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Results 1 to 25 of 15610

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Vers une méthode de caractérisation du pouvoir propagation d'incendie des diélectriques liquides = Towards a characterization method of fire propagation power of liquid dielectricsBASTIAN, J.Revue générale de l'électricité (Paris). 1989, Num 7, pp 63-64, issn 0035-3116, 2 p.Article

ICPADM : proceedings [of the] second international conference on properties and applications of dielectric materials, Beijing, September 12-16, 1988International conference on properties and applications of dielectric materials. 2. 1988, 2Vol, XIV-779 pConference Proceedings

Vidicons sensitive in the medium infrared spectral region with phototargets based on semiconductor-insulator structuresKOVTONJUK, N. F; MISNIK, V. P; SOKOLOV, A. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2005, pp 207-217, issn 0277-786X, isbn 0-8194-5828-7, 1Vol, 11 p.Conference Paper

L'effetto di compensazione nello studio dell'inve cchiamento termico dei materiali isolanti = Compensation effect in the study of thermal ageing of insulating materialsMONTANARI, G. C.Energia Elettrica. 1990, Vol 67, Num 11, pp 485-497, issn 0013-7308, 13 p.Article

Determination of thickness and dielectric constant of coatings from capacitance measurementsGUADARRAMA-SANTANA, A; GARCIA-VALENZUELA, A.IEEE instrumentation & measurement magazine. 2007, Vol 10, Num 5, pp 26-31, issn 1094-6969, 6 p.Article

Electric Relaxational Effects Induced by Ionic Conductivity in Dielectric MaterialsSWIERGIEL, Jolanta; JADZYN, Jan.Industrial & engineering chemistry research. 2011, Vol 50, Num 21, pp 11935-11941, issn 0888-5885, 7 p.Article

Electric Relaxational Effects Induced by Displacement Current in Dielectric MaterialsJADZYN, Jan; SWIERGIEL, Jolanta.Industrial & engineering chemistry research. 2012, Vol 51, Num 2, pp 807-813, issn 0888-5885, 7 p.Article

Percolative model of electric breakdown in liquid dielectricsJUN QIAN; JOSHI, Ravindra P; SCHOENBACH, Karl H et al.IEEE transactions on plasma science. 2002, Vol 30, Num 5, pp 1931-1938, issn 0093-3813, 8 p., 1Article

Les équations générales de la disruption d'un milieu condenséVERSHININ, YU. N; PLESHANOV, A. S.Izvestiâ Akademii nauk SSSR. Ènergetika i transport. 1987, Num 6, pp 75-81, issn 0002-3310Article

14TH Workshop on dielectrics in microelectronics (WoDiM 2006)LOMBARDO, Salvatore.Microelectronics and reliability. 2007, Vol 47, Num 4-5, issn 0026-2714, 362 p.Conference Proceedings

Dielectrics for nanosystems : materials science, processing, reliability, and manufacturing (Honolulu HI, 3-8 October 2004)Singh, R; Iwai, H; Tummala, R.R et al.Proceedings - Electrochemical Society. 2004, issn 0161-6374, isbn 1-56677-417-9, X, 490 p, isbn 1-56677-417-9Conference Proceedings

A study of the relationship between the rheo-dielectric effect and the elasticity of viscoelastic materialsYIYAN PENG; TURNG, Lih-Sheng; HAIMEI LI et al.Journal of rheology (New York, NY). 2011, Vol 55, Num 2, pp 301-311, issn 0148-6055, 11 p.Article

Les matériaux diélectriques pour résonateurs hyperfréquences = Dielectric materials for microwave resonatorsMAGE, J.-C; LABEYRIE, M.Onde électrique. 1990, Vol 70, Num 5, pp 6-13, issn 0030-2430, 8 p.Conference Paper

Problèmes posés par l'analyse de matériaux isolants en spectroscopie d'électrons Auger = Problems of isolating material analysis in Auger spectroscopyJARDIN, C; RENOUD, R.Le Vide (1995). 1996, Vol 52, Num 279, pp 106-110, issn 1266-0167Conference Paper

A study of source/drain-on-insulator structure for extremely scaled MOSFETsZHIKUAN ZHANG; SHENGDONG ZHANG; CHUGUANG FENG et al.DRC : Device research conference. 2004, pp 115-116, isbn 0-7803-8284-6, 1Vol, 2 p.Conference Paper

Recent progress on the dielectric properties of dielectric resonator materials with their applications from microwave to optical frequenciesHIGUCHI, Yukio; TAMURA, Hiroshi.Journal of the European Ceramic Society. 2003, Vol 23, Num 14, pp 2683-2688, issn 0955-2219, 6 p.Conference Paper

Microwave characteristics of TiO2-Bi2O3 dielectric resonatorFUKUDA, K; KITOH, R; AWAI, I et al.Japanese journal of applied physics. 1993, Vol 32, Num 10, pp 4584-4588, issn 0021-4922, 1Article

Effect of edge region on crosspolar performance of mm-wave dielectric core hornCAHILL, R.Electronics Letters. 1989, Vol 25, Num 2, pp 131-133, issn 0013-5194, 3 p.Article

Méthodes diélectriques de détermination de la teneur en couches d'eau des cristaux de micaMETSIK, M. S; SHCHERBACHENKO, L. A; KUZNETSOVA, V. A et al.Èlektričestvo. 1988, Num 5, pp 65-68, issn 0013-5380Article

Analyse électrodynamique des filtres guides d'onde diélectriquesLYAPIN, V. P; MANUILOV, M. B; SINYAVSKIJ, G. P et al.Izvestiâ vysših učebnyh zavedenij. Radiofizika. 1986, Vol 29, Num 7, pp 809-815, issn 0021-3462Article

A thin multi-ring negative liquid crystal lens enabled by high-κ dielectric materialHSU, Chao-Jui; CHAO, Paul C.-P; KAO, Yung-Yuan et al.Microsystem technologies. 2011, Vol 17, Num 5-7, pp 923-929, issn 0946-7076, 7 p.Article

Digest of literature on dielectricsTHOMPSON, J. E.IEEE transactions on electrical insulation. 1986, Vol 21, Num 5, pp 681-804, issn 0018-9367Serial Issue

Fabrication of strained Si/Strained SiGe/Strained si heterostructures on insulator by a bond and etch-back techniqueABERG, I; OLUBUVIDE, O. O; LI, J et al.IEEE international SOI conference. 2004, pp 35-36, isbn 0-7803-8497-0, 1Vol, 2 p.Conference Paper

The breakdown strength of two-layer dielectricsLEBEDEV, S. M; GEFLE, O. S; POKHOLKOV, Yu. P et al.IEE conference publication. 1999, pp 4.304.P2-4.307.P2, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Perturbational torsion about a finite extension of an elastic dielectricCROITORO, E. M.Zeitschrift für angewandte Mathematik und Physik. 1987, Vol 38, Num 3, pp 450-458, issn 0044-2275Article

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