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ELECTRON ENERGY LOSS MICROANALYSIS SYSTEM WITH HIGH COLLECTION EFFICIENCYJOHNSON DE.1980; REV. SCI. INSTRUM.; ISSN 0034-6748; USA; DA. 1980; VOL. 51; NO 6; PP. 705-709; BIBL. 8 REF.Article

HIGH RESOLUTION SPECTROMETERS FOR ELECTRON SCATTERINGBERTOZZI W; HYNES MV; SARGENT CP et al.1979; NUCL. INSTRUM. METHODS; NLD; DA. 1979; VOL. 162; NO 1-3; PP. 211-238; BIBL. 66 REF.Article

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REDUCTION OF ENERGY-LOSS "GHOST STRUCTURES" OBSERVED IN ELECTROSTATIC DEFLECTION TYPE ELECTRON ANALYSERSLAHMAN BENNANI A; DUGUET A.1980; J. ELECTRON, SPECTROSC. RELAT. PHENOMENA; NLD; DA. 1980; VOL. 18; NO 1-2; PP. 145-152; BIBL. 8 REF.Article

HIGH RESOLUTION ELECTRON SCATTERING FACILITY AT THE DARMSTADT LINEAR ACCELERATOR (DALINAC). I. ACCELERATOR.GRAF HD; MISKA H; SPAMER E et al.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 153; NO 1; PP. 9-15; BIBL. 7 REF.Article

DETECTION OF NITROGEN AT (100) PLATELETS IN DIAMONDBERGER SD; PENNYCOOK SJ.1982; NATURE (LOND.); ISSN 0028-0836; GBR; DA. 1982; VOL. 298; NO 5875; PP. 635-637; BIBL. 14 REF.Article

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Digital filtering in electron energy loss spectroscopy (EELS)HOSOI, J; OIKAWA, T; INOUE, M et al.Journal of electron microscopy. 1985, Vol 34, Num 1, pp 1-7, issn 0022-0744Article

Weighted least squares estimation of background in EELS imagingPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1985, Vol 137, Num 1, pp 93-100, issn 0022-2720Article

Optimized acquisition parameters and statistical detection limit in quantitative EELSPUN, T; ELLIS, J. R; EDEN, M et al.Journal of microscopy (Print). 1984, Vol 135, Num 3, pp 295-316, issn 0022-2720Article

A HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROMETER WITH IMPROVED TRANSMISSIONZSCHEILE H.1982; J. PHYS. E; ISSN 0022-3735; GBR; DA. 1982; VOL. 15; NO 7; PP. 749-752; BIBL. 5 REF.Article

LEISTUNGSFAEHIGKEIT UND GRENZEN EINES FILTERLINSEN-ANALYSATORS IN DER ENERGIEVERLUSTSPEKTROSKOPIE = RENDEMENT ET LIMITES D'UN ANALYSEUR A LENTILLE FILTRE EN SPECTROSCOPIE DE PERTE D'ENERGIESPILLECKE O.1981; OPTIK (STUTTG.); ISSN 0030-4026; DEU; DA. 1981; VOL. 59; NO 1; PP. 25-47; ABS. ENG; BIBL. 78 REF.Article

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MOMENTUM DEPENDENT DIELECTRIC RESPONSE OF POLYSTYRENERITSKO JJ.1979; J. CHEM. PHYS.; USA; DA. 1979; VOL. 70; NO 10; PP. 4656-4659; BIBL. 14 REF.Article

INELASTIC SCATTERING OF ELECTRONS BY VIBRATIONAL MOTION OF MOLECULES ADSORBED AT METAL SURFACES.DELANAYE F; LUCAS A; MAHAN GD et al.1978; SURF. SCI.; NETHERL.; DA. 1978; VOL. 70; PP. 629-642; BIBL. 13 REF.Article

ETUDE DE SURFACE DES COMPOSES II-VIEBINA A; TAKAAASHI T.1977; OYO BUTURI; JAP.; DA. 1977; VOL. 46; NO 7; PP. 744-749; BIBL. 22 REF.Article

ORIENTATION-DEPENDENT EXTENDED FINE STRUCTURE IN ELECTRON-ENERGY-LOSS SPECTRADISKO MM; KRIVANEK OL; REZ P et al.1982; PHYSICAL REVIEW. B: CONDENSED MATTER; ISSN 0163-1829; USA; DA. 1982; VOL. 25; NO 6; PP. 4252-4255; BIBL. 21 REF.Article

A QUANTITATIVE ANALYSIS OF ELECTRON ENERGY LOSS SPECTRA OF KEV ELECTRONS FROM THIN-FILM-SUBSTRATE SYSTEMITO T; IWAMI M; HIRAKI A et al.1981; J. PHYS. SOC. JPN.; ISSN 0031-9015; JPN; DA. 1981; VOL. 50; NO 8; PP. 2704-2712; BIBL. 24 REF.Article

THE SELECTION RULE IN ELECTRON ENERGY LOSS SPECTROSCOPY OF ADSORBED MOLECULESSEBASTIAN KL.1980; J. PHYS. C: SOLID STATE PHYS.; ISSN 0022-3719; GBR; DA. 1980; VOL. 13; NO 6; PP. L115-L117; BIBL. 8 REF.Article

APPLICATIONS INDUSTRIELLES DE LA SPECTROMETRIE DE PERTE D'ENERGIE D'ELECTRONS (E.L.S.)DEMONCY P.1980; VIDE COUCHES MINCES; ISSN 0223-4335; FRA; DA. 1980; NO 202; PP. 155-164; ABS. ENG; BIBL. 2 REF.Article