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RU ELECTRODE ELLIPSOMETRYVELIKODNYJ LN; SHEPELIN VA; KASATKIN EH V et al.1982; ELEKTROHIMIJA; ISSN 0424-8570; SUN; DA. 1982; VOL. 18; NO 9; PP. 1275-1280; BIBL. 11 REF.Article

ETUDE ELLIPSOMETRIQUE DE COUCHES D'OXYDES SUR DE L'ALUMINIUM ET SUR DES ALLIAGES ALUMINIUM-MAGNESIUMGOPIENKO VG; GRISHIN LG; LITVINOV VF et al.1977; FIZIKO-KHIMICHESKIE ISSLEDOVANIYA V TEKHNOLOGICHESKIKH PROTSESSAKH; MEZHVUZOVSKIJ SBORNIK; SUN; LENINGRAD: LENINGRADSKIJ POLITEKH. INST.; DA. 1977; PP. 3-9; BIBL. 6 REF.Book Chapter

ELLIPSOMETRIC MEASUREMENTS OF THE BARRIER LAYER IN COMPOSITE ALUMINUM OXIDE FILMS.DYER CK; ALWITT RS.1978; ELECTROCHIM. ACTA; G.B.; DA. 1978; VOL. 23; NO 4; PP. 347-354; BIBL. 22 REF.Article

THE ANODIC OXIDATION OF IRON: OVERPOTENTIAL ANALYSIS FOR A TWO-PHASE FILM.ORD JL; DE SMET DJ.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 12; PP. 1876-1882; BIBL. 29 REF.Article

QUELQUES ASPECTS DE L'ADOPTION DE LA METHODE ELLIPSOMETRIQUE A L'ETUDE DES PROCESSUS DE CORROSIONMOISIL D; ANGHELESCU D; MITAN D et al.1978; REV. CHIM.; ROMAN.; DA. 1978; VOL. 29; NO 1; PP. 63-66; ABS. ANGL.; BIBL. 9 REF.Article

USE OF AN ADP FOUR-CRYSTAL ELECTROOPTIC MODULATOR IN ELLIPSOMETRYMORITANI A; OKUDA Y; NAKAI J et al.1983; APPLIED OPTICS; ISSN 0003-6935; USA; DA. 1983; VOL. 22; NO 9; PP. 1329-1336; BIBL. 21 REF.Article

ETUDE ELLIPSOMETRIQUE DE L'OXYDATION DU TITANEAKIMOV AG; ANDREEVA NP; ROZENFEL'D IL et al.1978; ELEKTROKHIMIJA; SUN; DA. 1978; VOL. 14; NO 9; PP. 1391-1393; BIBL. 8 REF.Article

Improvement in accuracy of spectroscopic ir ellipsometry by the use of ir retardersRÖSELER, A; MOLGEDEY, W.Infrared physics. 1984, Vol 24, Num 1, pp 1-5, issn 0020-0891Article

Eine Anordnung zur spektrophotometrischen Ellipsometrie = Un montage pour l'ellipsométrie spectrophotométrique = A mounting for spectrophotometric ellipsometryABRAHAM, M; MAHMOUDI, A; TADJEDDINE, A et al.Experimentelle Technik der Physik. 1984, Vol 32, Num 5, pp 405-412, issn 0014-4924Article

Proper choice of the error function in modeling spectroellipsometric dataKIM, S. Y; VEDAM, K.Applied optics. 1986, Vol 25, Num 12, pp 2013-2021, issn 0003-6935Article

ELLIPSOMETRIC ANALYSES OF CHANGES IN SURFACE OXIDE FILMS ON NB DURING CATHODIC AND ANODIC POLARISATIONMATSUDA S; SUGIMOTO K.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 2; PP. 203-209; ABS. ENG; BIBL. 17 REF.Article

HYBRID NULL-PHOTOMETRIC ELLIPSOMETER USING SINUSOIDAL OPTICAL ROTATION.AZZAM RMA.1977; OPTIK; DTSCH.; DA. 1977; VOL. 48; NO 3; PP. 279-288; ABS. ALLEM.; BIBL. 11 REF.Article

CHARACTERIZATION OF SI SURFACE BY ELLIPSOMETRYOHIRA F; ITAKURA M.1979; BULL. JAP. SOC. PRECIS. ENGNG; JPN; DA. 1979; VOL. 13; NO 3; PP. 152-154Article

AN ELLIPSOMETRIC STUDY OF THIN FILMS FORMED ON COPPER BY AQUEOUS BENZOTRIAZOLE AND BENZIMIDAZOLE = ETUDE ELLIPSOMETRIQUE DES FILMS FORMES SUR CU PAR LE BENZOTRIAZOLE ET LE BENZIMIDAZOLE EN SOLUTIONSHOBBINS ND; ROBERTS RF.1979; SURF. TECHNOL.; ISSN 0376-4583; CHE; DA. 1979; VOL. 9; NO 4; PP. 235-239; BIBL. 10 REF.Article

APPLICATION OF ELLIPSOMETRY TO THE STUDY OF CORROSION PROCESSES.KRUGER J.1977; J. PHYS., COLLOQ.; FR.; DA. 1977; NO 5; PP. 129-138; ABS. FR.; BIBL. 36 REF.; (PROPR. OPT. INTERFACES SOLIDE-LIQUIDE. COLLOQ. INT.; LA COLLE-SUR-LOUP; 1977)Conference Paper

ELLIPSOMETRIC STUDIES ON IRON OXIDE FILM GROWTH AT 100 TO 350 C.SZKLARSKA SMIALOWSKA Z; JUREK J.1976; CORROSION; U.S.A.; DA. 1976; VOL. 32; NO 7; PP. 294-297; BIBL. 11 REF.Article

OPTICAL SPECTRA OF FERROUS AND FERRIC OXIDES AND THE PASSIVE FILM: A MOLECULAR ORBITAL STUDY = SPECTRE OPTIQUE DES OXYDES FERREUX ET FERRIQUES ET LES FILMS PASSIFS: UNE ETUDE PAR ORBITE MOLECULAIREDEBNATH NC; ANDERSON AB.1982; J. ELECTROCHEM. SOC.; ISSN 0013-4651; USA; DA. 1982; VOL. 129; NO 10; PP. 2169-2174; BIBL. 18 REF.Article

ELLIPSOMETER NULLING: COUPLING AND SETTING UNCERTAINTYKOTHIYAL MP.1979; APPL. OPT.; USA; DA. 1979; VOL. 18; NO 7; PP. 1019-1024; BIBL. 7 REF.Article

MODIFIED O'BRYAN ELLIPSOMETER (MOE) FOR FILM-SUBSTRATE SYSTEMSZAGHLOUL ARM.1978; OPT. COMMUNIC.; NLD; DA. 1978; VOL. 27; NO 1; PP. 1-3; BIBL. 5 REF.Article

ELLIPSOMETRY. ZEROING IN ON THIN FILMS.POPOV WA.1977; OPT. SPECTRA; U.S.A.; DA. 1977; VOL. 11; NO 5; PP. 25-27Article

ELLIPSOMETER NULLING: CONVERGENCE AND SPEED.CONFER DL; AZZAM RMA; BASHARA NM et al.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 10; PP. 2568-2575; BIBL. DISSEM.Article

INITIAL STAGES OF OXIDE GROWTH AND PORE INITIATION IN THE POROUS ANODIZATION OF ALUMINIUM.DELL'OCA CJ; FLEMING PJ.1976; J. ELECTROCHEM. SOC.; U.S.A.; DA. 1976; VOL. 123; NO 10; PP. 1487-1493; BIBL. 16 REF.Article

ETUDE DES PROPRIETES OPTIQUES DU SYSTEME ARSENIURE DE GALLIUM-COUCHE D'OXYDE ANODIQUE PAR UNE METHODE ELLIPSOMETRIQUELYASHENKO AV; GROMOV AI; TARANTOV YU A et al.1982; OPTIKA I SPEKTROSKOPIJA; ISSN 0030-4034; SUN; DA. 1982; VOL. 53; NO 6; PP. 1035-1037; BIBL. 8 REF.Article

IN SITU ELLIPSOMETRIC STUDY OF ANODIZATION PROCESS IN GAAS = ETUDE ELLIPSOMETRIQUE IN SITU DE L'ANODISATION DE GAASYAMAGISHI C; MORITANI A; NAKAI J et al.1980; TECHNOL. REP. OSAKA UNIV.; ISSN 0030-6177; JPN; DA. 1980; VOL. 30; NO 1517-1550; PP. 109-115; BIBL. 16 REF.Article

DETERMINATION DE L'INDICE DE REFRACTION D'UN MILIEU PAR UNE METHODE D'ELLIPSOMETRIEREZVYJ RR; FINAREV MS.1978; OPT. I SPEKTROSK.; SUN; DA. 1978; VOL. 44; NO 4; PP. 752-756; BIBL. 1 REF.Article

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