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Results 1 to 25 of 812660

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Quantitative interpretation of the low-loss electron signalPRATT, A; MATTHEW, J. A. D; EL-GOMATI, M et al.Surface science. 2007, Vol 601, Num 8, pp 1804-1812, issn 0039-6028, 9 p.Article

Zone specificity in low energy electron stimulated desorption of Cl+ from reconstructed Si(111)-7 × 7:C1 surfacesOH, Doogie; SIEGER, Matthew T; ORLANDO, Thomas M et al.Surface science. 2006, Vol 600, Num 19, issn 0039-6028, L245-L249Article

Electron beam deposition for nanofabrication: Insights from surface scienceWNUK, J. D; ROSENBERG, S. G; GORHAM, J. M et al.Surface science. 2011, Vol 605, Num 3-4, pp 257-266, issn 0039-6028, 10 p.Article

Direct low-energy electron beam nanolithographyARONOV, Daniel; ROSENMAN, Gil.Surface science. 2009, Vol 603, Num 16, pp 2430-2433, issn 0039-6028, 4 p.Article

Self-modulation of an intense relativistic electron beamFRIEDMAN, M; SERLIN, V; DROBOT, A et al.Journal of applied physics. 1984, Vol 56, Num 9, pp 2459-2474, issn 0021-8979Article

Electron-electron interactions in finely focused beams of low energy electronsYAU, Y. W; PEASE, R. F. W; GROVES, T. R et al.Journal of the Electrochemical Society. 1984, Vol 131, Num 4, pp 894-896, issn 0013-4651Conference Paper

Warm relativistic electron fluid. II: Small-m/e limitNEWCOMB, W. A.The Physics of fluids. 1986, Vol 29, Num 3, pp 881-882, issn 0031-9171Article

Aufbau einer Anlage zur Energieverlustanalyse schneller Elektronen = Construction d'un appareil d'analyse des pertes d'énergie d'électrons rapides = Construction of a device for energy loss analysis of fast electronsKUBIER, B; BOUDRIOT, H.Experimentelle Technik der Physik. 1983, Vol 31, Num 3, pp 245-250, issn 0014-4924Article

Construction of a telefocus gun for gas electron diffraction experimentsTAGUCHI, M; IIJIMA, T.Japanese journal of applied physics. 1984, Vol 23, Num 7, pp 921-924, issn 0021-4922, 1Article

Les nouvelles sources d'électrons = New electron sourcesImages de la physique. 2002, pp 23-28, issn 0290-0041, 6 p.Article

Instabilité de faisceaux électroniques relativistes tubulaires, forte intensitéOVSYANNIKOVA, O. B; KAMENETS, F. F; LEJMAN, V. G et al.Radiotehnika i èlektronika. 1984, Vol 29, Num 10, pp 1985-1993, issn 0033-8494Article

Electronic environment for a field emission gun in electron microscopyPINNA, H; LIANG, K; DENIZART, M et al.Revue de physique appliquée. 1983, Vol 18, Num 10, pp 659-665, issn 0035-1687Article

Influence du champ magnétique propre d'un faisceau électronique sur la température des électrons secondairesZHARINOV, A. V; TOSUNYAN, G. A; CHIKHACHEV, A. S et al.Fizika plazmy (Moskva, 1975). 1985, Vol 11, Num 7, pp 810-814, issn 0134-5052Article

A comparison of two-particle models for conduction electron scattering on hydrogen-like impurity ions in non-degenerate semiconductorsPOKLONSKI, N. A; KOCHERZHENKO, A. A; VYRKO, S. A et al.Physica status solidi. B. Basic research. 2007, Vol 244, Num 10, pp 3703-3710, issn 0370-1972, 8 p.Article

Electron-optical properties of electrostatic immersion objectivePOTAPKIN, O. D.SPIE proceedings series. 2000, pp 24-27, isbn 0-8194-3850-2Conference Paper

Investigation of electron emission from glass surface subjected to intensive electron beamFILACHEV, A. M; FOUKS, B. I; GREENFIELD, D. E et al.SPIE proceedings series. 1999, pp 186-194, isbn 0-8194-3305-5Conference Paper

The effect of non-isoplanatism in micrographs taken with an electron microscope equipped with a field emission gunHANSZEN, K.-J; LAUER, R; ADE, G et al.Ultramicroscopy. 1985, Vol 16, Num 1, pp 47-57, issn 0304-3991Article

A compact cylindrical Mott electron polarimeter operating with accelerating voltage in the range 20-100 kVCAMPBELL, D. M; HERMANN, C; LAMPEL, G et al.Journal of physics. E. Scientific instruments. 1985, Vol 18, Num 8, pp 664-672, issn 0022-3735Article

Testing of detector strategies in scanning electron microscopy by isodensitiesLANGE, M; REIMER, L; TOLLKAMP, C et al.Journal of microscopy (Print). 1984, Vol 134, Num 1, pp 1-12, issn 0022-2720Article

Hairpin-filament electron guns for low-energy useBOESTEN, L; OKADA, K.Measurement science & technology (Print). 2000, Vol 11, Num 5, pp 576-583, issn 0957-0233Article

High-voltage, glow-discharge electron sources and possibilities of its application in industry for realizing different technological operationsDENBNOVETSKY, Stanislav V; MELNYK, Vitaliy G; MELNYK, Igor V et al.IEEE transactions on plasma science. 2003, Vol 31, Num 5, pp 987-993, issn 0093-3813, 7 p., 1Article

Evolution kinetics of sp2 ordering in tetrahedral amorphous carbon films induced by electron irradiationLIANG, S; YAJIMA, A; ABE, S et al.Surface science. 2005, Vol 593, Num 1-3, pp 161-167, issn 0039-6028, 7 p.Conference Paper

Reminiscence on a long successful cooperationKASPER, Erwin.Ultramicroscopy. 2002, Vol 93, Num 3-4, pp 245-246, issn 0304-3991, 2 p.Article

Discussing the Study of High Tc Properties of Superconductors with Electron Paramagnetic Resonance (EPR) SpectrometersSHALTIEL, D.Journal of superconductivity and novel magnetism. 2013, Vol 26, Num 10, pp 3005-3008, issn 1557-1939, 4 p.Article

Comparative study of electronically induced desorption from pre-irradiated solid Ar and Ar excited with an electron beamSAVCHENKO, E. V; GUMENCHUK, G. B; KHYZHNIY, I. V et al.Surface science. 2008, Vol 602, Num 20, pp 3204-3207, issn 0039-6028, 4 p.Conference Paper

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