Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("ELECTRON PROBE")

Filter

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Origin

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 8784

  • Page / 352

Export

Selection :

  • and

QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF BIOLOGICAL THIN SECTIONS: METHODS AND VALIDITY.SHUMAN H; SOMLYO AV; SOMLYO AP et al.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 4; PP. 317-339; BIBL. 48 REF.Article

MISE EN EVIDENCE PAR MICROSONDE ELECTRONIQUE DE L'INHOMOGENEITE DE LA COMPOSITION DE REVETEMENTS GALVANIQUES D'OR.CHOLLET L; BEGUIN J.1975; BULL. ANNU. SOC. SUISSE CHRONOM. LAB. SUISSE RECH. HORLOG.; SUISSE; DA. 1975; VOL. 7; NO 1; PP. 27-32; BIBL. 2 REF.Article

THE OXIDATION OF CLEAN RUTHENIUM SURFACES. II: ATOM PROBE ANALYSES OF OXIDE FILMSCRANSTOUN GKL; PYKE DR; SMITH GDW et al.1979; APPL. SURF. SCI.; NLD; DA. 1979; VOL. 2; NO 3; PP. 375-381; BIBL. 4 REF.Article

EVOLUTION DES DISPOSITIFS MICROSONDES ELECTRONO-OPTIQUESVASICHEV BN; KABANOV AN; KAFAFOV AA et al.1977; OPT.-MEKH. PROMYSHL.; S.S.S.R.; DA. 1977; VOL. 44; NO 8; PP. 54-62Article

ELEKTRONENSTRAHL PRUEFT ELEKTRISCHE POTENTIALE IN INTEGRIERTEN SCHALTUNGEN = MESURES DES POTENTIELS ELECTRIQUES DANS LES CIRCUITS INTEGRES A L'AIDE D'UNE SONDE ELECTRONIQUEFAZEKAS P.1981; TM, TECH. MESS.; ISSN 0171-8096; DEU; DA. 1981; VOL. 48; NO 1; PP. 29-35; ABS. ENG; BIBL. 12 REF.Article

MIKROANALYTISCHE UNTERSUCHUNGEN DES AUSSCHEIDUNGSVERHALTENS IN KOMMERZIELLEN ALITIER- UND CHROMALITIERSCHUTZSCHICHTEN AUF NICKELBASISLEGIERUNGEN UND AUSTENITISCHEN STAEHLEN. = ETUDES MICROANALYTIQUES DE LA PRECIPITATION DE REVETEMENTS PROTECTEURS ALUMINISES ET CHROME-ALUMINISES SUR DES ALLIAGES A BASE DE NICKEL ET DES ACIERS INOXYDABLESFITZER E; MAURER HJ.1977; Z. WERKST.-TECH.; DTSCH.; DA. 1977; VOL. 8; NO 4; PP. 112-119; ABS. ANGL.; BIBL. 23 REF.Article

ELECTRON COLLECTION BY BLUNT PROBES IN THE LOWER IONOSPHEREYORK TM; WU CI; LAI TWK et al.1980; AIAA J.; ISSN 0001-1452; USA; DA. 1980; VOL. 18; NO 7; PP. 808-816; BIBL. 26 REF.Article

QUANTITATIVE ANALYSE VON OXIDEN MIT DER ELEKTRONENSTRAHL-MIKROSONDE = ANALYSE QUANTITATIVE DES OXYDES AVEC LA MICROSONDE ELECTRONIQUEWEISWEILER W.1978; ARCH. EISENHUETTENWES.; DEU; DA. 1978; VOL. 49; NO 12; PP. 555-562; ABS. ENG/FRE; BIBL. 49 REF.Article

SURFACE CHARACTERIZATION BY ELECTRON MICROPROBE.STEWART IM.1977; IN: CHARACT. MET. POLYM. SURF. SYMP. ADV. CHARACT. MET. POLYM. SURF.; NEW YORK; 1976; NEW YORK; ACADEMIC PRESS; DA. 1977; VOL. 2; PP. 127-132; BIBL. 6 REF.Conference Paper

SELF-CONSISTENT DESCRIPTION OF NUCLEAR EXCITATIONSNGUYEN VAN GIAI.1982; ; FRA; DA. 1982; IPNO-TH/82-21; 13 P.-7 PL.; 30 CM; BIBL. 17 REF.Report

BESTIMMUNG VON PN-UEBERGANSTIEFEN MIT HILFE EINER ELEKTRONENSONDE. = DETERMINATION DES PROFONDEURS DE JONCTIONS PN AU MOYEN D'UNE SONDE ELECTRONIQUEBACH K; KAISER N; MUHLE R et al.1977; EXPER. TECH. PHYS.; DTSCH.; DA. 1977; VOL. 25; NO 3; PP. 205-211; ABS. ANGL.; BIBL. 21 REF.Article

NEW EVIDENCE FOR DEEP-LYING HOLE STRENGTH IN 115SN AND 207PB VIA THE (3HE, ALPHA ) REACTION AT 283 MEVLANGEVIN JOLIOT H; GERLIC E; GUILLOT J et al.sd; FRA; DA. S.D.; IPNO-DRE/82-10; 6 P.-7 PL.; 30 CM; BIBL. 16 REF.Report

QBETA MEASUREMENTS AND MASS EXCESS VALUES FOR NEUTRON DEFICIENT ISOTOPES NEAR N EQUIV. A Z EQUIV. A 40:1. STRONTIUM, YTTRIUM AND ZIRCONIUM ISOTOPESDELLA NEGRA S; GAUVIN H; JACQUET D et al.sd; FRA; DA. S.D.; IPNO-DRE/82-19; 21 P.-16 PL.; 30 CM; BIBL. 24 REF.Report

TASTKOEPFE FUER OSZILLOGRAFEN = SONDES POUR OSCILLOGRAPHESKUHNE E; KUHNE H.1982; RADIO FERNS. ELEKTRON.; ISSN 0033-7900; DDR; DA. 1982; VOL. 31; NO 4; PP. 252-253Article

SYSTEME DE DEVIATION POUR L'AJUSTAGE ET LE BALAYAGE DES FAISCEAUX ELECTRONIQUESRYBAKOV YU L; VASICHEV BN.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 5; PP. 193-196; BIBL. 12 REF.Article

MISE EN EVIDENCE PAR MICROSONDE ELECTRONIQUE DE L'INHOMOGENEITE DE LA COMPOSITION DE REVETEMENTS GALVANIQUES D'OR.CHOUET L; BEGUIN J.1976; OBERFLAECHE-SURF.; SCHWEIZ; DA. 1976; VOL. 17; NO 8; PP. 168-172; ABS. ALLEM.; BIBL. 2 REF.Article

ELECTRON MICROSCOPIC MICROPROBE ANALYSIS OF MINERALIZED COLLAGEN FIBRILS AND EXTRACOLLAGENOUS REGIONS IN TURKEY LEG TENDON.HOHLING HJ; BARCKHAUS RH; KREFTING ER et al.1976; CELL TISSUE RES.; GERM.; DA. 1976; VOL. 175; NO 3; PP. 345-350; BIBL. 1 P.Article

ESTIMATION OF SURFACE LABELLING ON WHOLE CRITICAL POINT DRIED, CELLS BY MICROPROBE ANALYSIS IN THE SCANNING ELECTRON MICROSCOPEAP GWYNN I.1981; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1981; VOL. 121; NO 3; PP. 329-336; BIBL. 18 REF.Article

DEVELOPMENT OF A FULLY AUTOMATIC CONTROL SYSTEM FOR A X-RAY MICROANALYSERABE T; MORIMOTO K; SUZUKI K et al.1979; KAWASAKI SEITETSU GIHO; ISSN 0368-7236; JPN; DA. 1979; VOL. 11; NO 3; PP. 356-374; ABS. ENG; BIBL. 15 REF.Article

NANOSECOND PASSIVE VOLTAGE PROBES.MCGOVERN PA.1977; I.E.E.E. TRANS. INSTRUMENT. MEASUR.; U.S.A.; DA. 1977; VOL. 26; NO 1; PP. 46-52; BIBL. 7 REF.Article

ANALISE DE INCLUSOES TIPO OXIDO POR MICROSSONDA ELECTRONICA. = ANALYSE DES INCLUSIONS DE TYPE OXYDE A LA MICROSONDE ELECTRIQUEJOSE MUNDIM M; AUGUSTO COUTINHO C.1976; METALLURGIA; BRAS.; DA. 1976; VOL. 32; NO 226; PP. 597-601; BIBL. 11 REF.Article

MAPPING OF THE ONSET OF A NEW REGION OF DEFORMATION: THE MASSES OF 31MG AND 32MGDETRAZ C; LANGEVIN M; GOFFRIKOUASSI MC et al.sd; FRA; DA. S.D.; IPNO-DRE/82-14; 11 P.-2 PL.; 30 CM; BIBL. 20 REF.Report

QUANTUM FLUCTUATIONS IN THE BAG AND NUCLEON OBSERVABLESMAXWELL OV; VENTO V.1982; ; FRA; DA. 1982; IPNO-TH/82-11; 70 P.-5 PL.; 30 CMReport

TEMPERATURE DEPENDENCE OF NUCLEAR SURFACE PROPERTIESCAMPI X; STRINGARI S.1982; ; FRA; DA. 1982; IPNO-TH/82-20; 11 P.; 30 CM; BIBL. 23 REF.Report

INVESTIGATION OF THE IMPURITY PROFILES BY MEANS OF THE SCANNING ELECTRON MICROPROBE (SEM)OELGART G; WAGNER G.1980; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1980; VOL. 59; NO 1; PP. 43-50; ABS. GER; BIBL. 8 REF.Article

  • Page / 352