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Direct measurement for the decay probabilities of 4d_j hole states in xenon by means of photoelectron-ion coincidencesKÄMMERLING, B; KRÄSSIG, B; SCHMIDT, V et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 1992, Vol 25, Num 17, pp 3621-3629, issn 0953-4075Article

MEASUREMENT OF THE AUGER EFFECT IN THE (MU ⁴HE)_2S⁺ IONIC SYSTEMCARBONI G; PLACCI A; ZAVATTINI E et al.1973; LETTERE NUOVO CIMENTO; ITAL.; DA. 1973; VOL. 6; NO 7; PP. 233-237; BIBL. 2 REF.Serial Issue

Analysis of Auger spectra from a He⁺ ion near a metal surfaceFONDEN, T; ZWARTKRUIS, A.Physical review. B, Condensed matter. 1993, Vol 48, Num 21, pp 15603-15612, issn 0163-1829Article

Désactivation Auger à 3 électrons dans les atomesAMUS'YA, M. YA; KILIN, V. A; LI, I. S et al.Optika i spektroskopiâ. 1985, Vol 59, Num 2, pp 261-264, issn 0030-4034Article

Intrinsic spin polarization parameters for isotropic Auger multipletsLOHMANN, B; LARKINS, F. P.Journal of physics. B. Atomic, molecular and optical physics (Print). 1994, Vol 27, Num 8, pp L143-L152, issn 0953-4075Article

THE INFLUENCE OF AN ELECTRIC FIELD ON THE AUGER RECOMBINATION IN SEMICONDUCTORS.GEBRANZIG U; HAUG A; ROSENTHAL W et al.1975; PHYS. STATUS SOLIDI, B; ALLEM.; DA. 1975; VOL. 68; NO 2; PP. 749-760; ABS. ALLEM.; BIBL. 14 REF.Article

Light emission from silicon nanocrystalsPURITIS, T; KAUPUZS, J.Materials science forum. 2002, pp 79-82, issn 0255-5476, isbn 0-87849-890-7Conference Paper

BAND-TO-BAND AUGER EFFECT ON THE OUTPUT POWER SATURATION IN INGAASP LED'SSUGIMURA A.1981; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1981; VOL. 17; NO 4; PP. 441-444; BIBL. 15 REF.Article

PRODUCTION OF OIII THROUGH AUGER EFFECT.BELY O; SERRAO JMP.1977; ASTR. AND ASTROPHYS.; GERM.; DA. 1977; VOL. 61; NO 5; PP. 711-714; BIBL. 10 REF.Article

Scanning Auger microscopy for dating of manuscript inksMCNEIL, R. J.Advances in chemistry series. 1984, Vol 205, pp 255-269, issn 0065-2393Article

Satellites, hypersatellites and RAE from Ti, V, Cr, Mn and Fe in photoionisationMITRA, D; SARKAR, M; BHATTACHARYA, D et al.X-ray spectrometry. 2008, Vol 37, Num 6, pp 585-594, issn 0049-8246, 10 p.Article

New technique for the simultaneous correction of topographical and backscattering artefacts in electron-excited Auger spectroscopy and microscopyCRONE, M; BARKSHIRE, I. R; PRUTTON, M et al.Surface and interface analysis. 1994, Vol 21, Num 12, pp 857-863, issn 0142-2421Article

Long range and surface effects on the Auger parameter : electrostatic self-consistent polarization energy modelSATTA, Mauro; MORPURGO, Simone; MORETTI, Giuliano et al.Surface and interface analysis. 2008, Vol 40, Num 3-4, pp 692-694, issn 0142-2421, 3 p.Conference Paper

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Auger-final-state selected ion desorption study of condensed NH₃ and ND₃ by using Auger electron-photoion coincidence spectroscopyNAGASONO, M; MASE, K; TANAKA, S.-I et al.Surface science. 1997, Vol 377-79, pp 380-383, issn 0039-6028Conference Paper

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article

Automatic matching of dissimilar SAM-imagesBÖHMIG, S. D; REICHL, B. M; EISL, M. M et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 304-307, issn 0142-2421Conference Paper

On the mechanism of the smooth increase of the mean ion charge in Ar photoionization near the K-edgeAMUSIA, M. YA.Physics letters. A. 1993, Vol 183, Num 2-3, pp 201-204, issn 0375-9601Article

A Monte Carlo simulation of Auger cascadesPOMPLUN, E; BOOZ, J; CHARLTON, D. E et al.Radiation research. 1987, Vol 111, Num 3, pp 533-552, issn 0033-7587Article

THE L₁L²,3) V AUGER TRANSITION IN SI.FERRER S; BARO AM; SALMERON M et al.1975; SOLID STATE COMMUNIC.; G.B.; DA. 1975; VOL. 16; NO 5; PP. 651-653; BIBL. 10 REF.Article

ON THE ORIGIN OF ION-INDUCED AUGER ELECTRON EMISSION FROM METALS.DE LESEGNO PV; RIVAIS G; HENNEQUIN JF et al.1974; PHYS. LETTERS, A; NETHERL.; DA. 1974; VOL. 49; NO 3; PP. 265-266; BIBL. 7 REF.Article

Multielectron spectroscopy : The xenon 4d hole double auger decayPENENT, F; PALAUDOUX, J; LABLANQUIE, P et al.Physical review letters. 2005, Vol 95, Num 8, issn 0031-9007, 083002-1-083002-4Article

Study of ion desorption induced by core-level excitations of condensed Si(CH₃)₄ by using photoelectron-photoion coincidence spectroscopy (PEPICO) combined with synchrotron radiationMASE, K; NAGASONO, M; TANAKA, S.-I et al.Surface science. 1997, Vol 377-79, pp 376-379, issn 0039-6028Conference Paper