A semiautomated electron backscatter diffraction technique for extracting reliable twin statisticsHENRIE, B. L; MASON, T. A; HANSEN, B. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2004, Vol 35, Num 12, pp 3745-3751, issn 1073-5623, 7 p.Article

Structural disorder in T*-phase superconducting oxidesINOUE, Y; HASEGAWA, M; MUNAKATA, F et al.Physica. C. Superconductivity. 1991, Vol 190, Num 1-2, pp 126-128, issn 0921-4534Conference Paper

A computer program for the evaluation of orientation relationships from simple electron-diffraction spot patternsPRANTL, W.Journal of applied crystallography. 1987, Vol 20, Num 5, pp 439-440, issn 0021-8898Article

A new condenser system for convergent-beam electron diffractionTOMITA, T; HARADA, Y.Journal of electron microscopy. 1986, Vol 35, Num 4, pp 426-429, issn 0022-0744Article

Study of {1121} Twinning in α-Ti by EBSD and Laue MicrodiffractionLEYUN WANG; BARABASH, Rozaliya; BIELER, Thomas et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2013, Vol 44, Num 8, pp 3664-3674, issn 1073-5623, 11 p.Article

Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)HUMPHREYS, F. J.Scripta materialia. 2004, Vol 51, Num 8, pp 771-776, issn 1359-6462, 6 p.Article

Matrices des relations de maclage dans l'analyse des figures de diffraction électroniqueDZIGRASHVILI, T. A.Kristallografiâ. 1987, Vol 32, Num 6, pp 1523-1525, issn 0023-4761Article

Quantitative Comparison of Microtexture in Near-Alpha Titanium Measured by Ultrasonic Scattering and Electron Backscatter DiffractionPILCHAK, Adam L; JIA LI; ROKHLIN, Stanislav I et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 10, pp 4679-4697, issn 1073-5623, 19 p.Article

Electron crystallography at atomic resolution : the structure of the odd-chain paraffin n-tritiacontaneDORSET, D. L; WEIPING ZHANG.Journal of electron microscopy technique. 1991, Vol 18, Num 2, pp 142-147, issn 0741-0581Article

Characterization of Ferrite in Tempered Martensite of Modified 9Cr-1 Mo Steel Using the Electron Backscattered Diffraction TechniqueDAS, C. R; ALBERT, S. K; BHADURI, A. K et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2011, Vol 42, Num 13, pp 3849-3852, issn 1073-5623, 4 p.Article

Studies of Orientations of β Precipitates in AI-Mg-Si-(Cu) Alloys by Electron Diffraction and Transition Matrix AnalysisWENCHAO YANG; MINGPU WANG; YANLIN JIA et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2011, Vol 42, Num 9, pp 2917-2929, issn 1073-5623, 13 p.Article

ELD : a computer program system for extracting intensities from electron diffraction patternsXIAODONG ZOU; SUKHAREV, Y; HOVMÖLLER, S et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 147-158, issn 0304-3991Article

On the investigation of local interface sharpness and period uniformity of multilayers in plan-view observation by CBEDGONG, H; SCHAPINK, F. W.Applied surface science. 1992, Vol 56-58, pp 643-649, issn 0169-4332, bConference Paper

Approximations to the systematic many-beam case of high-energy electron diffraction. I: Transition from two-beam to many-beam interactionKÄSTNER, G.Physica status solidi. B. Basic research. 1988, Vol 145, Num 2, pp 373-390, issn 0370-1972Article

Application of electron backscatter diffraction to the study of phase transformationsGOURGUES-LORENZON, A. F.International materials reviews. 2007, Vol 52, Num 2, pp 65-128, issn 0950-6608, 64 p.Article

Circular diffuse scattering of akermanite studied by the optical diffraction methodIISHI, K; HAGIYA, K; OHMASA, M et al.Physics and chemistry of minerals. 1994, Vol 21, pp 6-11, issn 0342-1791, 1/2Article

Real space modulation in Bi₂Sr₂Ca_nCu_n+1O_6+2n and Tl₂Ba₂CuO₆ superconductors derived from electron diffraction informationVERWERFT, M; VAN TENDELOO, G.Journal of electron microscopy technique. 1991, Vol 17, Num 1, pp 70-80, issn 0741-0581Article

Observation of Berry's geometrical phase in electron diffraction from a screw dislocationBIRD, D. M; PRESTON, A. R.Physical review letters. 1988, Vol 61, Num 25, pp 2863-2866, issn 0031-9007Article

Direct measurement of crystallographic phase by electron diffractionBIRD, D. M; JAMES, R; PRESTON, A. R et al.Physical review letters. 1987, Vol 59, Num 11, pp 1216-1219, issn 0031-9007Article

EBSD and DTA Characterization of A356 Alloy Deformed by ECAP During Reheating and Partial Re-meltingMORADI, Marzyeh; NILI-AHMADABADI, Mahmoud; POORGANJI, Behrang et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2014, Vol 45, Num 3, pp 1540-1551, issn 1073-5623, 12 p.Article

Variant selection during secondary twinning in Mg―3%AlMARTIN, E; CAPOLUNGO, L; JIANG, L et al.Acta materialia. 2010, Vol 58, Num 11, pp 3970-3983, issn 1359-6454, 14 p.Article

Towards a description of complex pearlite structuresAEMOUDT, Etienne; WALENTEK, Artur; SEEFELDT, Marc et al.Zeitschrift für Metallkunde. 2005, Vol 96, Num 9, pp 1032-1037, issn 0044-3093, 6 p.Article

An alternative study of the reciprocity theorem in electron diffractionQIN, L. C; GOODMAN, P.Ultramicroscopy. 1989, Vol 27, Num 1, pp 115-116, issn 0304-3991, 2 p.Article

Matrix methods for single and multiple inelastic scattering in electron diffractionVAN ROOST, C; SERNEELS, R.Philosophical magazine. B. Physics of condensed matter. Electronic, optical and magnetic properties. 1987, Vol 56, Num 3, pp 397-409, issn 0141-8637Article

SIMCON : a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fieldsJANSSENS, K. G. F; VANHELLEMONT, J; DE GRAEF, M et al.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 323-335, issn 0304-3991Article