kw.\*:("ENVIRONMENTAL TEST")
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TIME DEPENDENCE OF ENVIRONMENTAL-CONTAMINANT-INDUCED REACTIONS IN ENCAPSULATED METALLURGY. II. ANALYSIS AND APPLICATION OF THE MODEL.FERRIS PRABHU AV.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 4082-4085; BIBL. 5 REF.Article
FOR RELIABLE SEVERE ENVIRONMENT PERFORMANCE, ENCAPSULATE LED'S WITH A CLEAR SILICONE.PRICE SJ; JOHNSON RL; CHAPMAN JF et al.1977; INSULAT. CIRCUITS; U.S.A.; DA. 1977; VOL. 23; NO 11; PP. 53-56; BIBL. 2 REF.Article
RELIABILITY ENGINEERING IN MICROELECTRONICSJOWETT CE.1978; MICROELECTRON. AND RELIABIL.; GBR; DA. 1978; VOL. 17; NO 5; PP. 505-512Article
SEAT: SIMULATED ENVIRONMENT ACCELERATED TESTSCHWARTZ N; BACON DD.1978; J. ELECTROCHEM. SOC.; USA; DA. 1978; VOL. 125; NO 9; PP. 1487-1493; BIBL. 19 REF.Article
MINI-PAK: A COST-EFFECTIVE LEADLERS CHIP CARRIER.ACELLO S.1977; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1977; VOL. 17; NO 6; PP. 78-82Article
RELIABLE THYRISTORS AND TRIACS IN TO-220 PLASTIC PACKAGESBLUNT P.1979; ELECTRON. COMPON. APPL.; NLD; DA. 1979; VOL. 2; NO 1; PP. 53-58Article
TIME DEPENDENCE OF ENVIRONMENTAL-CONTAMINANT-INDUCED REACTIONS IN ENCAPSULATED METALLURGY. I. DEVELOPMENT OF THE MODEL.FERRIS PRABHU AV.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 4078-4081; BIBL. 4 REF.Article
ENVIRONMENTAL TESTS FOR CONNECTORS AND CONTACT MATERIALS: AN EVALUATION OF A METHOD INVOLVING SULFUR DIOXIDEANTLER M; DUNBAR JJ.1978; I.E.E.E. TRANS. COMPON. HYBRIDS MANUFG; USA; DA. 1978; VOL. 1; NO 1; PP. 17-29; BIBL. 43 REF.Article
LIQUID CRYSTAL DISPLAYS: COMPONENTS WITH HIGH RELIABILITYBECHTELER M.1979; COMPON. REP.; ISSN 0341-6569; DEU; DA. 1979; VOL. 14; NO 3; PP. 121-124; BIBL. 10 REF.Article
ENVIRONMENTAL TEST SYSTEMSERICKSON D.1980; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1980; VOL. 20; NO 4; PP. 87-106; 9 P.Article
ENVIRONMENTAL TESTING OF SINGLE-CRYSTAL SILICON SOLAR CELLS WITH SCREEN-PRINTED SILVER CONTACTSFIROR K; HOGAN S.1982; IEEE TRANS. RELIAB.; ISSN 0018-9529; USA; DA. 1982; VOL. 31; NO 3; PP. 270-275; BIBL. 5 REF.Article
REED SWITCH RELIABILITYSARAF RK; RAM IB.1978; MICROELECTRON. AND RELIABIL.; GBR; DA. 1978; VOL. 17; NO 4; PP. 431-433; BIBL. 2 REF.Article
POUR LA PROTECTION DES SEMI-CONDUCTEURS: UN COMPOSE DE MOULAGE SILICONE-EPOXYTREGO B; HARBERER S.1978; TOUTE ELECTRON.; FRA; DA. 1978; NO 432; PP. 77-80Article
BEHAVIOR OF CONTACT SURFACES CONSISTING OF GOLD ALLOYS IN H2S-NO2-SO2 ATMOSPHERESPOTINECKE J.1978; I.E.E.E. TRANS. COMPON. HYBRIDS MANUFG; USA; DA. 1978; NO 1; PP. 86-89; BIBL. 5 REF.Article
PBS... MR. VERSATILITY OF THE DETECTOR WORLD.HARRIS RE.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 12; PP. 47-50Article
FIVE-YEAR LIFE TEST DATA ON PRESSURE (10000 1BF/IN2) TOLERANT ELECTRONIC COMPONENTSMARQUARDT RA.1978; I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1978; VOL. 1; NO 4; PP. 365-371; BIBL. 24 REF.Article
CONTROL OF PRE-TRIM VARIABLES IN THICK FILM RESISTOR PROCESSINGWOOD JH.1978; SOLID STATE TECHNOL.; USA; DA. 1978; VOL. 21; NO 9; PP. 67-72; BIBL. 5 REF.Article
PRINTED WIRING CONTACT METALLURGY AND ITS ENVIRONMENT.MCGAUGHEY RL.1978; G.T.E. AUTOMAT. ELECTR. J.; U.S.A.; DA. 1978; VOL. 16; NO 1; PP. 33-44Article
THE RELIABILITY OF ELECTRONIC DEVICES IN STORAGE ENVIRONMENTSLIVESAY BR.1978; SOLID STATE TECHNOL.; USA; DA. 1978; VOL. 21; NO 10; PP. 63-68; BIBL. 20 REF.Article
CONTACT BEHAVIOR OF TELEPHONE RELAYS AND CONNECTORS IN VARIOUS AGGRESSIVE ENVIRONMENTS.BARON JP; LE TRAON JY; RIOU MT et al.1977; I.E.E.E. TRANS. PARTS HYBR. PACKAG.; U.S.A.; DA. 1977; VOL. 13; NO 1; PP. 68-72; BIBL. 5 REF.Article
QUALITY AND RELIABILITY OF COS/MOS.FERRIANI O.1977; NEW ELECTRON.; G.B.; DA. 1977; VOL. 10; NO 8; PP. 21-25 (3P.)Article
TECHNOLOGIE INDUSTRIELLE D'ENCAPSULATION ECONOMIQUE ET FIABLE POUR PANNEAUX SOLAIRES DE GRANDES DIMENSIONS = AN INDUSTRIAL TECHNOLOGY OF ECONOMIC AND RELIABLE ENCAPSULATION FOR LARGE DIMENSION SOLAR ARRAYSANGUET J; SALLES Y.1978; ; FRA; DA. 1978; DGRST 76 7 1494; (18) P.: ILL.; 30 CM; ACTION CONCERT.: ENERG. SOL.Report
LE CONTROLE DE LA QUALITE DES THYRISTORS DE HAUTE PUISSANCE.BERGSJO NJ; STURESSON S.1976; A.S.E.A.-REV.; SUEDE; DA. 1976; VOL. 48; NO 2; PP. 37-45Article
NEW ACCELERATION FACTORS FOR TEMPERATURE, HUMIDITY, BIAS TESTINGSBAR NL; KOZAKIEWICZ RP.1979; IEEE TRANS. ELECTRON. DEVICES; USA; DA. 1979; VOL. 26; NO 1; PP. 56-71; BIBL. 28 REF.Article
METEOROLOGICAL EFFECTS ON SCHOTTKY-BARRIER SOLAR CELLSKLIMPKE CM; LANDSBERG PT.1978; I.E.E. J. SOLID-STATE ELECTRON DEVICES; GBR; DA. 1978; VOL. 2; NO SPEC.; PP. 20-22; BIBL. 2 REF.Article