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Results 1 to 25 of 155

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TIME DEPENDENCE OF ENVIRONMENTAL-CONTAMINANT-INDUCED REACTIONS IN ENCAPSULATED METALLURGY. II. ANALYSIS AND APPLICATION OF THE MODEL.FERRIS PRABHU AV.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 4082-4085; BIBL. 5 REF.Article

RELIABILITY ENGINEERING IN MICROELECTRONICSJOWETT CE.1978; MICROELECTRON. AND RELIABIL.; GBR; DA. 1978; VOL. 17; NO 5; PP. 505-512Article

FOR RELIABLE SEVERE ENVIRONMENT PERFORMANCE, ENCAPSULATE LED'S WITH A CLEAR SILICONE.PRICE SJ; JOHNSON RL; CHAPMAN JF et al.1977; INSULAT. CIRCUITS; U.S.A.; DA. 1977; VOL. 23; NO 11; PP. 53-56; BIBL. 2 REF.Article

RELIABLE THYRISTORS AND TRIACS IN TO-220 PLASTIC PACKAGESBLUNT P.1979; ELECTRON. COMPON. APPL.; NLD; DA. 1979; VOL. 2; NO 1; PP. 53-58Article

TIME DEPENDENCE OF ENVIRONMENTAL-CONTAMINANT-INDUCED REACTIONS IN ENCAPSULATED METALLURGY. I. DEVELOPMENT OF THE MODEL.FERRIS PRABHU AV.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 9; PP. 4078-4081; BIBL. 4 REF.Article

ENVIRONMENTAL EFFECTS ON COPPER THICK FILM MICROCIRCUITSPITKANEN DE; SPEERSCHNEIDER CJ.1981; IEEE TRANS. COMPON. HYBRIDS MANUF. TECHNOL.; ISSN 0148-6411; USA; DA. 1981; VOL. 4; NO 3; PP. 250-256; BIBL. 8 REF.Article

ENVIRONMENTAL TESTS FOR CONNECTORS AND CONTACT MATERIALS: AN EVALUATION OF A METHOD INVOLVING SULFUR DIOXIDEANTLER M; DUNBAR JJ.1978; I.E.E.E. TRANS. COMPON. HYBRIDS MANUFG; USA; DA. 1978; VOL. 1; NO 1; PP. 17-29; BIBL. 43 REF.Article

ENVIRONMENTAL TEST SYSTEMSERICKSON D.1980; ELECTRON. PACKAG. PRODUCT.; USA; DA. 1980; VOL. 20; NO 4; PP. 87-106; 9 P.Article

LIQUID CRYSTAL DISPLAYS: COMPONENTS WITH HIGH RELIABILITYBECHTELER M.1979; COMPON. REP.; ISSN 0341-6569; DEU; DA. 1979; VOL. 14; NO 3; PP. 121-124; BIBL. 10 REF.Article

SEAT: SIMULATED ENVIRONMENT ACCELERATED TESTSCHWARTZ N; BACON DD.1978; J. ELECTROCHEM. SOC.; USA; DA. 1978; VOL. 125; NO 9; PP. 1487-1493; BIBL. 19 REF.Article

MINI-PAK: A COST-EFFECTIVE LEADLERS CHIP CARRIER.ACELLO S.1977; ELECTRON. PACKAG. PRODUCT.; U.S.A.; DA. 1977; VOL. 17; NO 6; PP. 78-82Article

FIVE-YEAR LIFE TEST DATA ON PRESSURE (10000 1BF/IN2) TOLERANT ELECTRONIC COMPONENTSMARQUARDT RA.1978; I.E.E.E. TRANS. COMPON. HYBR. MANUFG TECHNOL.; USA; DA. 1978; VOL. 1; NO 4; PP. 365-371; BIBL. 24 REF.Article

TECHNOLOGIE INDUSTRIELLE D'ENCAPSULATION ECONOMIQUE ET FIABLE POUR PANNEAUX SOLAIRES DE GRANDES DIMENSIONS = AN INDUSTRIAL TECHNOLOGY OF ECONOMIC AND RELIABLE ENCAPSULATION FOR LARGE DIMENSION SOLAR ARRAYSANGUET J; SALLES Y.1978; ; FRA; DA. 1978; DGRST 76 7 1494; (18) P.: ILL.; 30 CM; ACTION CONCERT.: ENERG. SOL.Report

LE CONTROLE DE LA QUALITE DES THYRISTORS DE HAUTE PUISSANCE.BERGSJO NJ; STURESSON S.1976; A.S.E.A.-REV.; SUEDE; DA. 1976; VOL. 48; NO 2; PP. 37-45Article

NEW ACCELERATION FACTORS FOR TEMPERATURE, HUMIDITY, BIAS TESTINGSBAR NL; KOZAKIEWICZ RP.1979; IEEE TRANS. ELECTRON. DEVICES; USA; DA. 1979; VOL. 26; NO 1; PP. 56-71; BIBL. 28 REF.Article

METEOROLOGICAL EFFECTS ON SCHOTTKY-BARRIER SOLAR CELLSKLIMPKE CM; LANDSBERG PT.1978; I.E.E. J. SOLID-STATE ELECTRON DEVICES; GBR; DA. 1978; VOL. 2; NO SPEC.; PP. 20-22; BIBL. 2 REF.Article

BEHAVIOR OF CONTACT SURFACES CONSISTING OF GOLD ALLOYS IN H2S-NO2-SO2 ATMOSPHERESPOTINECKE J.1978; I.E.E.E. TRANS. COMPON. HYBRIDS MANUFG; USA; DA. 1978; NO 1; PP. 86-89; BIBL. 5 REF.Article

PBS... MR. VERSATILITY OF THE DETECTOR WORLD.HARRIS RE.1976; ELECTRO-OPT. SYST. DESIGN; U.S.A.; DA. 1976; VOL. 8; NO 12; PP. 47-50Article

RELIABILITY STUDIES ON MIS SOLAR CELLSANDERSON WA; KIM JK.1978; APPL. PHYS.; DEU; DA. 1978; VOL. 17; NO 4; PP. 401-404; BIBL. 6 REF.Article

SOLID STATE DEVICES - GAAS POWER FETS1978; INTERNATIONAL ELECTRON DEVICES MEETING/1978-12-04/WASHINGTON DC; USA; NEW YORK: INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS; DA. 1978; 364-393; BIBL. DISSEM.Conference Paper

L'ENVIRONNEMENT DES MATERIELS DE TELECOMMUNICATIONS.LE TRAON JY; TREHEUX M.1977; ECHO RECH.; FR.; DA. 1977; NO 90; PP. 12-21; ABS. ESP. ANGL.Article

A STUDY OF PROPERTIES OF PLASTICS USED FOR SEMICONDUCTOR ENCAPSULATION.ANH QUACH; HUNTER WL.1977; J. ELECTRON. MATER.; U.S.A.; DA. 1977; VOL. 6; NO 3; PP. 319-331; BIBL. 9 REF.Article

ENVIRONMENTAL TESTING OF SINGLE-CRYSTAL SILICON SOLAR CELLS WITH SCREEN-PRINTED SILVER CONTACTSFIROR K; HOGAN S.1982; IEEE TRANS. RELIAB.; ISSN 0018-9529; USA; DA. 1982; VOL. 31; NO 3; PP. 270-275; BIBL. 5 REF.Article

ETUDE DE LA QUALITE DES PANNEAUX SOLAIRES ET DES DEGRADATIONS AUX CONTRAINTES CLIMATIQUESDESOMBRE A.1980; ; FRA; DA. 1980; DGRST-77 7 2012; 41 P.: ILL.; 30 CM; BIBL. 3 REF.; ACTION CONCERTEE: ENERGIE SOLAIREReport

THE REDUCTION OF AU-AL INTERMETALLIC FORMATION AND ELECTROMIGRATION IN HYDROGEN ENVIRONMENTSSHIH DY; FICALORA PJ.1979; IEEE TRANS. ELECTRON. DEVICES; USA; DA. 1979; VOL. 26; NO 1; PP. 27-34; BIBL. 17 REF.Article

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