New electron diffraction techniques using electronic hollow-cone illuminationKONDO, Y; ITO, T; HARADA, Y et al.Japanese journal of applied physics. 1984, Vol 23, Num 3, pp L178-L180, issn 0021-4922, 2Article

Affinement de réseaux à partir de diagrammes de diffraction de profil totalSERYKH, V. P; VERKHOROBIN, L. F.Kristallografiâ. 1986, Vol 31, Num 1, pp 173-174, issn 0023-4761Article

General aspects of beam threshold effects in leedGAUBERT, C; BAUDOING, R; GAUTHIER, Y et al.Surface science. 1984, Vol 147, Num 1, pp 162-178, issn 0039-6028Article

An improved technique for examining Bragg reflections in Δω, Δ2Θ^(δ) spaceMATHIESON, A. M; STEVENSON, A. W.Australian journal of physics. 1984, Vol 37, Num 6, pp 657-665, issn 0004-9506Article

Precession Electron CrystallographyDORSET, Doug; GILMORE, Chris.Zeitschrift für Kristallographie. 2010, Vol 225, Num 2-3, issn 0044-2968, 82 p.Serial Issue

X-ray powder diffraction profile fitting in quantitative determination of two polymorphs from their powder mixtureTANNINEN, V. P; YLIRUUSI, J.International journal of pharmaceutics. 1992, Vol 81, Num 2-3, pp 169-177, issn 0378-5173Article

Image resolution enhancement by combining information from electron diffraction pattern and micrographFAN HAI-FU; XIANG SHI-BIN; LI FANG-HUA et al.Ultramicroscopy. 1991, Vol 36, Num 4, pp 361-365, issn 0304-3991Article

X-ray particle-size broadeningRAO, S; HOUSKA, C. R.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, pp 6-13, issn 0108-7673, 1Article

The origin of circular arc in RHEED: 1D ordered surfaceKAWAMURA, T; HASEBE, M; DOBSON, P. J et al.Journal of the Physical Society of Japan. 1985, Vol 54, Num 10, pp 3675-3678, issn 0031-9015Article

Simultaneous observation of zone-axis pattern and±G Dark-field pattern in convergent-beam electron diffractionTERAUCHI, M; TANAKA, M.Journal of electron microscopy. 1985, Vol 34, Num 4, pp 347-356, issn 0022-0744Article

Missing spots in low-energy electron-diffraction patternsYANG, W. S; JONA, F.Physical review. B, Condensed matter. 1984, Vol 29, Num 2, pp 899-906, issn 0163-1829Article

Measurement of surface defects by low-energy electron diffractionHENZLER, M.Applied physics. A, Solids and surfaces. 1984, Vol 34, Num 4, pp 205-214, issn 0721-7250Article

New class of one-dimensional quasicrystalsKOLAR, M.Physical review. B, Condensed matter. 1993, Vol 47, Num 9, pp 5489-5492, issn 0163-1829Article

Effets de diffraction dus à un désordre unidimensionnel intense des structures hexagonales compactesPILYANKEVICH, E. A; USTINOV, A. I; CHUISTOV, K. V et al.Kristallografiâ. 1986, Vol 31, Num 1, pp 55-59, issn 0023-4761Article

Dynamical effects in foil thickness determination using convergent beam electron diffractionJESSON, D. E; SHAW, M. P.Physica status solidi. A. Applied research. 1985, Vol 88, Num 2, pp 469-474, issn 0031-8965Article

Inversion du contraste des raies de Kikuchi au voisinage des réflexions pontuelles ayant les mêmes indices dans les cristaux ayant des défautsKARAKHANYAN, R. K; ALEKSANYAN, P. L; MANUCHAROVA, ZH. K et al.Metallofizika (Kiev). 1985, Vol 7, Num 6, pp 96-97, issn 0204-3580Article

XFIT: a package for simulating an fitting X-ray powder diffraction patternsMARTORANA, A; GERBASI, R; MARIGO, A et al.Computer physics communications. 1984, Vol 34, Num 1-2, pp 145-151, issn 0010-4655Article

On the margin effect in section patterns obtained by plane-wave X-ray topographyISHIDA, K; KOBAYASHI, Y; KATOH, H et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1984, Vol 49, Num 1, pp L1-L4, issn 0141-8610Article

Search for streaks in electron diffraction patterns of strontium titanateARENAS, G; GEIGER, J.Zeitschrift für Naturforschung. Teil A : Physik, physikalische Chemie, Kosmophysik. 1984, Vol 39, Num 10, pp 945-947, issn 0340-4811Article

X-ray diffraction profiles described by refined analytical functionsRAO, S; HOUSKA, C. R.Acta crystallographica. Section A, Foundations of crystallography. 1986, Vol 42, pp 14-19, issn 0108-7673, 1Article

Post-refinement of oscillation diffraction data collected at a synchroton radiation sourceVRIEND, G; ROSSMANN, M. G; ARNOLD, E et al.Journal of applied crystallography. 1986, Vol 19, Num 2, pp 134-139, issn 0021-8898Article

UMWEG ― A computer program for calculation and graphical representation of Umweganregung-patternsROSSMANITH, E.Zeitschrift für Kristallographie. 1985, Vol 171, Num 3-4, pp 253-254, issn 0044-2968Article

Applications of fitting techniques to the Warren-Averbach method for X-ray line broadening analysisENZO, S; POLIZZI, S; BENEDETTI, A et al.Zeitschrift für Kristallographie. 1985, Vol 170, Num 1-4, pp 275-287, issn 0044-2968Article

Analyse pratique de Fourier d'un profil de diffraction RXOSIPOV, A. E; KURILKO, G. Z.Metallofizika (Kiev). 1984, Vol 6, Num 1, pp 113-114, issn 0204-3580Article

Sur la nature d'un défaut cristallin dans le métatitanate de baryum polycristallin = On a particular crystal defect in barium metatitanateMINH HOANG; MUTIN, J.-C; NIEPCE, J.-C et al.Comptes-rendus des séances de l'Académie des sciences. Série 2, Mécanique-physique, chimie, sciences de l'univers, sciences de la terre. 1983, Vol 297, Num 13, pp 899-902, issn 0750-7623Article