCAS, J et al.Measurement science & technology (Print). 1990, Vol 1, Num 3, pp 287-294, issn 0957-0233Article

Autocorrelation testing of combinational circuitsABORHEY, S.IEE proceedings. Part E. Computers and digital techniques. 1989, Vol 136, Num 1, pp 57-61, issn 0143-7062, 5 p.Article

Detection of damage in concrete using diffuse ultrasound (L)DEROO, Frederik; KIM, Jin-Yeon; JIANMIN QU et al.The Journal of the Acoustical Society of America. 2010, Vol 127, Num 6, pp 3315-3318, issn 0001-4966, 4 p.Article

Fault diagnosis in designs with convolutional compactorsMRUGALSKI, Grzegorz; POGIEL, Artur; RAJSKI, Janusz et al.International Test Conference. 2004, pp 498-507, isbn 0-7803-8580-2, 1Vol, 10 p.Conference Paper

Z-DFD : Design-for-diagnosability based on the concept of z-detectionPOMERANZ, Irith.International Test Conference. 2004, pp 489-497, isbn 0-7803-8580-2, 1Vol, 9 p.Conference Paper

Multiplets, models, and the search for meaning: Improving per-test fault diagnosisLAVO, David B; HARTANTO, Ismed; LARRABEE, Tracy et al.Proceedings - International Test Conference. 2002, pp 250-259, issn 1089-3539, isbn 0-7803-7542-4, 10 p.Conference Paper

Vertical and oblique fault detection in explicit surfacesCRUZ LOPEZ DE SILANES, Maria; CRUZ PARRA, Maria; TORRENS, Juan José et al.Journal of computational and applied mathematics. 2002, Vol 140, Num 1-2, pp 559-585, issn 0377-0427Conference Paper

New concerns for detection of pinholes in the passivation layer of IC'sSABIN, E.SPIE proceedings series. 1997, pp 419-428, isbn 0-8194-2765-9Conference Paper

Lump and neck detection. IWire industry. 1991, Vol 58, Num 10, pp 617-619, issn 0043-6011Article

Evaluation of the KLA-Tencor 2138 for line monitoring applicationsMETTEER, B; GARVIN, J; CATALDI, F et al.SPIE proceedings series. 1998, pp 568-577, isbn 0-8194-2777-2Conference Paper

Experimentelle Untersuchungen zur Erkennung von Defekten in Holz mittels Ultraschall = Possibility of defects detection in wood with ultrasoundNIEMZ, P; KUCERA, L. J; SCHOB, M et al.Holz als Roh- und Werkstoff. 1999, Vol 57, Num 2, pp 96-102, issn 0018-3768Article

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