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Mechanismen der Blasenbildung in Anstrichfilmen auf Metall = Cloquage des peintures sur métal = Blistering of coatings on metalLAMPE, K; HANSEN, C. M.Farbe + Lack. 1984, Vol 90, Num 6, pp 464-468, issn 0014-7699Article

The breakdown strength of two-layer dielectricsLEBEDEV, S. M; GEFLE, O. S; POKHOLKOV, Yu. P et al.IEE conference publication. 1999, pp 4.304.P2-4.307.P2, issn 0537-9989, isbn 0-85296-719-5Conference Paper

An analysis of air breakdown in electrostatic recordingKIMURA, M; NAKAJIMA, J; MATSUDA, T et al.IEEE transactions on industry applications. 1984, Vol 20, Num 4, pp 869-872, issn 0093-9994Conference Paper

Points lumineux et disruption dans la structure des transistors à base de GaAsKERNER, B. S; KOZLOV, N. A; NECHAEV, A. M et al.Fizika i tehnika poluprovodnikov. 1983, Vol 17, Num 11, pp 1931-1934, issn 0015-3222Article

Weibull statistical analysis of area effect on the breakdown strength in polymer filmsUL-HAQ, Saeed; GOVINDA RAJU, G. R.CEIDP : conference on electrical insulation and dielectric phenomena. 2002, pp 518-521, isbn 0-7803-7502-5, 4 p.Conference Paper

The total voltage-current effect for porous electrodesTATARINOVA, N. V; GRIGORIEV, YU. V.IEEE transactions on dielectrics and electrical insulation. 1995, Vol 2, Num 2, pp 277-280, issn 1070-9878Conference Paper

Etude de la disruption électrique de l'oxyde de tantale non cristallinLALEHKO, V. A; SHMIDT, T. V.Fizika tverdogo tela. 1989, Vol 31, Num 2, pp 187-192, issn 0367-3294Article

Breakdown of the quantum Hall effect due to electron heatingKOMIYAMA, S; TAKAMASU, T; MIYAMIZU, S et al.Solid state communications. 1985, Vol 54, Num 6, pp 479-484, issn 0038-1098Article

2002 annual report conference on electrical insulation and dielectric phenomena (Cancun, 20-24 October 2002)CEIDP : conference on electrical insulation and dielectric phenomena. 2002, isbn 0-7803-7502-5, XVIII, 991 p, isbn 0-7803-7502-5Conference Proceedings

Production of seed electrons in N2TIOURSI, M; MESSAAD, M; SENOUCI, B et al.IEE conference publication. 1999, pp 3.209.P3-3.211.P3, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Dielectric breakdown in aluminium nitrideRUEMENAPP, T; PEIER, D.IEE conference publication. 1999, pp 4.373.P2-4.376.P2, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Ultra-high-speed photographic observations of discharge development along the ice surfaceFARZANEH, M; BRETTSCHNEIDER, S; SRIVASTAVA, K. D et al.IEE conference publication. 1999, pp 3.297.P3-3.300.P3, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Punchthrough transient voltage suppressor for low-voltage electronicsYA-CHIN KING; BIN YU; POHLMAN, J et al.IEEE electron device letters. 1995, Vol 16, Num 7, pp 303-305, issn 0741-3106Article

Critical switching impulse strength of long air gaps: modelling of air density effectsRIZK, F. A. M.IEEE transactions on power delivery. 1992, Vol 7, Num 3, pp 1507-1515, issn 0885-8977Article

Dielectric characteristics of static shield for coil-end of gas-insulated transformerINUI, A; INOUE, T; TERANISHI, T et al.IEEE transactions on electrical insulation. 1992, Vol 27, Num 3, pp 572-577, issn 0018-9367Conference Paper

Flashover characteristics and surface processes under negative impulse voltage in atmospheric airSHIMAZAKI, T.IEEE transactions on electrical insulation. 1992, Vol 27, Num 3, pp 488-495, issn 0018-9367Conference Paper

ac Degradation of impregnated polypropylene filmsSEBILLOTTE, E; THEOLEYRE, S; SAID, S et al.IEEE transactions on electrical insulation. 1992, Vol 27, Num 3, pp 557-565, issn 0018-9367Conference Paper

n-Channel MOSFET breakdown characteristics and modeling for p-well technologiesBEITMAN, B. A.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 11, pp 1935-1941, issn 0018-9383, 1Article

J×B gun pre-ionization equipment in JFT-2 tokamakMATSUZAKI, Y; TANI, T.Japanese journal of applied physics. 1984, Vol 23, Num 7, pp 941-942, issn 0021-4922, 1Article

Claquage électrique dans l'isolation électrique d'un convertisseur thermo-électrique à vapeurs de césiumBELOUSENKO, A. P; VASIL'CHENKO, A. V; NIKOLAEV, YU. V et al.Teplofizika vysokih temperatur. 1984, Vol 22, Num 5, pp 1031-1033, issn 0040-3644Article

On the behaviour of insulations with interfaces in medium voltage cable accessories-model investigationsLAMBRECHT, J; PILLING, J; BARSCH, R et al.IEE conference publication. 1999, pp 4.14.S17-4.17.S17, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Ectons and their role in electrical discharges in vacuum and gasesMESYATS, G. A.Journal de physique. IV. 1997, Vol 7, Num 4, pp C4.93-C4.112, issn 1155-4339Conference Paper

Analysis of the limiter erosion in T-3M tokamakBARATOV, D. G; DEMYANENKO, V. N; ZELENOV, E. V et al.IEEE transactions on plasma science. 1985, Vol 13, Num 5, pp 331-333, issn 0093-3813Article

Dependence of breakdown voltage on the junction curvature in concentration profiled diodesGHATOL, A. A; SUNDARSINGH, V. P.Microelectronics. 1984, Vol 15, Num 6, pp 5-14, issn 0026-2692Article

Micro-décharges thermostimulées dans le polyéthylène après une application d'une tension électrique à basse températureKERIMOV, M. K; SULEJ MANOV, B. A; GEZALOV, KH. B et al.Žurnal tehničeskoj fiziki. 1984, Vol 54, Num 7, pp 1407-1408, issn 0044-4642Article

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