Pascal and Francis Bibliographic Databases

Help

Search results

Your search

kw.\*:("EMISSION IONIQUE SECONDAIRE")

Document Type [dt]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Language

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Author Country

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 25 of 384

  • Page / 16
Export

Selection :

  • and

SECONDARY ELECTRON EJECTION FROM CONTAMINATED METAL SURFACE BY HE AND AR ATOMS.KADOTA K; KANEKO Y.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 10; PP. 1554-1561; BIBL. 24 REF.Article

THE USE OF ION BEAMS IN SURFACE PHYSICS STUDIESCARTER G.1973; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1973; VOL. 10; NO 1; PP. 95-99; BIBL. 36 REF.Serial Issue

PRE-EQUILIBRIUM VARIATION OF THE SECONDARY ION YIELD.WITTMAACK K.1975; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1975; VOL. 17; NO 1; PP. 39-50; BIBL. 25 REF.Article

SUR LE MECANISME DE L'EMISSION IONIQUE SECONDAIREKISHINEVSKIJ ME.1975; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1975; VOL. 45; NO 6; PP. 1281-1283; BIBL. 6 REF.Article

SENSIBILITE RELATIVE DE L'ANALYSE EFFECTUEE PAR LA METHODE D'EMISSION IONIQUE SECONDAIREVASIL'JEV MO; CHENAKYIN SP; CHEREPYIN VT et al.1974; DOP. AKAD. NAUK U.R.S.R., A; S.S.S.R.; DA. 1974; VOL. 36; NO 8; PP. 751-753; ABS. ANGL. RUSSE; BIBL. 8 REF.Article

SECONDARY EMISSION OF MOLECULAR IONS FROM LIGHT-ELEMENT TARGETSLELEYTER M; JOYES P.1973; RAD. EFFECTS; G.B.; DA. 1973; VOL. 18; NO 1-2; PP. 105-110; BIBL. 20 REF.Serial Issue

SUR LA FORMATION RETARDEE D'IONS A L'EXTERIEUR D'UNE CIBLE SOUMISE A UN BOMBARDEMENT IONIQUEBERNHEIM M; BLAISE G; SLODZIAN G et al.1973; INTERNATION. J. MASS SPECTROM. ION PHYS.; NETHERL.; DA. 1973; VOL. 10; NO 3; PP. 293-308; ABS. ANGL.; BIBL. 20 REF.Serial Issue

ON THE BOND BREAKING MODEL OF POLYATOMIC ION EMISSION IN SECONDARY ION MASS SPECTROMETRYDUNLAP BI.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 121; NO 2; PP. 260-274; BIBL. 30 REF.Article

CRITICAL INVESTIGATION OF THE SECONDARY ION EMISSION OF PURE METALS USING THE PSEUDOATOM METHODANTAL J; KUGLER S.1980; ACTA PHYS. ACAD. SCI. HUNG.; ISSN 0001-6705; HUN; DA. 1980; VOL. 49; NO 4; PP. 351-360; BIBL. 26 REF.Article

ETUDE EXPERIMENTALE ET THEORIQUE DE L'EMISSION SECONDAIRE D'IONS MOLECULAIRES. CAS DES ELEMENTS DU GROUPE IV-B.LELEYTER M; JOYES P.1975; J. PHYS.; FR.; DA. 1975; VOL. 36; NO 5; PP. 843-355; ABS. ANGL.; BIBL. 39 REF.Article

COMMENT ON "PHASE TRANSFORMATION ON AND CHARGED PARTICLE EMISSION FROM A SI CRYSTAL SURFACE INDUCED BY PS LASER PULSES"VAN VECHTEN JA.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 12; PP. 9202-9203; BIBL. 10 REF.Article

A STUDY OF SECONDARY ION TRIPLE BOND ANALOGUESHODUL DT; HARRIS WC; MORRISON GH et al.1981; INT. J. MASS SPECTROM. ION PHYS.; ISSN 0020-7381; NLD; DA. 1981; VOL. 37; NO 1; PP. 17-25; BIBL. 62 REF.Article

EIN BEITRAG ZUM VERSTAENDNIS UND ZUR ANWENDUNG DER SEKUNDAERIONEN-ERZEUGUNG UND OBERFLAECHEN. = CONTRIBUTION A LA COMPREHENSION ET A L'APPLICATION DE LA PRODUCTION D'IONS SECONDAIRES SUR DES SURFACESHIGATSBERGER MJ; KLAUS N.1975; ACTA PHYS. AUSTR.; AUSTR.; DA. 1975; VOL. 41; NO 3-4; PP. 269-279; ABS. ANGL.; BIBL. 4 REF.Article

RELEVE DES COURBES D'ARRET DES IONS EN UTILISANT UNE SOURCE D'IONS COMBINEEPALEEV VI.1975; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1975; NO 1; PP. 181-182; BIBL. 5 REF.Article

STUDY OF THE MECHANISM. OF THE NEGATIVE SECONDARY IONIC EMISSION BY SELECTIVE SUPERFICIAL OXIDATION AND ADSORPTIONPALETTO S; PERDRIX M; GOUTTE R et al.1973; SURF. SCI.; NETHERL.; DA. 1973; VOL. 35; PP. 473-484; BIBL. 14 REF.; (SOLID-VAC. INTERFACE. PROC. 2ND SYMP. SURF. PHYS.; ENSCHEDE, NETH.; 1972)Conference Paper

EMISSION IONIQUE INDUITE PAR IONS POUR DES FACES DE CLIVAGE (100) DE MONOCRISTAUX PBS ET LIFZYRYANOV GK; MATSEVICH VG.1973; VEST. LENINGRAD. UNIV.; S.S.S.R.; DA. 1973; NO 4; PP. 68-71; ABS. ANGL.; BIBL. 5 REF.Serial Issue

COMPARISON OF SECONDARY ION YIELDS FROM CONDUCTING, SEMICONDUCTING AND NONCONDUCTING TARGETS BOMBARDED WITH 40 KEV ARGON IONSJURELA Z.1972; RAD. EFFECTS; G.B.; DA. 1972; VOL. 13; NO 3; PP. 167-170; BIBL. 5 REF.Serial Issue

IONISATION SUPERFICIELLE DES ATOMES SUR DES EMETTEURS HETEROGENES DANS LES CONDITIONS D'UN CHAMP DE CONTACT NON-COMPENSE DES TACHESZANDBERG EH YA; POTEKHINA ND; TONTEGODE A YA et al.1972; ZH. TEKH. FIZ.; S.S.S.R.; DA. 1972; VOL. 42; NO 12; PP. 2560-2563; BIBL. 4 REF.Serial Issue

COMMENTS ON THE SURFACE-EXCITATION MODELKROHN VE.1981; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1981; VOL. 111; NO 3; PP. L744-L746; BIBL. 15 REF.Article

APPLICATION DE LA METHODE D'EMISSION IONIQUE SECONDAIRE A L'ANALYSE DU SYSTEME SI-SIO2LITOVCHENKO VG; MARCHENKO RI; ROMANOVA GF et al.1973; POLUPROVODN. TEKH. MIKROELEKTRON., U.S.S.R.; S.S.S.R.; DA. 1973; NO 11; PP. 20-27; BIBL. 16 REF.Serial Issue

EMISSION D'IONS SECONDAIRES PAR BOMBARDEMENT D'IONS PRIMAIRES (ION-ION) DE FACES DE CLIVAGE DE MONOCRISTAUX DE PBS ET LIFZYRYANOV GK; MATSEVICH VG.1973; VEST. LENINGRAD. UNIV.; S.S.S.R.; DA. 1973; NO 4; PP. 68-71; ABS. ANGL.; BIBL. 5 REF.Serial Issue

SPUTTERING AND SECONDARY ION YIELDS OF METALS SUBJECTED TO OXYGEN ION BOMBARDMENTTAGA Y; INDUE K; SATTA K et al.1982; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1982; VOL. 119; NO 1; PP. L363-L369; BIBL. 19 REF.Article

SUR UN MODELE D'EMISSION SECONDAIRE D'IONS LENTSJOYES P.1979; C.R. ACAD. SCI., B; FRA; DA. 1979; VOL. 288; NO 9; PP. 155-158; ABS. ENG; BIBL. 9 REF.Article

A COMPUTERIZED SYSTEM FOR DETERMINING SECONDARY ION ENERGY SPECTRARUDAT MA; MORRISON GH.1979; ANAL. CHIM. ACTA; NLD; DA. 1979; VOL. 112; NO 1; PP. 1-9; BIBL. 16 REF.Article

A STUDY OF THE ENERGY SPECTRA OF SECONDARY IONS FROM METAL MATRICESRUDAT MA; MORRISON GH.1979; INTERNATION. J. MASS SPECTROM. ION PHYS; NLD; DA. 1979; VOL. 30; NO 3-4; PP. 197-232; BIBL. 48 REF.Article

  • Page / 16