Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("Dispositif")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 87530

  • Page / 3502
Export

Selection :

  • and

Plasma physics and controlled nuclear fusion research. International conferenceNuclear fusion supplement. 1990, Vol 1, issn 0589-1469, 874 p.Conference Proceedings

NOISE IN MICROWAVE, INJECTION, TRANSIT TIME AND TRANSFERRED-ELECTRON DEVICES.CONSTANT E.1976; PHYS. B+C; PAYS-BAS; DA. 1976; VOL. 83; NO 1; PP. 24-40; BIBL. 31 REF.; (PHYS. ASPECTS NOISE SOLID STATE DEVICE. INT. CONF. 4. PROC.; NOORDWIJKERHOUT; 1975)Conference Paper

OPTOELECTRONIQUE.BROUSSAUD G.1974; PARIS; MASSON; DA. 1974; PP. (350P.); BIBL. DISSEM.; ISBN 2225391386; (MONOGR. ELECTRON.)Book

VACUUM AND FIRST WALL TECHNOLOGY1979; FUSION TECHNOLOGY 1978. SYMPOSIUM ON FUSION TECHNOLOGY/1978/PADOUE; GBR/USA/FRA; OXFORD: PERGAMON PRESS/NEW YORK: PERGAMON PRESS/PARIS: PERGAMON PRESS; DA. 1979; PP. 729-936; BIBL. DISSEM.Conference Paper

INFRARED IMAGING WITH VIDICONS AND CHARGE INJECTION DEVICES.SIPPACH HG.1975; MATER. EVALUAT.; U.S.A.; DA. 1975; VOL. 33; NO 8; PP. 209-212Article

WHICH SOLID STATE IMAGER: CID CCD.SACHS FA; SAVOYE ED.1978; ELECTRO-OPT. SYST. DESIGN; USA; DA. 1978; VOL. 10; NO 8; PP. 70-75Article

LES CELLULES PHOTOELECTRIQUES ET LES MESURES QUANTITATIVES.FEVROT C.1974; REV. PRAT. CONTROLE INDUSTR.; FR.; DA. 1974; VOL. 14; NO 70; PP. 41-43Article

CHARGE TRANSFER DEVICES A REVOLUTION IN SIGNAL PROCESSING AND IMAGING.ESSER LJM.sdIN: NATO ADV. STUDY INST. SOLID STATE IMAGING; LOUVAIN; 1975; S.L.; DA. S.D.; PP. 1-85; H.T. 33; BIBL. 11 P.Conference Paper

Formation of implanted piezoresistors under 100-NM thick for nanoelectromechanical systemsBERGAUD, C; COCHETEAU, E; BARY, L et al.Proceedings, IEEE micro electro mechanical systems. 2002, pp 360-363, issn 1084-6999, isbn 0-7803-7185-2, 4 p.Conference Paper

TRANSIT-TIME NEGATIVE RESISTANCE IN BULK SI STRUCTURES SUBJECTED TO AVALANCHE INJECTION.SPIRITO P; VITALE G.1975; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1975; VOL. 22; NO 12; PP. 1087-1091; BIBL. 8 REF.Article

CHARGE TRANSFER DEVICES. I.THEUNISSEN JJ.1974; ONDE ELECTR.; FR.; DA. 1974; VOL. 54; NO 7; PP. 317-324; ABS. FR.; BIBL. 17 REF.Article

TECHNIQUES FOR EVALUATING CHARGE COUPLED IMAGERS.CAMPANA SB.1977; OPT. ENGNG; U.S.A.; DA. 1977; VOL. 16; NO 3; PP. 267-274; BIBL. 8 REF.Article

L'EMPLOI DES COMPOSANTS OPTOELECTRONIQUES.1974; TOUTE ELECTRON.; FR.; DA. 1974; NO 387; PP. 90-93Article

CHARGE-INJECTION DEVICES FOR SOLID STATE IMAGING.MICHON GJ; BURKE HK.sdIN: NATO ADV. STUDY INST., SOLID STATE IMAGING; LOUVAIN; 1975; S.L.; DA. S.D.; PP. 1-15; BIBL. 8 REF.Conference Paper

MOEM systems in EuropeSALOMON, P; PARRIAUX, O.SPIE proceedings series. 1997, pp 2-10, isbn 0-8194-2419-6Conference Paper

TRANSPARENT METAL OXIDE ELECTRODE CID IMAGER.BROWN DM; GHEZZO M; GARFINKEL M et al.1976; I.E.E.E. TRANS. ELECTRON. DEVICES; U.S.A.; DA. 1976; VOL. 23; NO 2; PP. 196-200; BIBL. 8 REF.Article

OPTOELEKTRONISCHE HALBLEITERBAUELEMENTE. = COMPOSANTS SEMICONDUCTEURS OPTOELECTRONIQUESKRAUSE G; KEINER F.1975; ELEKTRONIK; DTSCH.; DA. 1975; VOL. 24; NO 6; PP. 87-94; BIBL. 23 REF.Article

SUR LE CALCUL DES DISPOSITIFS OPTOELECTRONIQUES DE COMMANDE PAR PANNEAUX ELECTROLUMINESCENTSBOGOLYUBOV NV; OLEKSENKO PF; SVECHNIKOV SV et al.1974; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1974; NO 15; PP. 19-23; BIBL. 5 REF.Article

A HIGH-SENSITIVITY REAL-TIME ACOUSTIC IMAGING SYSTEM FOR BIOMEDICAL DIAGNOSIS.WANG K; WADE G.1974; PROC. I.E.E.E.; U.S.A.; DA. 1974; VOL. 62; NO 5; PP. 650-651; BIBL. 5 REF.Article

SEMICONDUCTORS IMAGE SENSING TECHNIQUES.HARDING J.1977; ELECTRON. ENGNG; G.B.; DA. 1977; VOL. 49; NO 599; PP. 51-52Article

INVESTIGATIONS OF THE FABRICATION OF THIN SILICON FILMS FOR MICROWAVE SEMICONDUCTOR TRANSIT TIME DEVICES.FREYER J.1975; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1975; VOL. 122; NO 9; PP. 1238-1240; BIBL. 8 REF.Article

CHARGE-COUPLED IMAGING: STATE OF THE ART.CARNES JE.1973; INST. PHYS. CONF. SER., LONDON; G.B.; DA. 1973; NO 19; PP. 83-107; H.T. 8; BIBL. 1 P. 1/2; (3RD EUR. SOLID STATE DEVICE RES. CONF.; MUNICH; 1973)Conference Paper

STRAHLUNGSEMPFAENGER FUER DEN INFRAROTEN WELLENLAENGENBEREICH = RECEPTEURS DE RAYONNEMENT POUR LE DOMAINE DES LAMBDA IRSOA EA.1972; EXPER. TECH. PHYS.; DTSCH.; DA. 1972; VOL. 20; NO 6; PP. 525-531; ABS. ANGL.; BIBL. 5 REF.Serial Issue

CHARGE TRANSFER DEVICES AND SIGNAL PROCESSING APPLICATIONS.HANNEMAN HW; THEUNISSEN MJJ.sdIN: TECHNOL. POINTE TRAIT. SIGNAUX. JOURN. ELECTRON.; LAUSANNE; 1975; S.L.; DA. S.D.; PP. 101-130; BIBL. 2 P. 1/2Conference Paper

STATUS OF E-O IMAGING SYSTEMS.LAVIN H.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 1; PP. 20-21Article

  • Page / 3502