ct.\*:("Electron, ion, and scanning probe microscopy")
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Atomic-resolution spectroscopic imaging of oxide interfacesFITTING KOURKOUTIS, L; XIN, H. L; HIGUCHI, T et al.Philosophical magazine (2003. Print). 2010, Vol 90, Num 35-36, pp 4731-4749, issn 1478-6435, 19 p.Conference Paper
Crystalline Water at Room Temperature : Under Water and in AirSOMMER, Andrei P; DAN ZHU; FÖSTERLING, Horst-Dieter et al.Crystal growth & design. 2008, Vol 8, Num 8, pp 2620-2622, issn 1528-7483, 3 p.Article
Stress of needle specimen on the three-dimensional atom probe (3DAP)MAYAMA, N; YAMASHITA, C; KAITO, T et al.Surface and interface analysis. 2008, Vol 40, Num 13, pp 1610-1613, issn 0142-2421, 4 p.Conference Paper
Ellipsometer analysis in the n-k planeBARTON, D; URBAN, F. K.Thin solid films. 2007, Vol 516, Num 2-4, pp 119-127, issn 0040-6090, 9 p.Conference Paper
Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphiteHEMBACHER, S; GIESSIBL, F. J; MANNHART, J et al.Physical review letters. 2005, Vol 94, Num 5, pp 056101.1-056101.4, issn 0031-9007Article
Entwicklung eines Präparationsverfahrens für multikristalline Silizium-Wafer = Developing a preparation technique for multicrystalline silicon wafersSCHABERGER-ZIMMERMANN, E; SCHWEIZER, S; APEL, M et al.Praktische Metallographie. 2003, Vol 40, Num 9, pp 443-453, issn 0032-678X, 11 p.Article
Comparative TEM study of bonded silicon/silicon interfaces fabricated by hydrophilic, hydrophobic and UHV wafer bondingREZNICEK, A; SCHOLZ, R; SENZ, S et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 277-280, issn 0254-0584, 4 p.Conference Paper
Electron diffraction and HRTEM studies of multiply-twinned structures and dynamical events in metal nanoparticles: facts and artefactsBUFFAT, P. A.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 368-375, issn 0254-0584, 8 p.Conference Paper
HREM study of different martensitic phases in Ni-Mn-Ga alloysPONS, J; SANTAMARTA, R; CHERNENKO, V. A et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 457-459, issn 0254-0584, 3 p.Conference Paper
Generation of dislocations during plastic deformationMESSERSCHMIDT, U; BARTSCH, M.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 518-523, issn 0254-0584, 6 p.Conference Paper
SEM observations of particle track membrane surfaces modificated using plasma treatmentSARTOWSKA, B; BUCZKOWSKI, M; STAROSTA, W et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 352-355, issn 0254-0584, 4 p.Conference Paper
SiO2-supported Pt particles studied by electron microscopyWANG, D; PENNER, S; SU, D. S et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 341-344, issn 0254-0584, 4 p.Conference Paper
TEM analysis of fine sulphides dissolution and precipitation in steelGARBARZ, B; MARCISZ, J; WOJTAS, J et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 486-489, issn 0254-0584, 4 p.Conference Paper
TEM examination of the effect of titanium on the Al/C interface structureSOBCZAK, N; SOBCZAK, J; SEAL, S et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 319-322, issn 0254-0584, 4 p.Conference Paper
TEM in situ annealing of severely deformed Ni3Al intermetallic compoundZIELINSKI, W; PAKIEŁA, Z; KURZYDLOWSKI, K. J et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 452-456, issn 0254-0584, 5 p.Conference Paper
Transmission electron microscopy analysis of computer hard disc, magnetic thin filmsRISNER, J; KWON, U; PARK, D. W et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 241-243, issn 0254-0584, 3 p.Conference Paper
Real-space dynamical simulation for electron microdiffraction effectsDU, K; WANG, Y. M; YE, H. Q et al.Ultramicroscopy. 1999, Vol 80, Num 2, pp 99-107, issn 0304-3991Article
Chemical-bond analysis of nanostructured materials using near-edge fine structures (ELNES)SCHNEIDER, R.Fresenius' journal of analytical chemistry. 1998, Vol 361, Num 6-7, pp 527-531, issn 0937-0633Conference Paper
Confocal analysis of microstructures and micromaterialsKUNATH-FANDREI, Gerald.GIT laboratory journal Europe. 2003, Vol 7, Num 4, pp 198-199, issn 1611-6038, 2 p.Article
Ordering of the β phase in TiNiCu and TiNiCuMn melt spun ribbons studied with the ALCHEMI techniqueMORGIEL, J.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 230-232, issn 0254-0584, 3 p.Conference Paper
Microstructure and nanochemistry of Ca-doped cobalt oxide single crystalsKUSINSKI, J; PETOT-ERVAS, G; PETOT, C et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 308-311, issn 0254-0584, 4 p.Conference Paper
Microstructure and phase composition of ZrO2-MgO structural ceramic after high-temperature deformationCZEPPE, T; ZIEBA, P; BALIGA, W et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 312-314, issn 0254-0584, 3 p.Conference Paper
Ceramic-metal composites with an interpenetrating networkKONOPKA, K; OLSZOWKA-MYALSKA, A; SZAFRAN, M et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 329-332, issn 0254-0584, 4 p.Conference Paper
Electron microscopy investigations of the cBN-Ti compound compositesBENKO, E; KLIMCZYK, P; MORGIEL, J et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 336-340, issn 0254-0584, 5 p.Conference Paper
Antiphase boundaries in Ni3Al ordered intermetallic-application of the CBED methodJEZIERSKA, E; MORNIROLI, J. P.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 443-447, issn 0254-0584, 5 p.Conference Paper