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Radiation-Hardened Electronics and Ferroelectric Memory for Space Flight SystemsSAYYAH, Rana; MACLEOD, Todd C; HO, Fat D et al.Ferroelectrics (Print). 2011, Vol 413, pp 170-175, issn 0015-0193, 6 p.Article

Grain boundary-driven leakage path formation in HfO2 dielectricsBERSUKER, G; YUM, J; KITSCH, P et al.Solid-state electronics. 2011, Vol 65-66, pp 146-150, issn 0038-1101, 5 p.Conference Paper

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Small-signal impedance of a radio frequency plasma capacitorLINARDAKIS, Peter; BORG, Gerard G.IEEE microwave and wireless components letters. 2007, Vol 17, Num 11, pp 763-765, issn 1531-1309, 3 p.Article