HOLLOW CONE ILLUMINATION. I: DARK-FIELD ELECTRON MICROSCOPY OF BIOLOGICAL SPECIMENSJOHANSEN BV; NAMORK E; KREKLING T et al.1981; MICRON; ISSN 0047-7206; GBR; DA. 1981; VOL. 12; NO 1; PP. 13-23; BIBL. 2 P.Article

HIGH-RESOLUTION LATTICE IMAGING IN RADIATION SENSITIVE MATERIALSHOWITT DG.1980; J. ULTRASTRUCT. RES.; USA; DA. 1980; VOL. 70; NO 2; PP. 181-185; BIBL. 8 REF.Article

OPTICAL AND DIGITAL SPATIAL FREQUENCY FILTERING OF ELECTRON MICROGRAPHS. II. EXPERIMENTAL RESULTSKUEBLER O; HAHN M; SEREDYNSKI J et al.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 3; PP. 235-256; ABS. GER; BIBL. 18 REF.Article

COMPUTER-ASSISTED DNA LENGTH MEASUREMENTS FROM ELECTRON MICROGRAPHS WITH SPECIAL REFERENCE TO PARTIAL DENATURATION MAPPINGLITTLEWOOD RK; INMAN RB.1982; NUCLEIC ACIDS RES.; ISSN 0305-1048; GBR; DA. 1982; VOL. 10; NO 5; PP. 1691-1706; BIBL. 6 REF.Article

THEORY OF STEREOPSISKING MV.1981; METHODS CELL BIOL.; ISSN 0091-679X; USA; DA. 1981; VOL. 22; PP. 13-32; BIBL. 2 P.Article

CLEARING AND DRYING POLAROID 55 P/N FILM IN CONJUNCTION WITH SCANNING ELECTRON MICROGRAPHYGLAZIER R; BREESE SS JR.1978; J. BIOL. PHOTOGR. ASS.; USA; DA. 1978; VOL. 46; NO 3; PP. 125Article

IMAGE SYNTHESIS FROM ELECTRON MICROGRAPHS TAKEN AT DIFFERENT DEFOCUS.ZEMLIN F.1978; ULTRAMICROSCOPY; NLD; DA. 1978; VOL. 3; NO 2; PP. 261-263; BIBL. 6 REF.Article

A SIMPLE RECORDING DENSITOMETER FOR ELECTRON MICROGRAPHSMARKHAM R; GARNER RT; PARKER EA et al.1978; MICRON; GBR; DA. 1978; VOL. 9; NO 4; PP. 227-236; BIBL. 2 REF.Article

CONVOLUTION RECONSTRUCTION OF FAN BEAM PROJECTIONS.DREIKE P; BOYD DP.1976; COMPUTER GRAPH. IMAGE PROCESSG; U.S.A.; DA. 1976; VOL. 5; NO 4; PP. 459-469; BIBL. 21 REF.Article

ELECTRONMICROSCOPIC MASS DETERMINATION USING PHOTOGRAPHIC ISODENSITY TECHNIQUES.LAMVIK MK.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 3; PP. 187-194; BIBL. 14 REF.Article

CHEMODECTOMA INVOLVING THE CAVERNOUS SINUS AND SEMILUNAR GANGLIONKHANG CHENG HO; MEYER G; GARANCIS J et al.1982; HUMAN PATHOLOGY; ISSN 0046-8177; USA; DA. 1982; VOL. 13; NO 10; PP. 942-943; BIBL. 9 REF.Article

DETECTION OF OBJECTS IN QUANTUM-NOISE-LIMITED IMAGESVAN HEEL M.1982; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 7; NO 4; PP. 331-341; BIBL. 18 REF.Article

SPECIFICITY OF STAIN DISTRIBUTION IN ELECTRON MICROGRAPHS OF PROTEIN MOLECULES CONTRASTED WITH URANYL ACETATESTEVEN AC; NAVIA MA.1982; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1982; VOL. 128; NO 2; PP. 145-155; BIBL. 25 REF.Article

STAGES AND STEREO-PAIR RECORDINGTURNER JN.1981; METHODS CELL BIOL.; ISSN 0091-679X; USA; DA. 1981; VOL. 22; PP. 33-51; BIBL. 36 REF.Article

CLASSIFICATION D'OBJETS DANS DES MICROGRAPHIES ELECTRONIQUES BROUILLEES, AU MOYEN DE L'ANALYSE DES CORRESPONDANCESVAN HEEL M; FRANK J.1981; CAH. ANAL. DONNEES; ISSN 0339-3097; FRA; DA. 1981; VOL. 6; NO 1; PP. 101-107; BIBL. 3 REF.Article

MICROSCOPY IN ELECTRON DIFFRACTION APPARATUSYAMAGUCHI S.1979; REV. SCI. INSTRUM.; USA; DA. 1979; VOL. 50; NO 7; PP. 919-920; BIBL. 1 REF.Article

CALIBRATION OF TRANSMISSION ELECTRON MICROSCOPIC MASS DETERMINATION USING OBJECTS WITH KNOWN MASS DISTRIBUTIONLINDERS PWJ; STOLS ALH; STADHOUDERS AM et al.1983; JOURNAL OF MICROSCOPY (OXFORD); ISSN 0022-2720; GBR; DA. 1983; VOL. 130; NO 1; PP. 85-92; BIBL. 27 REF.Article

QUANTITATIVE METHODS APPLIED TO STEREO IMAGING. IX: THEORYGHOSH SK.1981; METHODS CELL BIOL.; ISSN 0091-679X; USA; DA. 1981; VOL. 22; PP. 155-176; BIBL. 14 REF.Article

DIE HOLOGRAPHISCHEN REKONSTRUKTIONSBEDINGUNGEN BEI NICHTISOPLANATISCHEN ABBILDUNGEN = LES EXIGENCES DE LA RECONSTRUCTION HOLOGRAPHIQUE POUR LA FORMATION D'IMAGE NON ISOPLANETIQUEADE G.1981; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1981; VOL. 58; NO 5; PP. 321-339; ABS. ENG; BIBL. 26 REF.Article

HYBRID IMAGE PROCESSING FOR FEATURE EXTRACTION AND CONSTANT VARIANCE ENHANCEMENTKAWATA S; ICHIOKA Y; SUZUKI T et al.1979; OPT. ACTA; GBR; DA. 1979; VOL. 26; NO 12; PP. 1549-1556; BIBL. 11 REF.Article

PROPOSALS FOR SOLVING THE PHASE RETRIEVAL PROBLEM FOR SEMI-WEAK OBJECTS FROM NOISY ELECTRON MICROGRAPHSVAN TOORN P; HUISER AMJ; FERWERDA HA et al.1978; OPTIK; DEU; DA. 1978; VOL. 51; NO 3; PP. 309-326; ABS. GER; BIBL. 11 REF.Article

A SIMPLE TECHNIQUE OF POTENTIAL DISTRIBUTION MAPPING IN A SCANNING ELECTRON MICROSCOPE.DYUKOV V; KOLOMEYTSEV M; NEPIJKO S et al.1978; MICR. ACTA; DEU; DA. 1978; VOL. 80; NO 5; PP. 367-374; ABS. GER; BIBL. 8 REF.Article

DIFFRACTOMETRE POUR L'ANALYSE ET LA CORRECTION DES IMAGES DE MICROSCOPIE ELECTRONIQUEAGEEV EV; ANASKIN IF; STOYANOV PA et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 1; PP. 236-239; BIBL. 4 REF.Article

DAS INVERSE PROBLEM IN DER ELEKTRONENMIKROSKOPIE BEI PARTIELL KOKAERENTER BELEUCHTUNG = LE PROBLEME INVERSE EN MICROSCOPIE ELECTRONIQUE CONVENTIONNELLE AVEC UN ECLAIRAGE PARTIELLEMENT COHERENTPULVERMACHER H.1981; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1981; VOL. 58; NO 4; PP. 259-266; ABS. ENG; BIBL. 10 REF.Article

DER TRANSMISSIONS-KREUZ-KOEFFIZIENT FUER DIE ELEKTRONENMIKROSKOPISCHE ABBILDUNG BEI PARTIELL KOLAERENTER BELEUCHTUNG UND ELEKTRISCHER INSTABILITAET = COEFFICIENT DE TRANSMISSION POUR LA FORMATION D'IMAGE EN MICROSCOPIE ELECTRONIQUE AVEC ECLAIRAGE EN LUMIERE PARTIELLEMENT COHERENTE ET INSTABILITE ELECTRIQUEPULVERMACHER H.1981; OPTIK (STUTTGART); ISSN 0030-4026; DEU; DA. 1981; VOL. 60; NO 1; PP. 45-60; ABS. ENG; BIBL. 4 REF.Article