Pascal and Francis Bibliographic Databases


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Results 1 to 25 of 3646

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Discharge Ignition Near a DielectricSOBOTA, Ana; VAN VELDHUIZEN, Eddie M; STOFFELS, Winfred W et al.IEEE transactions on plasma science. 2008, Vol 36, Num 4, pp 912-913, issn 0093-3813, 2 p., 1Article

Mechanismen der Blasenbildung in Anstrichfilmen auf Metall = Cloquage des peintures sur métal = Blistering of coatings on metalLAMPE, K; HANSEN, C. M.Farbe + Lack. 1984, Vol 90, Num 6, pp 464-468, issn 0014-7699Article

The breakdown strength of two-layer dielectricsLEBEDEV, S. M; GEFLE, O. S; POKHOLKOV, Yu. P et al.IEE conference publication. 1999, pp 4.304.P2-4.307.P2, issn 0537-9989, isbn 0-85296-719-5Conference Paper

An analysis of air breakdown in electrostatic recordingKIMURA, M; NAKAJIMA, J; MATSUDA, T et al.IEEE transactions on industry applications. 1984, Vol 20, Num 4, pp 869-872, issn 0093-9994Conference Paper

Points lumineux et disruption dans la structure des transistors à base de GaAsKERNER, B. S; KOZLOV, N. A; NECHAEV, A. M et al.Fizika i tehnika poluprovodnikov. 1983, Vol 17, Num 11, pp 1931-1934, issn 0015-3222Article

High-voltage constraints for vacuum packaged microstructuresWILSON, Chester G; GIANCHANDANI, Yogesh B; WENDT, Amy E et al.Journal of microelectromechanical systems. 2003, Vol 12, Num 6, pp 835-839, issn 1057-7157, 5 p.Article

Weibull statistical analysis of area effect on the breakdown strength in polymer filmsUL-HAQ, Saeed; GOVINDA RAJU, G. R.CEIDP : conference on electrical insulation and dielectric phenomena. 2002, pp 518-521, isbn 0-7803-7502-5, 4 p.Conference Paper

Etude de la disruption électrique de l'oxyde de tantale non cristallinLALEHKO, V. A; SHMIDT, T. V.Fizika tverdogo tela. 1989, Vol 31, Num 2, pp 187-192, issn 0367-3294Article

Breakdown of the quantum Hall effect due to electron heatingKOMIYAMA, S; TAKAMASU, T; MIYAMIZU, S et al.Solid state communications. 1985, Vol 54, Num 6, pp 479-484, issn 0038-1098Article

On the behaviour of insulations with interfaces in medium voltage cable accessories-model investigationsLAMBRECHT, J; PILLING, J; BARSCH, R et al.IEE conference publication. 1999, pp 4.14.S17-4.17.S17, issn 0537-9989, isbn 0-85296-719-5Conference Paper

Ectons and their role in electrical discharges in vacuum and gasesMESYATS, G. A.Journal de physique. IV. 1997, Vol 7, Num 4, pp C4.93-C4.112, issn 1155-4339Conference Paper

Analysis of the limiter erosion in T-3M tokamakBARATOV, D. G; DEMYANENKO, V. N; ZELENOV, E. V et al.IEEE transactions on plasma science. 1985, Vol 13, Num 5, pp 331-333, issn 0093-3813Article

Dependence of breakdown voltage on the junction curvature in concentration profiled diodesGHATOL, A. A; SUNDARSINGH, V. P.Microelectronics. 1984, Vol 15, Num 6, pp 5-14, issn 0026-2692Article

Micro-décharges thermostimulées dans le polyéthylène après une application d'une tension électrique à basse températureKERIMOV, M. K; SULEJ MANOV, B. A; GEZALOV, KH. B et al.Žurnal tehničeskoj fiziki. 1984, Vol 54, Num 7, pp 1407-1408, issn 0044-4642Article

Memory curves in the rare gasesPEJOVIC, M. M; MIJOVIC, B. J; BOSAN, D. A et al.Journal of physics. D, Applied physics (Print). 1983, Vol 16, Num 8, pp L149-L151, issn 0022-3727Article

Gas discharges studies in Japan and some of my own researchesTAKEDA, S.Journal de physique. IV. 1997, Vol 7, Num 4, pp C4.133-C4.139, issn 1155-4339Conference Paper

Temperature acceleration of time-dependent dielectric breakdownREZA MOAZZAMI; LEE, J. C; CHENMING HU et al.I.E.E.E. transactions on electron devices. 1989, Vol 36, Num 11, pp 2462-2465, issn 0018-9383, 4 p., 1Article

Reduced ground bounce and improved latch-up suppression through substrate conductionGABARA, T.IEEE journal of solid-state circuits. 1988, Vol 23, Num 5, pp 1224-1232, issn 0018-9200Article

Major disruptions of low aspect ratio tokamak plasmas caused by thermal instabilityROBERTS, D. E; DE VILLIERS, J. A. M; FLETCHER, J. D et al.Nuclear fusion. 1986, Vol 26, Num 6, pp 785-796, issn 0029-5515Article

A proposed planar junction structure with near-ideal breakdown characteristicsAHMAD, S; AKHTAR, J.IEEE electron device letters. 1985, Vol 6, Num 9, pp 465-467, issn 0741-3106Article

A study of electrical ageing of cross-linked polyethylene by dielectric spectroscopySCARPA, P. C. N; LEGUENZA, E. L; DAS-GUPTA, D. K et al.International symposium on electrets. 1999, pp 395-398, isbn 0-7803-5025-1Conference Paper

Profile effect on surface flashover in a uniform fieldALLEN, N. L; MIKROPOULOS, P. N.IEE conference publication. 1999, pp 3.216.P3-3.219.P3, issn 0537-9989, isbn 0-85296-719-5Conference Paper

On the failure mechanisms of titanium nitride/titanium silicide barrier contacts under high current stressKUAN-YU FU; PYLE, R. E.I.E.E.E. transactions on electron devices. 1988, Vol 35, Num 12, pp 2151-2159, issn 0018-9383Article

Measurement of current penetration during PDX discharge startupMEYERHOFER, D. D; GOLDSTON, R. J; KAITA, R et al.Nuclear fusion. 1985, Vol 25, Num 3, pp 321-333, issn 0029-5515Article

Breakdown voltages of ion-implanted junctionsMEYERS, D. C; KWONG, D. L.Journal of applied physics. 1985, Vol 57, Num 12, pp 5380-5385, issn 0021-8979Article

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