kw.\*:("ESSAI AUTOMATIQUE")
Results 1 to 25 of 668
Selection :
FIELD-SERVICE TESTERS SHARPEN ON-SITE SKILLSMCLEOD J.1980; ELECTRON. DES.; ISSN 0013-4872; USA; DA. 1980; VOL. 28; NO 21; PP. 109-118; 9 P.Article
LE TEST AUTOMATIQUE DES CARTESLISBONIS M.1980; TOUTE ELECTRON.; ISSN 0040-9855; FRA; DA. 1980; NO 456; PP. 27-29Article
CAROT REVISITEDANDERSON MM; EINSCHLAG MB; JAASMA EG et al.1978; BELL LAB. REC.; USA; DA. 1978; VOL. 56; NO 3; PP. 71-75Article
TEST INSTRUMENTS GAIN SYSTEM FLEXIBILITY FROM IEEE STANDARD INTERFACE.ANDREIEV N.1975; CONTROL ENGNG; U.S.A.; DA. 1975; VOL. 22; NO 11; PP. 44-46Article
BANC DE TEST DE VOLTMETRES NUMERIQUES.GELARD P.1975; CEA-N-1794; FR.; DA. 1975; PP. 1-11; ABS. ANGLReport
AUTOMATED INSPECTION OF ELECTRONIC ASSEMBLIES.HARLOW CA; HENDERSON SE; RAYFIELD DA et al.1975; COMPUTER; U.S.A.; DA. 1975; VOL. 8; NO 4; PP. 36-45; BIBL. 9 REF.Article
AUTOMATIC TESTING OF COMMUNICATION EQUIPMENT.LAL CM.1975; J. INSTIT. ENGRS (INDIA), ELECTRON. TELECOMMUNIC. ENGNG DIV.; INDIA; DA. 1975; VOL. 55; NO 2-3; PP. 55-58; BIBL. 5 REF.Article
HIGH-PERFORMANCE PCB TESTER ALSO ACTS AS DESIGN AID.1974; INSULAT.-CIRCUITS; U.S.A.; DA. 1974; VOL. 20; NO 3; PP. 27-28Article
PERSPECTIVE. HAS ATE AN ELECTRICAL ROLE.1974; ELECTR. REV.; G.B.; DA. 1974; VOL. 195; NO 18; PP. 625-626Article
RECHNERGESTEUERTE DAUERVERSUCHSANLAGE FUER RELAIS. = INSTALLATION D'ESSAIS DE DUREE DE VIE DE RELAIS, COMMANDEE PAR CALCULATEURKUPEC P; SIEPMANN R.1974; ELEKTROTECH. Z.; DTSCH.; DA. 1974; VOL. 26; NO 19; PP. 482-483; ABS. ANGLArticle
TESTING OF METERS TO BE CONTROLLED BY COMPUTER1973; ELECTR. TIMES; G.B.; DA. 1973; NO 4238Serial Issue
WHAT TO LOOK FOR IN AUTOMATED TEST SYSTEMSBOGGS WF; NORCIA D; MARSHALL M et al.1973; SOLID STATE TECHNOL.; U.S.A.; DA. 1973; VOL. 16; NO 3; PP. 50-54Serial Issue
"THE ELECTRONIC INSPECTOR": IN-CIRCUIT COMPONENT TESTING.CROMER EG.1973; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1973; VOL. 13; NO 12; PP. 38-44 (6P.)Article
MESSPLAETZE ZUR BAUSTEIN- UND BAUGRUPPENPRUEFUNG = DISPOSITIFS DE MESURE POUR LA VERIFICATION DE COMPOSANTS ET DE GROUPES DE COMPOSANTSTURBA P.1972; NEUES ROHDE SCHWARZ; DTSCH.; DA. 1972; VOL. 12; NO 57; PP. 5-11; BIBL. 8 REF.Serial Issue
TERADYNE'S J259, J273, J283 ARE STILL GOING STRONG1980; EVAL. ENG.; ISSN 0014-3316; USA; DA. 1980; VOL. 19; NO 4; PP. 86-89Article
COMPUTERISED AUTOMATIC CIRCUIT-BOARD TESTING. THE RIGHT APPROACH TO MEETING THE MARKET REQUIREMENTS.LAWRENCE B.1976; ELECTRON. AND POWER; G.B.; DA. 1976; VOL. 22; NO 1; PP. 24-28Article
LOGIC-BOARD FAULT ISOLATION SOFTWARE.ANDERSON RE.1976; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1976; VOL. 16; NO 6; PP. 36-42 (5P.); BIBL. 3 REF.Article
COMPUTER APPLICATION IN APPLIANCE TESTING.ROLAND ET; PATTI RD.1975; I.E.E.E. TRANS. INDUSTRY APPL.; U.S.A.; DA. 1975; VOL. 11; NO 5; PP. 560-563Article
COMMENT CONCEVOIR DES CARTES LOGIQUES POUR EN FACILITER LE TEST AUTOMATIQUE ET LE DEPANNAGE.LE GORGEU M.1975; ELECTRON. MICROELECTRON. INDUSTR.; FR.; DA. 1975; NO 206; PP. 19-23Article
TEILAUTOMATISIERUNG VON PRUEFEINRICHTUNGEN FUER ELEKTRIZITAETSZAEHLER. = AUTOMATISATION PARTIELLE DES DISPOSITIFS D'ESSAIS DE COMPTEURS D'ENERGIE ELECTRIQUEWALTER K.1975; SIEMENS Z.; DTSCH.; DA. 1975; VOL. 49; NO 3; PP. 133-135; BIBL. 3 REF.Article
AUTOMATIC LOAD CONTOUR MAPPING DEVISED FOR POWER TRANSISTORS.1974; MICROWAVES; U.S.A.; DA. 1974; VOL. 13; NO 9; PP. 64Article
AUTOMATED AND SEMIAUTOMATED ASSEMBLY, WIRING AND TESTING.1973; IN: NEREM 73. NORTHEAST ELECTRON. RES. ENG. MEET.; BOSTON; 1973; BOSTON; INST. ELECTR. ELECTRON. ENG.; DA. 1973; VOL. 1; PP. 110-122Conference Paper
A PRINTED BOARD TEST JIG SYSTEM FOR A.T.ESMITH JL.1972; MARCONI INSTRUMENT.; G.B.; DA. 1972; VOL. 13; NO 5; PP. 108-111; BIBL. 1 REF.Serial Issue
AUTOMAC STATIC TESTING OF DIGITAL INTEGRATED CIRCUITSMANOHARAN LC; KRISHNAN S.1972; J. INSTIT. ENGRS (INDIA), ELECTRON. TELECOMMUNIC. ENGNG DIV.; INDIA; DA. 1972; VOL. 53; NO 2; PP. 69-73; BIBL. 2 REF.Serial Issue
MULTI-LEVEL TESTING OF COMPLEX ASSEMBLIESSERENE R.1981; INSUL., CIRCUITS; ISSN 0020-4544; USA; DA. 1981; VOL. 27; NO 18; PP. 30-32Article