ELLIPSOMETRIE AVEC UN FAISCEAU DE LUMIERE CONVERGENTSVITASHEV KK; SEMENENKO AI; SEMENENKO LV et al.1973; OPT. I SPEKTROSK.; S.S.S.R.; DA. 1973; VOL. 34; NO 5; PP. 941-946; BIBL. 2 REF.Serial Issue

REALISATION ET MISE EN OEUVRE D'UN ELLIPSOMETRE DYNAMIQUE = PREPARATION AND USE OF A DYNAMIC ELLIPSOMETERFERRE MICHEL.1979; ; FRA; DA. 1979; 185 P.; 30 CM; BIBL. 27 REF.; TH. DOCT.-ING./TOULOUSE 3/1979/666Thesis

AUTOMATED LASER INTERFEROMETRIC ELLIPSOMETRY AND PRECISION REFLECTOMETRYHAZEBROEK HF; VISSER WM.1983; JOURNAL OF PHYSICS E: SCIENTIFIC INSTRUMENTS; ISSN 0022-3735; GBR; DA. 1983; VOL. 16; NO 7; PP. 654-661; BIBL. 5 REF.Article

CRITICAL ASSESSMENT AND MODIFICATION OF ROBINSON'S METHOD FOR THE ELLIPSOMETRIC INVESTIGATION OF THIN FILM MATERIALSKRUMME JP; HABERKAMP J.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 335-339; BIBL. 9 REF.Serial Issue

THE FIXED-POLARIZER NULLING SCHEME IN GENERALIZED ELLIPSOMETRYAZZAM RMA; BUNDY TL; BASHARA NM et al.1973; OPTICS COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 2; PP. 110-115; BIBL. 6 REF.Serial Issue

MEASUREMENT OF THE GROWTH OF SUB-MICROSCOPIC FATIGUE CRACKS BY ELLIPSOMETRYSMITH T.1974; SURF. SCI.; NETHERL.; DA. 1974; VOL. 45; NO 1; PP. 117-127; BIBL. 11 REF.Article

CHOICE OF CRITERIA FOR ELLIPSOMETRIC DETERMINATIONS ON THIN FILMSCAMAGNI P; MANARA A.1972; THIN SOLID FILMS; NETHERL.; DA. 1972; VOL. 13; NO 2; PP. 341-350; BIBL. 14 REF.Serial Issue

INTERNAL REFLECTION ELLIPSOMETRY FOR METAL DEPOSITSCHAN EC; MARTON JP.1972; J. APPL. PHYS.; U.S.A.; DA. 1972; VOL. 43; NO 10; PP. 4027-4030; BIBL. 11 REF.Serial Issue

ELLIPSOMETRIC MEASUREMENTS OF THE BARRIER LAYER IN COMPOSITE ALUMINUM OXIDE FILMS.DYER CK; ALWITT RS.1978; ELECTROCHIM. ACTA; G.B.; DA. 1978; VOL. 23; NO 4; PP. 347-354; BIBL. 22 REF.Article

THE ANODIC OXIDATION OF IRON: OVERPOTENTIAL ANALYSIS FOR A TWO-PHASE FILM.ORD JL; DE SMET DJ.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 12; PP. 1876-1882; BIBL. 29 REF.Article

USE OF AN ADP FOUR-CRYSTAL ELECTROOPTIC MODULATOR IN ELLIPSOMETRYMORITANI A; OKUDA Y; NAKAI J et al.1983; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1983; VOL. 22; NO 9; PP. 1329-1336; BIBL. 21 REF.Article

ETUDE ELLIPSOMETRIQUE DE L'OXYDATION DU TITANEAKIMOV AG; ANDREEVA NP; ROZENFEL'D IL et al.1978; ELEKTROKHIMIJA; SUN; DA. 1978; VOL. 14; NO 9; PP. 1391-1393; BIBL. 8 REF.Article

CALCULATION OF THE ELLIPSOMETRIC PARAMETERS CHARACTERIZING A RANDOMLY ROUGH SURFACE BY MEANS OF THE STRATTON-CHU-SILVER INTEGRALOHLIDAL I; LUKES F.1973; OPT. COMMUNIC.; NETHERL.; DA. 1973; VOL. 7; NO 1; PP. 76-79; BIBL. 8 REF.Serial Issue

PRINCIPAL ANGLE SPECTROSCOPIC ELLIPSOMETRY UTILIZING A ROTATING ANALYZERCHANDLER HOROWITZ D; CANDELA GA.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 16; PP. 2972-2977; BIBL. 15 REF.Article

Proper choice of the error function in modeling spectroellipsometric dataKIM, S. Y; VEDAM, K.Applied optics. 1986, Vol 25, Num 12, pp 2013-2021, issn 0003-6935Article

A bounded-error approach to accuracy analysis in ellipsometrySMIT, M. K; VERHOOF, J. W.Mathematics and computers in simulation. 1990, Vol 32, Num 5-6, pp 545-551, issn 0378-4754Article

Double-search algorithm applied to ellipsometric dataBOCA, I; IOVAN, S.Revue roumaine des sciences techniques. Electrotechnique et énergétique. 1989, Vol 34, Num 1, pp 105-114, issn 0035-4066, 10 p.Article

Ellipsometry with low quality polarizersSTETIU, P.Surface science. 1983, Vol 135, Num 1-3, pp 276-283, issn 0039-6028Article

Protein adsorption on solid-liquid interfaces monitored by laser-ellipsometrySEITZ, R; BRINGS, R; GEIGER, R et al.Applied surface science. 2005, Vol 252, Num 1, pp 154-157, issn 0169-4332, 4 p.Conference Paper

Effect of annealing on composition, structure and optical properties of SrHfON thin filmsFENG, Li-Ping; WANG, Yin-Quan; HAO TIAN et al.Applied surface science. 2012, Vol 258, Num 24, pp 9706-9710, issn 0169-4332, 5 p.Article

Repeatability of ellipsometric data in cholera toxin G_M1-ELISA structuresCASTRO, Leon G; THOMPSON, Daniel W; TIWALD, Thomas et al.Surface science. 2007, Vol 601, Num 8, pp 1795-1803, issn 0039-6028, 9 p.Article

ELLIPSOMETRIC ANALYSES OF CHANGES IN SURFACE OXIDE FILMS ON NB DURING CATHODIC AND ANODIC POLARISATIONMATSUDA S; SUGIMOTO K.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 2; PP. 203-209; ABS. ENG; BIBL. 17 REF.Article

HYBRID NULL-PHOTOMETRIC ELLIPSOMETER USING SINUSOIDAL OPTICAL ROTATION.AZZAM RMA.1977; OPTIK; DTSCH.; DA. 1977; VOL. 48; NO 3; PP. 279-288; ABS. ALLEM.; BIBL. 11 REF.Article

THE CREEP OF OIL ON STEEL FOLLOWED BY ELLIPSOMETRY = ETUDE PAR LA METHODE ELLIPSOMETRIQUE DU CHEMINEMENT DE L'HUILE SUR L'ACIERMEYER F; LOYEN CJ.1975; WEAR; NETHERL.; DA. 1975; VOL. 33; NO 2; PP. 317-323; BIBL. 6 REF.Article

A PRECISION ELLIPSOMETER WITHOUT EMPLOYING A COMPENSATOR.YAMAMOTO M.1975; JAP. J. APPL. PHYS.; JAP.; DA. 1975; VOL. 14; SUPPL. NO 1; PP. 413-417; BIBL. 12 REF.; (OPT. METH. SCI. IND. MEAS. PROC. INT. COMM. OPT. CONF.; TOKYO; 1974)Conference Paper