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Four-probe resistance measurements of nickel wires written with a scanning tunneling microscope/scanning electron microscope systemEHRICHS, E. E; SMITH, W. F; DE LOZANNE, A. L et al.Ultramicroscopy. 1992, Vol 42-44, Num B, pp 1438-1442, issn 0304-3991Conference Paper

Overview of stamped electronic contactsSEIDLER, J.Electri.onics. 1985, Vol 31, Num 12, pp 55-57, issn 0745-4309Article

A field study of connector reliabilityYAGER, T. A; NIXON, K.IEEE transactions on components, hybrids, and manufacturing technology. 1984, Vol 7, Num 4, pp 370-377, issn 0148-6411Conference Paper

Connections and terminations reference glossaryElectri.onics. 1985, Vol 31, Num 11, pp 57-72, issn 0745-4309Article

Simplifying microelectronic assembly with precision metal stanyingsRETTBERG, P.Electri.onics. 1983, Vol 29, Num 9, pp 59-61, issn 0745-4309Article

A COMPARATIVE STUDY OF INHIBITED LUBRICANTS FOR DRY CIRCUIT SLIDING CONTACTSSTEENSTRUP RV; FIACCO VM; SCHULTZ LK et al.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 1; PP. 37-44; BIBL. 5 REF.Article

A STUDY OF SOME FACTORS INFLUENCING THE WEAR RESISTANCE OF LUBRICATED GOLD CONTACTSLILJESTRAND LG.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 1; PP. 108-114; BIBL. 9 REF.Article

ASPECTS OF ACCELERATED AGING TESTS USED IN CONNECTORS AND TERMINALS FOR THE U.K. EXTERNAL TELEPHONE NETWORKWILTSHIRE B.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 1; PP. 21-27; BIBL. 7 REF.Article

EXTRANEOUS METAL DEPOSITS FROM PRODUCTION PROCESSES ON CONTACT MATERIALSHAQUE CA; DROZDOWICZ MH; FRANK RA et al.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 1; PP. 55-60; BIBL. 9 REF.Article

SLIDING WEAR OF INLAY CLAD METALS AND ELECTRODEPOSITED COBALT-GOLDANTLER M; RATLIFF ET.1983; IEEE TRANSACTIONS ON COMPONENTS, HYBRIDS, AND MANUFACTURING TECHNOLOLGY; ISSN 0148-6411; USA; DA. 1983; VOL. 6; NO 1; PP. 3-7; BIBL. 16 REF.Article

Une étude numérique des connexions cryoélectriquesDAN'KO, V. G; GRINCHENKO, N. G; RUDMAN, I. KH et al.Elektromehanika. 1985, Num 9, pp 121-125, issn 0136-3360Article

Guidelines for the use of flat cable and IDC connectorsCHASSE, R.Electri.onics. 1984, Vol 30, Num 1, pp 53-54, issn 0745-4309Article

dc and ac behaviour of a normal joint in a superconducting cableDE REUVER, J. L; TEN KATE, H. H. J; KNOOPERS, H. G et al.Cryogenics (Guildford). 1984, Vol 24, Num 5, pp 251-256, issn 0011-2275Article

Surface mounting and fine line boards. IMANKO, H. H.Electri.onics. 1984, Vol 30, Num 10, pp 25-27, issn 0745-4309Article

Global wiring by simulated annealingVECCHI, M. P; KIRKPATRICK, S.IEEE transactions on computer-aided design of integrated circuits and systems. 1983, Vol CAD.2, Num 4, pp 215-222, issn 0278-0070Article

Wire and cable fundamentalsElectri.onics. 1983, Vol 29, Num 13, pp 46-81, issn 0745-4309Article

Overview of discrete wiring techniques for PWB prototype and production applicationsJOHNSON, K; O'LOUGHLIN, M; BARTOS, S et al.Electri.onics. 1986, Vol 32, Num 7, pp 20-27, issn 0745-4309Article

Printed circuit fabrication and assembly glossaryElectri.onics. 1985, Vol 31, Num 2, pp 64-114, issn 0745-4309, 31 p.Article

Wire and cable glossaryElectri.onics. 1985, Vol 31, Num 13, pp 45-56, issn 0745-4309Article

Implantation automatisée de circuits intégrés = Automatic layant of integrated circuitsSAUCIER, G.Onde électrique. 1985, Vol 65, Num 6, pp 69-84, issn 0030-2430Article

Design criteria for high voltage leads for superconducting power systemsGERHOLD, J.Cryogenics (Guildford). 1984, Vol 24, Num 2, pp 73-82, issn 0011-2275Article

Fine lines in a three dimensional interconnectSCARLETT, J. A.Electrocomponent science and technology. 1984, Vol 11, Num 2, pp 109-115, issn 0305-3091Article

La connexion des câbles souples par compressionNEONET, E. P; BRONIN, S. V; SKACHKOV, V. V et al.Èlektrotehnika (Moskva, 1963). 1984, Num 4, pp 39-40, issn 0013-5860Article

Current leads for use in cryogenic devices. Principle of design and formulae for design calculationsBUYANOV, YU. L.Cryogenics (Guildford). 1985, Vol 25, Num 2, pp 94-110, issn 0011-2275Article

What to do about pinholes in plated through hole connectionsTURNER, R. L.Electri.onics. 1985, Vol 31, Num 4, pp 53-55, issn 0745-4309Article

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