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IMAGE ASSESSMENT FOR THE AUTOMATED TESTING OF MIROR FLATNESS.ALTFATHER KW.1974; IN: IMAGE ASSESS. SPECIF. SEMIN. DEPHTH; ROCHESTER, N.Y.; 1974; PALOS VERDES ESTATES, CALIF.; SOC. PHOTO-OPT. INSTRUM. ENG.; DA. 1974; PP. 207-212; BIBL. 2 REF.Conference Paper

AUTOMATIC TESTING - WHEN AND HOW.ETTINGER GM.1975; ELECTR. REV.; G.B.; DA. 1975; VOL. 196; NO 15; PP. 464-466; BIBL. 6 REF.Article

FIELD-SERVICE TESTERS SHARPEN ON-SITE SKILLSMCLEOD J.1980; ELECTRON. DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 21; PP. 109-118; 9 P.Article

LE TEST AUTOMATIQUE DES CARTESLISBONIS M.1980; TOUTE ELECTRON.; ISSN 0040-9855; FRA; DA. 1980; NO 456; PP. 27-29Article

CAROT REVISITEDANDERSON MM; EINSCHLAG MB; JAASMA EG et al.1978; BELL LAB. REC.; USA; DA. 1978; VOL. 56; NO 3; PP. 71-75Article

TEST INSTRUMENTS GAIN SYSTEM FLEXIBILITY FROM IEEE STANDARD INTERFACE.ANDREIEV N.1975; CONTROL ENGNG; U.S.A.; DA. 1975; VOL. 22; NO 11; PP. 44-46Article

BANC DE TEST DE VOLTMETRES NUMERIQUES.GELARD P.1975; CEA-N-1794; FR.; DA. 1975; PP. 1-11; ABS. ANGLReport

AUTOMATED INSPECTION OF ELECTRONIC ASSEMBLIES.HARLOW CA; HENDERSON SE; RAYFIELD DA et al.1975; COMPUTER; U.S.A.; DA. 1975; VOL. 8; NO 4; PP. 36-45; BIBL. 9 REF.Article

AUTOMATIC TESTING OF COMMUNICATION EQUIPMENT.LAL CM.1975; J. INSTIT. ENGRS (INDIA), ELECTRON. TELECOMMUNIC. ENGNG DIV.; INDIA; DA. 1975; VOL. 55; NO 2-3; PP. 55-58; BIBL. 5 REF.Article

HIGH-PERFORMANCE PCB TESTER ALSO ACTS AS DESIGN AID.1974; INSULAT.-CIRCUITS; U.S.A.; DA. 1974; VOL. 20; NO 3; PP. 27-28Article

PERSPECTIVE. HAS ATE AN ELECTRICAL ROLE.1974; ELECTR. REV.; G.B.; DA. 1974; VOL. 195; NO 18; PP. 625-626Article

RECHNERGESTEUERTE DAUERVERSUCHSANLAGE FUER RELAIS. = INSTALLATION D'ESSAIS DE DUREE DE VIE DE RELAIS, COMMANDEE PAR CALCULATEURKUPEC P; SIEPMANN R.1974; ELEKTROTECH. Z.; DTSCH.; DA. 1974; VOL. 26; NO 19; PP. 482-483; ABS. ANGLArticle

TESTING OF METERS TO BE CONTROLLED BY COMPUTER1973; ELECTR. TIMES; G.B.; DA. 1973; NO 4238Serial Issue

WHAT TO LOOK FOR IN AUTOMATED TEST SYSTEMSBOGGS WF; NORCIA D; MARSHALL M et al.1973; SOLID STATE TECHNOL.; U.S.A.; DA. 1973; VOL. 16; NO 3; PP. 50-54Serial Issue

"THE ELECTRONIC INSPECTOR": IN-CIRCUIT COMPONENT TESTING.CROMER EG.1973; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1973; VOL. 13; NO 12; PP. 38-44 (6P.)Article

MESSPLAETZE ZUR BAUSTEIN- UND BAUGRUPPENPRUEFUNG = DISPOSITIFS DE MESURE POUR LA VERIFICATION DE COMPOSANTS ET DE GROUPES DE COMPOSANTSTURBA P.1972; NEUES ROHDE SCHWARZ; DTSCH.; DA. 1972; VOL. 12; NO 57; PP. 5-11; BIBL. 8 REF.Serial Issue

TERADYNE'S J259, J273, J283 ARE STILL GOING STRONG1980; EVAL. ENG.; ISSN 0014-3316; USA; DA. 1980; VOL. 19; NO 4; PP. 86-89Article

COMPUTERISED AUTOMATIC CIRCUIT-BOARD TESTING. THE RIGHT APPROACH TO MEETING THE MARKET REQUIREMENTS.LAWRENCE B.1976; ELECTRON. AND POWER; G.B.; DA. 1976; VOL. 22; NO 1; PP. 24-28Article

LOGIC-BOARD FAULT ISOLATION SOFTWARE.ANDERSON RE.1976; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1976; VOL. 16; NO 6; PP. 36-42 (5P.); BIBL. 3 REF.Article

COMPUTER APPLICATION IN APPLIANCE TESTING.ROLAND ET; PATTI RD.1975; I.E.E.E. TRANS. INDUSTRY APPL.; U.S.A.; DA. 1975; VOL. 11; NO 5; PP. 560-563Article

COMMENT CONCEVOIR DES CARTES LOGIQUES POUR EN FACILITER LE TEST AUTOMATIQUE ET LE DEPANNAGE.LE GORGEU M.1975; ELECTRON. MICROELECTRON. INDUSTR.; FR.; DA. 1975; NO 206; PP. 19-23Article

TEILAUTOMATISIERUNG VON PRUEFEINRICHTUNGEN FUER ELEKTRIZITAETSZAEHLER. = AUTOMATISATION PARTIELLE DES DISPOSITIFS D'ESSAIS DE COMPTEURS D'ENERGIE ELECTRIQUEWALTER K.1975; SIEMENS Z.; DTSCH.; DA. 1975; VOL. 49; NO 3; PP. 133-135; BIBL. 3 REF.Article

AUTOMATIC LOAD CONTOUR MAPPING DEVISED FOR POWER TRANSISTORS.1974; MICROWAVES; U.S.A.; DA. 1974; VOL. 13; NO 9; PP. 64Article

AUTOMATED AND SEMIAUTOMATED ASSEMBLY, WIRING AND TESTING.1973; IN: NEREM 73. NORTHEAST ELECTRON. RES. ENG. MEET.; BOSTON; 1973; BOSTON; INST. ELECTR. ELECTRON. ENG.; DA. 1973; VOL. 1; PP. 110-122Conference Paper

A PRINTED BOARD TEST JIG SYSTEM FOR A.T.ESMITH JL.1972; MARCONI INSTRUMENT.; G.B.; DA. 1972; VOL. 13; NO 5; PP. 108-111; BIBL. 1 REF.Serial Issue

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