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Results 1 to 25 of 3768

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The ISL Rapid Fire Railgun Project RAFIRA-Part II: First ResultsSCHNEIDER, M; WOETZEL, M; WENNING, W et al.IEEE transactions on magnetics. 2009, Vol 45, Num 1, pp 448-452, issn 0018-9464, 5 p., 2Conference Paper

Novel preparation methods of electrical contacts in Ge-Sb-Te thin filmsMAHMOUD, Saleh T; GHAMLOUCHE, H; QAMHIEH, N et al.Applied surface science. 2007, Vol 253, Num 17, pp 7242-7245, issn 0169-4332, 4 p.Article

A Mortar Cell Method for Electro-Thermal Contact ProblemsALOTTO, P; GUARNIERI, M; MORO, F et al.IEEE transactions on magnetics. 2013, Vol 49, Num 2, pp 795-798, issn 0018-9464, 4 p., 2Conference Paper

An experimental equatinn for dependence of duration of breaking arcs on supply voltage with constant circuit resistance : Recent Development of Electro-Mechanical DevicesSEKIKAWA, Junya; KUBONO, Takayoshi.IEICE transactions on electronics. 2005, Vol 88, Num 8, pp 1584-1589, issn 0916-8524, 6 p.Conference Paper

A study of break-in film development with different piston ring coatings and correlation with electrical contact resistance measurementsTUNG, Simon C; HONG GAO.Lubrication engineering. 2003, Vol 59, Num 9, pp 20-25, issn 0024-7154, 6 p.Article

SCHOTTKY BARRIER HEIGHT VARIATION WITH METALLURGICAL REACTIONS IN ALUMINIUM-TITANIUM-GALLIUM ARSENIDE CONTACTSWADA Y; CHINO KI.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 559-564; BIBL. 13 REF.Article

THE CHARACTERISTICS OF AU-GE-BASED OHMIC CONTACTS TO N-GAAS INCLUDING THE EFFECTS OF AGINGMARLOW GS; DAS MB; TONGSON L et al.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 4; PP. 259-266; 7 P.; BIBL. 17 REF.Article

THE EFFECT OF BUILT-IN DRIFT FIELD AND EMITTER RECOMBINATIONS ON FCVD OF A P-N JUNCTION DIODEJAIN SC; RAY VC.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 515-523; BIBL. 18 REF.Article

EFFECT OF GETTERING ON LEAKAGE CURRENT IN SHALLOW JUNCTIONSGHEZZO M; GILDENBLAT G; COHEN SS et al.1983; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1983; VOL. 42; NO 6; PP. 519-521; BIBL. 3 REF.Article

RESISTANCE INCREASE IN SMALL-AREA SI-DOPED AL-N-SI CONTACTSMORI M.1983; IEEE TRANSACTIONS ON ELECTRON DEVICES; ISSN 0018-9383; USA; DA. 1983; VOL. 30; NO 2; PP. 81-86; BIBL. 13 REF.Article

SCHOTTKY BARRIER MEASUREMENTS ON P-TYPE IN0,53)GA0,47)ASVETERAN JL; MULLIN DP; ELDER DI et al.1982; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1982; VOL. 97; NO 2; PP. 187-190; BIBL. 9 REF.Article

Tribological problems on electrical contactsMYSHKIN, N. K.Tribology international. 1991, Vol 24, Num 1, pp 45-49, issn 0301-679XArticle

Make and break properties of electrodepositsGROSSMANN, H; HUCK, M; SCHAUDT, G et al.IEEE transactions on components, hybrids, and manufacturing technology. 1985, Vol 8, Num 1, pp 70-79, issn 0148-6411Article

Overview of stamped electronic contactsSEIDLER, J.Electri.onics. 1985, Vol 31, Num 12, pp 55-57, issn 0745-4309Article

MICROSCOPIC INVESTIGATIONS OF SEMICONDUCTOR INTERFACESMARGARITONDO G.1983; SOLID-STATE ELECTRONICS; ISSN 0038-1101; GBR; DA. 1983; VOL. 26; NO 6; PP. 499-513; BIBL. 84 REF.Article

Electric contacts, Paris, 1988, June 20-24International conference on electric contacts. 14. 1988, VI-448 pConference Proceedings

Determination of potential at the beveled interface between two materialsLE HELLEY, M; CHANTE, J. P.Solid-state electronics. 1984, Vol 27, Num 12, pp 1123-1125, issn 0038-1101Article

AN ACCURATE SCALAR POTENTIAL FINITE ELEMENT METHOD FOR LINEAR, TWO-DIMENSIONAL MAGNETOSTATICS PROBLEMSMCDANIEL TW; FERNANDEZ RB; ROOT RR et al.1983; INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING; ISSN 0029-5981; GBR; DA. 1983; VOL. 19; NO 5; PP. 725-737; BIBL. 10 REF.Article

Laser cladding of copper with molybdenum for wear resistance enhancement in electrical contactsNG, K. W; MAN, H. C; CHENG, F. T et al.Applied surface science. 2007, Vol 253, Num 14, pp 6236-6241, issn 0169-4332, 6 p.Article

Design and fabrication of a magnetic bi-stable electromagnetic MEMS relaySHI FU; GUIFU DING; HONG WANG et al.Microelectronics journal. 2007, Vol 38, Num 4-5, pp 556-563, issn 0959-8324, 8 p.Article

Hygrothermal stability of electrical contacts made from silver and graphite electrically conductive pastesSHOUKAI WANG; PANG, Dick S; CHUNG, D. D. L et al.Journal of electronic materials. 2007, Vol 36, Num 1, pp 65-74, issn 0361-5235, 10 p.Article

Short-circuit transmission line method for PIM evaluation of metallic materialsYAMAMOTO, Yasuyuki; KUGA, Nobuhiro.IEEE transactions on electromagnetic compatibility. 2007, Vol 49, Num 3, pp 682-688, issn 0018-9375, 7 p.Article

Electrical contacts between carbon-nanotube coated electrodesTZENG, Y; CHEN, Y; LIU, C et al.Diamond and related materials. 2003, Vol 12, Num 3-7, pp 774-779, issn 0925-9635, 6 p.Conference Paper

Wear-Insensitive Sidewall Microprobe with Long-Term Stable Performance for Scanning Probe Microscopy LithographyYONG FANG LI; SUGIYAMA, Masakazu; FUJITA, Hiroyuki et al.Journal of microelectromechanical systems. 2013, Vol 22, Num 4, pp 901-908, issn 1057-7157, 8 p.Article

An Investigation of Electrical Contacts for Higher Manganese SilicideXINGHUA SHI; ZAMANIPOUR, Zahra; KRASINSKI, Jerzy S et al.Journal of electronic materials. 2012, Vol 41, Num 9, pp 2331-2337, issn 0361-5235, 7 p.Article

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