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CALCUL DU FLUX LUMINEUX SORTANT D'UN ELLIPSOMETRE PHOTOMETRIQUE A MODULATION DE PHASE ET D'AZIMUTCHAO F; COSTA M.1981; J. CHIM. PHYS. PHYSICOCHIM. BIOL.; ISSN 0021-7689; FRA; DA. 1981; VOL. 78; NO 5; PP. 411-419; ABS. ENG; BIBL. 8 REF.Article

MEASUREMENT OF THE JONES MATRIX OF AN OPTICAL SYSTEM BY RETURN-PATH NULL ELLIPSOMETRYAZZAM RMA.1981; OPT. ACTA; ISSN 0030-3909; GBR; DA. 1981; VOL. 28; NO 6; PP. 795-800; ABS. FRE/GER; BIBL. 10 REF.Article

MESURE DES CONSTANTES OPTIQUES DES LIMITES DE SEPARATION DE DEUX MILIEUXARTAMONOV OM; ASALKHANOV YU I.1973; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1973; NO 1; PP. 198-201; BIBL. 7 REF.Serial Issue

THE FIXED-POLARIZER NULLING SCHEME IN GENERALIZED ELLIPSOMETRYAZZAM RMA; BUNDY TL; BASHARA NM et al.1973; OPTICS COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 2; PP. 110-115; BIBL. 6 REF.Serial Issue

ELLIPSOMETRIC STUDY OF THE FORMATION OF FILMS ON IRON IN SODIUM ARSENATE SOLUTIONSZKLARSKA SMIALOWSKA Z.1975; CORROS. SCI.; G.B.; DA. 1975; VOL. 15; NO 11-12; PP. 741-749; BIBL. 8 REF.Article

SERVODRIVEN ANGULAR SETTING OF A POLARIZERVERKUYL JAG; LENGKEEK HP; WINSEMIUS P et al.1973; J. PHYS. E.; G.B.; DA. 1973; VOL. 6; NO 4; PP. 322-324; BIBL. 1 REF.Serial Issue

High spatial resolution ellipsometer for characterization of epitaxial grapheneGASKELL, Peter E; SKULASON, Helgi S; STRUPINSKI, Wlodek et al.Optics letters. 2010, Vol 35, Num 20, pp 3336-3338, issn 0146-9592, 3 p.Article

HYBRID NULL-PHOTOMETRIC ELLIPSOMETER USING SINUSOIDAL OPTICAL ROTATION.AZZAM RMA.1977; OPTIK; DTSCH.; DA. 1977; VOL. 48; NO 3; PP. 279-288; ABS. ALLEM.; BIBL. 11 REF.Article

A PRECISION ELLIPSOMETER WITHOUT EMPLOYING A COMPENSATOR.YAMAMOTO M.1975; JAP. J. APPL. PHYS.; JAP.; DA. 1975; VOL. 14; SUPPL. NO 1; PP. 413-417; BIBL. 12 REF.; (OPT. METH. SCI. IND. MEAS. PROC. INT. COMM. OPT. CONF.; TOKYO; 1974)Conference Paper

PROPOSAL FOR A FAST, HIGH-SENSITIVITY ELLIPSOMETER FOR PLASMA POLARIMETRYSEGRE SE.1982; J. OPT. SOC. AM. (1930); ISSN 0030-3941; USA; DA. 1982; VOL. 72; NO 1; PP. 167-168; BIBL. 10 REF.Article

OSCILLATING-ANALYZER ELLIPSOMETER.AZZAM RMA.1976; REV. SCI. INSTRUM.; U.S.A.; DA. 1976; VOL. 47; NO 5; PP. 624-628; BIBL. 28 REF.Article

EXPRESSION GENERALE CONCERNANT L'INTENSITE DU FAISCEAU DE LUMIERE A LA SORTIE D'UN ELLIPSOMETRE IDEALSVITASHEV KK; FILATOVA ES.1976; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1976; VOL. 40; NO 6; PP. 1064-1068; BIBL. 6 REF.Article

TUNING A BABINET-SOLEIL COMPENSATOR FOR EXACT QUARTER WAVE RETARDATION IN AN ELLIPSOMETER.AZZAM RMA; KRUEGER JA.1975; J. PHYS. E; G.B.; DA. 1975; VOL. 8; NO 6; PP. 445-446; BIBL. 3 REF.Article

FAST SELF-COMPENSATING ELLIPSOMETER.MATHIEU HJ; MCCLURE DE; MULLER RH et al.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 6; PP. 798-802; BIBL. 22 REF.Article

CONCEPTION, REALISATION ET FONCTIONNEMENT D'UN NOUVEL ELLIPSOMETREMONIN J; BOUTRY GA.1973; NOUV. REV. OPT.; FR.; DA. 1973; VOL. 4; NO 3; PP. 159-169; ABS. ANGL.; BIBL. 30 REF.Serial Issue

RETURN-PATH ELLIPSOMETRY AND A NOVEL NORMAL-INDICENCE NULL ELLIPSOMETER (NINE).AZZAM RMA.1977; OPT. ACTA; G.B.; DA. 1977; VOL. 24; NO 10; PP. 1039-1049; BIBL. 8 REF.Article

ALTERNATE ARRANGEMENT AND ANALYSIS OF SYSTEMATIC ERRORS FOR DYNAMIC PHOTOMETRIC ELLIPSOMETERS EMPLOYING AN OSCILLATING-PHASE RETARDER.AZZAM RMA.1976; OPTIK; DTSCH.; DA. 1976; VOL. 45; NO 3; PP. 209-218; ABS. ALLEM.; BIBL. 2 REF.Article

ELLIPSOMETER NULLING: COUPLING AND SETTING UNCERTAINTYKOTHIYAL MP.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 7; PP. 1019-1024; BIBL. 7 REF.Article

MODIFIED O'BRYAN ELLIPSOMETER (MOE) FOR FILM-SUBSTRATE SYSTEMSZAGHLOUL ARM.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 1; PP. 1-3; BIBL. 5 REF.Article

ELLIPSOMETER NULLING: CONVERGENCE AND SPEED.CONFER DL; AZZAM RMA; BASHARA NM et al.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 10; PP. 2568-2575; BIBL. DISSEM.Article

ELLIPSOMETRY WITH FIXED ANALYZER.KOTHIYAL MP.1975; OPTIK; DTSCH.; DA. 1975; VOL. 42; NO 1; PP. 103-105; ABS. ALLEM.; BIBL. 4 REF.Article

Fourier analysis for rotating-element ellipsometersYONG JAI CHO; CHEGAL, Won; HYUN MO CHO et al.Optics letters. 2011, Vol 36, Num 2, pp 118-120, issn 0146-9592, 3 p.Article

HIGH PRECISION ALIGNMENT PROCEDURE FOR AN ELLIPSOMETER.ZEIDLER JR; KOHLES RB; BASHARA NM et al.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 5; PP. 1115-1120; BIBL. 20 REF.Article

PERFORMANCE TESTS FOR AUTOMATIC ELLIPSOMETERS.MULLER RH; MATHIEU HJ.1974; APPL. OPT.; U.S.A.; DA. 1974; VOL. 13; NO 10; PP. 2222-2227; BIBL. 13 REF.Article

A DIFFERENTIAL ELLIPSOMETER.TREU JI.1974; REV. SCI. INSTRUM.; U.S.A.; DA. 1974; VOL. 45; NO 11; PP. 1464-1465; BIBL. 4 REF.Article

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