SCD patterns have singular diffractionBAAKE, M; FRETTLÖH, D.Journal of mathematical physics. 2005, Vol 46, Num 3, pp 033510.1-033510.10, issn 0022-2488Article

A computer program for unique indexing of electron diffraction patternsPRANTL, W.Journal of applied crystallography. 1984, Vol 17, Num 1, pp 39-42, issn 0021-8898Article

Statistical properties of the speckle phase in image and diffraction fieldsTAKAI, N; KADONO, H; ASAKURA, T et al.Optical engineering (Bellingham. Print). 1986, Vol 25, Num 5, pp 627-635, issn 0091-3286Article

Diagrammes de Kikuchi et limites des zones de BrillouinKARAKHANYAN, R. K; ALEKSANYAN, P. L; GRIGORYAN, P. A et al.Kristallografiâ. 1984, Vol 29, Num 4, pp 785-786, issn 0023-4761Article

Figure de diffraction à l'arrière d'un cylindre dans la zone de pénombreKOKODIJ, N. G; KATRICH, A. B.Optika i spektroskopiâ. 1986, Vol 60, Num 4, pp 820-824, issn 0030-4034Article

Diffraction d'ondes sphériques convergentes par une ouverture circulaireDEMENT'EV, A. S; DOMARKENE, D. P.Optika i spektroskopiâ. 1984, Vol 56, Num 5, pp 869-872, issn 0030-4034Article

DIFFRACTION INTENSITIES FROM CURVED ELLIPTIC CRYSTALLITES.NIGAM GD; BHATTACHERJEE S; MUKHERJEE PS et al.1976; INDIAN J. PURE APPL. PHYS.; INDIA; DA. 1976; VOL. 14; NO 3; PP. 183-186; BIBL. 5 REF.Article

PERFECT-CRYSTAL MONOCHROMATORS FOR SYNCHROTRON X-RADIATION.BONSE U; MATERLIK G; SCHRODER W et al.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 223-230; BIBL. 19 REF.Article

DISTORTION OF W-RAY SMALL-ANGLE SCATTERING CURVES MEASURED BY A LEVELUT-GUINIER CAMERA WHEN THE PRIMARY BEAM CONVERGES AT A POINT ON THE COUNTER.KRANJC K.1974; J. APPL. CRYSTALLOGR.; DENM.; DA. 1974; VOL. 7; NO 5; PP. 498-501; BIBL. 2 REF.Article

LOW ANGLE ELECTRON DIFFRACTION WITH THE ELMISKOP 101 ELECTRON MICROSCOPEARMIGLIATO A; MERLI PG; RUFFINI G et al.1973; J. PHYS. E; G.B.; DA. 1973; VOL. 6; NO 1; PP. 35-39; BIBL. 11 REF.Serial Issue

LA PREVISION DU DIAGRAMME DE DIFFRACTION ELECTRONIQUE D'UN MICROCRISTAL.LARROQUE P; BRIEU M; LAFOURCADE L et al.1976; C.R. ACAD. SCI., B; FR.; DA. 1976; VOL. 282; NO 14; PP. 309-312; BIBL. 12 REF.Article

EINIGE NEUE ANSAETZE ZUR ROENTGENBEUGUNG, IM BESONDEREN ZUR RUECKSTRAHLDIFFRAKTOMETRIE. II. = SUR DE NOUVEAUX ASPECTS EN DIFFRACTION RX, EN PARTICULIER SUR LA DIFFRACTOMETRIE EN RETOURROBITSCH J.1974; JB. NATURWISSENSCH. ABTG JOANNEUM; OESTERR.; DA. 1974; PP. 86-95; BIBL. 8 REF.Article

LE PASSAGE DES PROTONS A TRAVERS LES CRISTAUX MINCESGEGUZIN YA E; FAJNSHTEJN AL; MARKUS AM et al.1974; METALLOFIZIKA, U.S.S.R.; S.S.S.R.; DA. 1974; NO 51; PP. 3-17; H.T. 4; BIBL. 1 P. 1/2Article

OPTISCHE DOPPELBEUGUNG UND LEED. = DOUBLE DIFFRACTION OPTIQUE ET DIFFRACTION D'ELECTRONS DE BASSE ENERGIEHEINZ K.1974; Z. NATURFORSCH., A; DTSCH.; DA. 1974; VOL. 29; NO 10; PP. 1514-1515; ABS. ANGL.; BIBL. 5 REF.Article

INTERET DU FILTRAGE DES ENERGIES EN DIFFRACTION ELECTRONIQUEDUVAL P; HENRY L.1973; J. APPL. CRYSTALLOGR.; DENM.; DA. 1973; VOL. 6; NO 2; PP. 113-116; ABS. ANGL.; BIBL. 7 REF.Serial Issue

New electron diffraction techniques using electronic hollow-cone illuminationKONDO, Y; ITO, T; HARADA, Y et al.Japanese journal of applied physics. 1984, Vol 23, Num 3, pp L178-L180, issn 0021-4922, 2Article

VANTAGGI DELL' IMPIEGO DI UN DIFFRATTOGRAFO CONICO NEL CONTROLLO DI QUALITA DEI MATERIALI MEDIANTE DIFFRAZIONE DEI RAGGI X. = AVANTAGES DE L'EMPLOI D'UN DIFFRACTOGRAPHE CONIQUE POUR CONTROLER LA QUALITE DES MATERIELS PAR LA DIFFRACTION DES RAYONS XTRONCA A.1975; RASS. CHIM.; ITAL.; DA. 1975; VOL. 27; NO 1; PP. 19-22; ABS. FR. ANGL. ALLEMArticle

ELEKTRONENMIKROSKOPISCHE BEOBACHTUNG VON ZONENACHSEN-INTERFERENZMUSTERN IN VERBOGENEN MOLYBDAENFOLIEN = OBSERVATION AU ME DE MOTIFS D'INTERFERENCES D'AXES DE ZONES DANS DES FEUILLES DE MO COURBEESLUFT A.1972; KRISTALL U. TECH.; DTSCH.; DA. 1972; VOL. 7; NO 10; PP. 1119-1125; ABS. ANGL.; BIBL. 9 REF.Serial Issue

XRD2DScan : new software for polycrystalline materials characterization using two-dimensional X-ray diffractionRODRIGUEZ-NAVARRO, Alejandro B.Journal of applied crystallography. 2006, Vol 39, pp 905-909, issn 0021-8898, 5 p., 6Article

Analysis of mineral powder mixtures by heavy ion bombardment and X-ray diffractionCARTZ, L; KARIORIS, F. G; WONG, M. S et al.Radiation effects. 1986, Vol 97, Num 3-4, pp 235-241, issn 0033-7579Article

Analysis of the scintillation pattern of the pulsar PSR B0329+54 based on VLBI data at 1650 MHzSEMENKOV, K. V; SOGLASNOV, V. A; POPOV, M. V et al.Astronomy reports. 2004, Vol 48, Num 6, pp 457-469, issn 1063-7729, 13 p.Article

Differential fourier transform technique for the inverse scattering problemSHIMIZU, K; ISHIMARU, A.Applied optics. 1990, Vol 29, Num 23, pp 3428-3433, issn 0003-6935Article

Diffraction pattern of circular and rectangular apertures in the spinor formalism of electromagnetismHILLION, P; QUINNEZ, S.Journal of optics. 1985, Vol 16, Num 1, pp 5-19, issn 0150-536XArticle

An experimental investigation of diffraction patterns in low-Fresnel-number focusing systemsYAJUNLI; PLATZER, H.Optica acta. 1983, Vol 30, Num 11, pp 1621-1643, issn 0030-3909Article

Large-angle convergent-beam zone axis patternsFUNG, K. K.Ultramicroscopy. 1983, Vol 12, Num 3, pp 243-246, issn 0304-3991Article