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The resolution function of an X-ray triple-crystal diffractometer: comparison of experiment and theoryLUCAS, C. A; GARTSTEIN, E; COWLEY, R. A et al.Acta crystallographica. Section A, Foundations of crystallography. 1989, Vol 45, Num 6, pp 416-422, issn 0108-7673, 7 p.Article

X-ray diffraction study of aqueous montmorillonite emulsionsFUKUSHIMA, Y.Clays and clay minerals. 1984, Vol 32, Num 4, pp 320-326, issn 0009-8604Article

A SIMPLE STRUCTURE-BUILDING TECHNIQUE.WEBSTER M.1974; J. APPL. CRYSTALLOGR.; DENM.; DA. 1974; VOL. 7; NO 3; PP. 406; BIBL. 1 REF.Article

ROENTGENOGRAPHISCHE BESTIMMUNG VON KRISTALLITGROEPEN UNTER BERUCKSICHTIGUNG VON GITTERVERZERRUNGEN. = DETERMINATION PAR LES RAYONS X DES TAILLES DE CRISTALLITES EN TENANT COMPTE DES DEFORMATIONS DE RESEAUGOLOB P; HORN H; KRAUTZ E et al.1974; ACTA PHYS. AUSTR.; AUSTR.; DA. 1974; VOL. 40; NO 2; PP. 104-118; ABS. ANGL.; BIBL. 19 REF.Article

UEBER MEHRSTELLIGE FEHLERGRENZEN. = SUR LA VALIDITE DES ECARTS TYPESMENZER G.1974; Z. KRISTALLOGR.; DTSCH.; DA. 1974; VOL. 140; NO 5-6; PP. 399-404; ABS. ANGLArticle

Comparison between two X-ray methods for deformation profile determinationZAUMSEIL, P; WINTER, U; VARTANYANTS, I. A et al.Physica status solidi. A. Applied research. 1990, Vol 121, Num 2, pp K149-K153, issn 0031-8965Article

DIGITAL PROCESSING OF FIBRE DIFFRACTION PATTERNS.FRASER RDB; MACRAE TP; MILLER A et al.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 2; PP. 81-94; BIBL. 31 REF.Article

A RAPID PROCEDURE FOR ALIGNING CRYSTALS ON THE PRECESSION CAMERA.STIRLING DR; DE WET JF.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 4; PP. 339-341; BIBL. 2 REF.Article

SUR LES EXIGENCES AUX DONNEES EXPERIMENTALES LORS DE L'ANALYSE FOURIER DU PROFIL DES LIGNES DE DIFFRACTIONBELOZEROV BP; TURLAKOV VN; SHEJNKMAN AI et al.1975; ZAVODSK. LAB.; S.S.S.R.; DA. 1975; VOL. 41; NO 5; PP. 552-554; BIBL. 4 REF.Article

VANTAGGI DELL' IMPIEGO DI UN DIFFRATTOGRAFO CONICO NEL CONTROLLO DI QUALITA DEI MATERIALI MEDIANTE DIFFRAZIONE DEI RAGGI X. = AVANTAGES DE L'EMPLOI D'UN DIFFRACTOGRAPHE CONIQUE POUR CONTROLER LA QUALITE DES MATERIELS PAR LA DIFFRACTION DES RAYONS XTRONCA A.1975; RASS. CHIM.; ITAL.; DA. 1975; VOL. 27; NO 1; PP. 19-22; ABS. FR. ANGL. ALLEMArticle

PRECISE UNIT CELL PARAMETER AND THERMAL EXPANSION MEASUREMENTS OF SINGLE CRYSTALS BY X-RAY DIFFRACTION.POPOVIC S; SLJUKIC M; HANIC F et al.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 23; NO 1; PP. 265-274; ABS. RUSSE; BIBL. 16 REF.Article

SPLITTING OF X-RAY DIFFRACTION SPOTS, STREAKING ALONG (HO.1) ROWS AND GROWTH OF POLYTYPIC CRYSTALS.RAM US; DUBEY M; SINGH G et al.1974; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1974; VOL. 22; NO 2; PP. K125-K128; H.T. 2; BIBL. 7 REF.Article

METHODE DE CONSTRUCTION DE FIGURES DE POLES INVERSES NORMALISEESLAJNER DI; RADISHEVSKIJ AI; KOMAROVA IA et al.1974; KRISTALLOGRAFIJA; S.S.S.R.; DA. 1974; VOL. 19; NO 5; PP. 942-945; BIBL. 5 REF.Article

AUTOMATIC ABSORPTION CORRECTION USING INTENSITY MEASUREMENTS FROM AZIMUTHAL SCANS.FLACK HD.1974; ACTA CRYSTALLOGR., B; DANEM.; DA. 1974; VOL. 30; NO 4; PP. 569-573; BIBL. 11 REF.Article

A SMALL-ANGLE X-RAY DIFFRACTION STUDY OF VALINOMYCIN AND ITS POTASSIUM ISOTHIOCYANATE COMPLEX IN SOLUTION = UNE ETUDE PAR DIFFRACTION AUX RAYONS X AUX PETITS ANGLES DE LA VALINOMYCINE ET SON COMPLEXE AVEC L'ISOTHIOCYANATE DE POTASSIUM EN SOLUTIONKRIGBAUM WR; KUEGLER FR; OELSCHLAEGER H et al.1972; BIOCHEMISTRY; U.S.A.; DA. 1972; VOL. 11; NO 24; PP. 4548-4552; BIBL. 19REF.Serial Issue

DETERMINATION DU CENTRE DES COURBES DE DIFFRACTION DE RAYONS XDANILOV VF; VYPRYAZHKIN VP; BRAZGIN IA et al.1976; ZAVODSK LAB.; S.S.S.R.; DA. 1976; VOL. 42; NO 5; PP. 546-548; BIBL. 3 REF.Article

AN ESTIMATE OF CRYSTALLITE SIZE FROM THE PEAK OF THE DIFFRACTION LINE-PROFILE.SMITH WL.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 2; PP. 139-141; BIBL. 7 REF.Article

EXTINCTION IN POWDER DIFFRACTION PATTERNS.MITRA GB; CHATTOPADHAY T.1975; INDIAN J. PHYS.; INDIA; DA. 1975; VOL. 49; NO 3; PP. 218-226; BIBL. 20 REF.Article

SIMULTANEOUS REFLEXION: ITS DETECTION AND CORRECTION FOR INTENSITY PERTURBATION.TANAKA K; SAITO Y.1975; ACTA CRYSTALLOGR., A; DANEM.; DA. 1975; VOL. 31; NO 6; PP. 841-845; BIBL. 7 REF.Article

ROENTGENKRISTALLSTRUKTURANALYSE UND ORGANISCHE CHEMIE. = ANALYSE DE STRUCTURE CRISTALLINE AUX RX EN CHIMIE ORGANIQUEGIEREN A; HOPPE W.1975; Z. (FRESENIUS') ANAL. CHEM.; DTSCH.; DA. 1975; VOL. 273; NO 5; PP. 374-390; ABS. ANGL.; BIBL. 41 REF.Article

A METHOD FOR THE ACCURATE MEASUREMENT OF LATTICE COMPRESSIONS OF LOW-Z MATERIALS AT PRESSURES UP TO 12GPA BY X-RAY DIFFRACTION.HALLECK PM; OLINGER B.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 11; PP. 1408-1410; BIBL. 18 REF.Article

A TECHNIQUE FOR VERIFYING THE ALIGNMENT OF LARGE SINGLE CRYSTALS.GREINER JD; BAILEY DM.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 8; PP. 1032-1033Article

COMMENTS ON HIGH-PRECISION ORIENTATION OF CRYSTALS USING THE LAUE METHOD WITH CHARACTERISTIC X-RAYS BY G. CHRISTIANSEN, L. GERWARD AND I. ALSTRUP.MCINTYRE GJ; BARNEA Z; CHRISTIANSEN G et al.1976; ACTA CRYSTALLOGR., A; DENM.; DA. 1976; VOL. 32; NO 1; PP. 168; BIBL. 3 REF.Article

THE APPLICATION OF THE CONVOLUTION RELATIONS IN X-RAY LINE BREADTH ANALYSIS. II.NANDI RK; SEN GUPTA SP.1976; J. PHYS. D; G.B.; DA. 1976; VOL. 9; NO 4; PP. 593-600; BIBL. 4 REF.Article

THE PROBLEM OF WHITE RADIATION IN THE MEASUREMENT OF INTENSITIES WITH A SOLID-STATE DETECTOR.HOWARD HJ; JONES RDG.1976; J. APPL. CRYSTALLOGR.; DENM.; DA. 1976; VOL. 9; NO 3; PP. 235; BIBL. 2 REF.Article

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