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Results 1 to 25 of 18605

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An electron microscopy study of exsolved phases in natural black Australian sapphire = Etude par microscopie électronique des phases d'exsolution dans du saphir noir naturel australienMOON, A. R; PHILLIPS, M. R.Micron and microscopica acta. 1984, Vol 15, Num 3, pp 143-146, issn 0739-6260Article

Assessing the Power of Electron Back Scattering Diffraction Characterization of Deformed F-138 Steel from the View Point of Crystal Diffraction = Beurteilung des Leistungsvermögens der Charakterisierung von verformten Stahl F-138 durch Rückstreuelektronenbeugung unter dem Gesichtspunkt der KristallbeugungBOLMARO, Raúl E; AVALOS, Martina C; DE VINCENTIS, Natalia S et al.Praktische Metallographie. 2014, Vol 51, Num 9, pp 634-655, issn 0032-678X, 22 p.Article

Growth of epitaxial Bi-films on vicinal Si(111)LÜKERMANN, D; BANYOUDEH, S; BRAND, C et al.Surface science. 2014, Vol 621, pp 82-87, issn 0039-6028, 6 p.Article

Textures in natural pyrolusite, β-MnO2, examined by 1 MV HRTEM = Textures de pyrolusite naturelle, β-MnO2 étudiées par microscopie électronique à transmission haute résolution 1MVYAMADA, N; OHMASA, M; HORIUCHI, S et al.Acta crystallographica. Section B, Structural science. 1986, Vol 42, Num 1, pp 58-61, issn 0108-7681Article

Das Prinzip der Kristallstruktur von Gyrolith Ca13[Si8O20]3 (OH)2•∼22H2O = Principe de la structure cristalline de la gyrolithe Ca13 (Si8O20)3 (OH)2•~22H2OEBERHARD, E; RAHMAN, S. H.Zeitschrift für Kristallographie. 1982, Vol 159, Num 1-4, pp 34-36, issn 0044-2968Article

Composite precipitates in a commercial Al-Li-Cu-Mg-Zr alloyTERRONES, Luis Augusto H; NEVES MONTEIRO, Sergio.Materials characterization. 2007, Vol 58, Num 2, pp 156-161, issn 1044-5803, 6 p.Article

Transmission electron microscopy investigation of acicular ferrite precipitation in γ'-Fe4N nitrideXIONG, X. C; REDJAÏMIA, A; GOUNE, M et al.Materials characterization. 2010, Vol 61, Num 11, pp 1245-1251, issn 1044-5803, 7 p.Article

Collecting 3D electron diffraction data by the rotation methodDALIANG ZHANG; OLEYNIKOV, Peter; HOVMÖLLER, Sven et al.Zeitschrift für Kristallographie. 2010, Vol 225, Num 2-3, pp 94-102, issn 0044-2968, 9 p.Article

Conductance of Pb on modified Si(3 3 5) vicinal surfaceKORCZAK, Z; KWAPINSKI, T; MAZUREK, P et al.Surface science. 2010, Vol 604, Num 1, pp 54-58, issn 0039-6028, 5 p.Article

Structural analysis of the electron diffraction patterns of corundum ceramic material (α-Al2O3) = Analyse de la structure des réseaux de diffraction électronique du corindon (α-Al2O3), matériau céramiqueABD-RABO, M; TOMA, S. A; IBRAHIM, M et al.Sprechsaal (1976). 1984, Vol 117, Num 12, pp 1134-1136, issn 0341-0676Article

A semiautomated electron backscatter diffraction technique for extracting reliable twin statisticsHENRIE, B. L; MASON, T. A; HANSEN, B. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2004, Vol 35, Num 12, pp 3745-3751, issn 1073-5623, 7 p.Article

Gefügecharakterisierung mehrphasiger Werkstoffe mittels EBSD = Characterizing the microstructure of multiphase materials using EBSDDÜBER, Olaf; KÜNKLER, Boris; KRUPP, Ulrich et al.Praktische Metallographie. 2006, Vol 43, Num 2, pp 88-102, issn 0032-678X, 15 p.Article

Determination of a mean orientation in electron backscatter diffraction measurementsCHO, Jae-Hyung; ROLLETT, A. D; OH, K. H et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2005, Vol 36, Num 12, pp 3427-3438, issn 1073-5623, 12 p.Article

Nanosecond time resolved electron diffraction studies of the α→β in pure Ti thin films using the dynamic transmission electron microscope (DTEM)LAGRANGE, Thomas; CAMPBELL, Geoffrey H; COLVIN, Jeffrey D et al.Journal of materials science. 2006, Vol 41, Num 14, pp 4440-4444, issn 0022-2461, 5 p.Conference Paper

Quantitative electron diffraction : new features in the program system ELDXIAODONG ZOU; SUKHAREV, Y; HOVMÖLLER, S et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 436-444, issn 0304-3991Conference Paper

EBSD-Gefügeuntersuchungen an Aluminiummatrix-Verbundwerkstoffen = EBSD-Microstructural Investigations on Aluminium Matrix Composite MaterialsHEIMANN, Sebastian; KNYAZEVA, Marina; POHL, Michael et al.Praktische Metallographie. 2010, Vol 47, Num 11, pp 640-653, issn 0032-678X, 14 p.Article

A Parametric Study of Electron Backscatter Diffraction based Grain Size Measurements = Eine Parameterstudie zu Korngrössenmessungen mittels Electron Backscatter DiffractionWRIGHT, Stuart I.Praktische Metallographie. 2010, Vol 47, Num 1, pp 16-33, issn 0032-678X, 18 p.Article

Higher-order Laue-zone diffraction patterns obtained by a hollow-cone electron beamTANAKA, M; TAKAYOSHI, H; TERAUCHI, M et al.Journal of electron microscopy. 1984, Vol 33, Num 3, pp 195-202, issn 0022-0744Article

Metallographic Specimen Preparation for Electron Backscattered Diffraction = Metallographische Probenpraparation zur RückstreuelektronenbeugungVANDER VOORT, George F.Praktische Metallographie. 2011, Vol 48, Num 10, pp 527-543, issn 0032-678X, 17 p.Article

Metallographic Specimen Preparation for Electron Backscattered Diffraction Part IVANDER VOORT, George F.Praktische Metallographie. 2011, Vol 48, Num 9, pp 454-473, issn 0032-678X, 20 p.Article

Implications of EBSD-based Grain Size Measurement on Structure-Property Correlations = Auswirkungen der Korngrössenmessung mit der EBSD auf die Wechselbeziehungen zwischen Struktur und EigenschaftenKRAL, Milo V; DRABBLE, Daniel J. F; GARDINER, Benjamin R et al.Praktische Metallographie. 2009, Vol 46, Num 9, pp 469-482, issn 0032-678X, 14 p.Article

New electron diffraction techniques using electronic hollow-cone illuminationKONDO, Y; ITO, T; HARADA, Y et al.Japanese journal of applied physics. 1984, Vol 23, Num 3, pp L178-L180, issn 0021-4922, 2Article

Radiation tolerance of Mn+1AXn, phases, Ti3AlC2 and Ti3SiC2WHITTLE, K. R; BLACKFORD, M. G; AUGHTERSON, R. D et al.Acta materialia. 2010, Vol 58, Num 13, pp 4362-4368, issn 1359-6454, 7 p.Article

Reconstructions 3 x 3 and √3 x √3 on SiC(0 0 0 1) studied using RHEEDYAKOVLEV, Nikolai; XIE XIANNING; LOH KIAN PING et al.Surface science. 2009, Vol 603, Num 15, pp 2263-2270, issn 0039-6028, 8 p.Article

Electrical conductance at initial stage in epitaxial growth of Pb, Ag, Au and In on modified Si(111) surfaceKORCZAK, Z; KWAPINSKI, T.Surface science. 2007, Vol 601, Num 16, pp 3324-3334, issn 0039-6028, 11 p.Article

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