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DETERMINATION OF THE THICKNESS OF A COVERING LAYER ON A SOLID BY AUGER AND ELECTRON ENERGY-LOSS SPECTRA WITHOUT A STANDARD SAMPLE = DETERMINATION DE L'EPAISSEUR D'UN REVETEMENT PAR SPECTROMETRIE AUGER ET SPECTROMETRIE ELECTRONIQUE SANS UTILISATION D'UN STANDARDOKU M; SUZUKI S; ABIKO K et al.1981; J. ELECTRON SPECTROSC. RELAT. PHENOM.; ISSN 0368-2048; NLD; DA. 1981; VOL. 23; NO 2-3; PP. 147-156; BIBL. 17 REF.Article

AN AUGER ANALYSIS OF THE SIO2-SI INTERFACE.JOHANNESSEN JS; SPICER WE; STRAUSSER YE et al.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 7; PP. 3028-3037; BIBL. 35 REF.Article

RETRACTABLE, REAR VIEWING LOW ENERGY ELECTRON DIFFRACTION/AUGER SPECTROSCOPY SYSTEMWENDELKEN JF; WITHROW SP; HERRELL PS et al.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 2; PP. 255-258; BIBL. 3 REF.Article

A COMPUTER CONTROLLED INVESTIGATION OF THE ELECTRON ENERGY SPECTRA FORMED UNDER ELECTRON BOMBARDMENT DURING THE EARLY STAGES OF THE OXIDATION OF IRON = ETUDE CONTROLEE PAR ORDINATEUR DU SPECTRE D'ENERGIE D'ELECTRONS FORME PAR BOMBARDEMENT ELECTRONIQUE AU COURS DES PREMIERES ETAPES DE L'OXYDATION DU FERFERGUSON IF; RILEY BF; SOPIZET R et al.1983; VIDE, LES COUCHES MINCES; ISSN 0223-4335; FRA; DA. 1983; VOL. 38; NO 217; PP. 295-300; ABS. FRE; BIBL. 8 REF.Article

A NEW SCATTERING MECHANISM FOR EELSSCHAICH WL.1983; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1983; VOL. 127; NO 3; PP. L145-L148; BIBL. 9 REF.Article

PRACTICAL APPLICATIONS OF SURFACE ANALYTIC TOOLS IN TRIBOLOGYFERRANTE J.1982; LUBR. ENG.; ISSN 0024-7154; USA; DA. 1982; VOL. 38; NO 4; PP. 223-236; BIBL. DISSEM.Article

MICROCOMPUTER-AIDED AUGER ELECTRON SPECTROSCOPYNAKANISHI S; FUKUOKA N; HORIGUCHI T et al.1981; BULL. UNIV. OSAKA PREFECT. SER. A; ISSN 501018; JPN; DA. 1981; VOL. 30; NO 2; PP. 115-124; BIBL. 9 REF.Article

EIN EINFACHES UHV-TRANSMISSIONS-RASTER-AUGERELEKTRONEN-MIKROSKOP. = UN MICROSCOPE PAR TRANSMISSION A BALAYAGE A ELECTRONS AUGER SOUS ULTRAVIDEWIEDMANN P; SEILER H.1977; OPTIK; DTSCH.; DA. 1977; VOL. 49; NO 3; PP. 295-300; ABS. ANGL.; BIBL. 15 REF.Article

AUGER DEPTH PROFILING OF INTERFACES IN MOS AND MNOS STRUCTURES.JOHANNESSEN JS; SPICER WE.1976; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1976; VOL. 13; NO 4; PP. 849-855; BIBL. 24 REF.; (PHYS. COMPD. SEMICOND. INTERFACES. ANNU. CONF. 3. PROC.; SAN DIEGO, CALIF.; 1976)Conference Paper

INVESTIGATION OF VAPOR ADSORPTION ON MOLYBDENUM DISULFIDE SURFACES BY AUGER ELECTRON SPECTROSCOPYMATSUNAGA M; HOMMA T; TANAKA A et al.1982; ASLE TRANS.; ISSN 0569-8197; USA; DA. 1982; VOL. 25; NO 3; PP. 323-328; BIBL. 9 REF.Article

PRIMARY ELECTRON BEAM CURRENT REGULATOR FOR PULSE-COUNTING AUGER ELECTRON SPECTROSCOPYWOODWARD WS; GRIFFIS DP; LINTON RW et al.1982; ANAL. CHEM. (WASH.); ISSN 0003-2700; USA; DA. 1982; VOL. 54; NO 7; PP. 1229-1231; BIBL. 7 REF.Article

ENHANCED LOW-ENERGY DETECTABILITY IN AUGER SPECTROSCOPYAVERY NR; LEE JB; SPINK JA et al.1980; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1980; VOL. 13; NO 1; PP. 30-31; BIBL. 5 REF.Article

SOLID FORMATION IN AU: GE/NI, AG/IN/GE, IN/AU: GE, GAAS OHMIC CONTACT SYSTEMSCHRISTOU A.1979; SOLID-STATE ELECTRON.; GBR; DA. 1979; VOL. 22; NO 2; PP. 141-149; BIBL. 10 REF.Article

ETUDE DE SURFACE DES COMPOSES II-VIEBINA A; TAKAAASHI T.1977; OYO BUTURI; JAP.; DA. 1977; VOL. 46; NO 7; PP. 744-749; BIBL. 22 REF.Article

SPECTROSCOPIE D'EMISSION SECONDAIRE DE LA SURFACE D'UN SOLIDE REVUE)GOMOYUNOVA MV.1976; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1976; VOL. 46; NO 6; PP. 1137-1170; BIBL. 7 P.Article

AUGER ELECTRON SPECTROSCOPY OF CU2S-CDS HETEROJUNCTION INTERFACEMORIMOTO J.1980; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1980; VOL. 19; NO 6; PP. L296-L298; BIBL. 14 REF.Article

MISE AU POINT D'UN ANALYSEUR HEMISPHERIQUE POUR L'ETUDE DES ELECTRONS DE BASSE ENERGIE.BUI MINH DUC.1978; ; S.L.; DA. 1978; PP. 1-123; BIBL. 3 P.; (THESE DOCT. ING.; CLAUDE-BERNARD LYON I)Thesis

PROBING AND IMAGING TECHNIQUES FOR SURFACE STUDIESCASTAING R.1980; MATER. SCI. ENG.; CHE; DA. 1980; VOL. 42; NO 1/2; PP. 13-22; BIBL. 13 REF.Conference Paper

STRUCTURE OF TUNNEL BARRIER OXIDE FOR PB-ALLOY JOSEPHSON JUNCTIONSBAKER JM; KIRCHER CJ; MATTHEWS JW et al.1980; I.B.M. J. RES. DEVELOP.; USA; DA. 1980; VOL. 24; NO 2; PP. 223-234; BIBL. 32 REF.Article

ELECTRON SPECTROSCOPY FOR BULK AND SURFACE MICROSCOPY AND MICROANALYSISCAZAUX J.1980; MATER. SCI. ENG.; CHE; DA. 1980; VOL. 42; NO 1/2; PP. 45-48; BIBL. 7 REF.Conference Paper

MICROHARDNESS AND ELECTRICAL RESISTIVITY OF AU/TIC MULTILAYER STRUCTURES PREPARED BY RF SPUTTERINGNATH P; SUNDGREN JE; ANDERSSON B et al.1979; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1979; VOL. 12; NO 9; PP. 1597-1600; BIBL. 9 REF.Article

ELECTRON AND ION SPECTROSCOPIC STUDIES OF THE PASSIVE FILM ON IRON-CHROMIUM ALLAYS = ETUDES PAR SPECTROMETRIE IONIQUE ET ELECTRONIQUE DES FILMS PASSIFS FORMES SUR LES ALLIAGES FE-CRTJONG SC; HOFFMAN RW; YEAGER EB et al.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 8; PP. 1662-1668; BIBL. 18 REF.Article

ON SELF-DECONVOLUTIONS IN AUGER SPECTROSCOPYBARTOS I; MACA F.1981; PHYS. STATUS SOLIDI (B), BASIC RES.; DDR; DA. 1981-10; VOL. 107; NO 2; PP. 513-519; BIBL. 9 REF.Article

ELECTROPOLISHING OF TITANIUM IN PERCHLORIC ACID-ACETIC ACID SOLUTION. I: AUGER ELECTRON SPECTROSCOPY STUDY OF ANODIC FILMSMATHIEU JB; MATHIEU HJ; LANDOLT D et al.1978; J. ELECTROCHEM. SOC.; USA; DA. 1978; VOL. 125; NO 7; PP. 1039-1043; BIBL. 14 REF.Article

THE STEP COVERAGE OF UNDOPED AND PHOSPHORUS-DOPED SIO2 GLASS FILMSLEVIN RM; EVANS LUTTERODT K.1983; JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B: MICROELECTRONICS PROCESSING AND PHENOMENA; ISSN 512982; USA; DA. 1983; VOL. 1; NO 1; PP. 54-61; BIBL. 41 REF.Article

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