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Results 1 to 25 of 1469

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Coherent bremsstrahlung in imperfect periodic atomic structuresBELLUCCI, S; MAISHEEV, V. A.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 17, pp 174105.1-174105.13, issn 1098-0121Article

Reflection high-energy positron diffraction study of a Si(001) surfaceHAYASHI, K; FUKAYA, Y; KAWASUSO, A et al.Applied surface science. 2005, Vol 244, Num 1-4, pp 145-148, issn 0169-4332, 4 p.Conference Paper

Electron crystallographyDORSET, Doug L; GILMORE, Chris J.Zeitschrift für Kristallographie. 2003, Vol 218, Num 4, issn 0044-2968, 85 p.Serial Issue

Visual computing in electron crystallographyWAN, Z. H; LIU, Y. D; FU, Z. Q et al.Zeitschrift für Kristallographie. 2003, Vol 218, Num 4, pp 308-315, issn 0044-2968, 8 p.Article

Electron backscattered diffraction analyses combined with environmental scanning electron microscopy : potential applications for non-conducting, uncoated mineralogical samplesHABESCH, S. M.Materials science and technology. 2000, Vol 16, Num 11-12, pp 1393-1398, issn 0267-0836Conference Paper

The effect of thermal vibration on HRTEM images of GaAs and InPHASHIKAWA, N; WATANABE, K; TAKAHASHI, S et al.Physica status solidi. A. Applied research. 1995, Vol 148, Num 2, pp 373-382, issn 0031-8965Article

Computation and measurement of characteristic energy-loss large-angle convergent-beam patterns of molybdenum selenideWEICKENMEIER, A; QUANDT, E; KOHL, H et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 210-219, issn 0304-3991Article

Crystal potential determination by inversion for centrosymmetric crystalsALLEN, L. J; ROSSOUW, C. J.Ultramicroscopy. 1993, Vol 48, Num 3, pp 341-346, issn 0304-3991Article

A dynamic criterion for simulating high-resolution electron microscopy images in the real-space multislice methodZHU XHIXUE; WANG YUANMING; WANG SHAOQING et al.Philosophical magazine letters. 1993, Vol 67, Num 4, pp 293-300, issn 0950-0839Article

Visualization of small ordered domains in a matrix of disordered ferroelectric oxides by electron microscopy structure imagingNIHOUL, G; PISCHEDDA, M. H.Journal of solid state chemistry (Print). 1993, Vol 105, Num 2, pp 469-479, issn 0022-4596Article

On the accurate measurement of structure-factor amplitudes and phases by electron diffractionSPENCE, J. C. H.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 231-260, issn 0108-7673, 2Article

On the sign ambiguity of triplet phases in nonsystematic many-beam effects in CBED patternsMARTHINSEN, K.Acta crystallographica. Section A, Foundations of crystallography. 1993, Vol 49, pp 324-330, issn 0108-7673, 2Article

A density-matrix appraoch to coherence in high-energy electron diffractionWRIGHT, A. G; BIRD, D. M.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 215-221, issn 0108-7673, 2Article

Convergent-beam RHEED calculations of a forbidden reflection from the Si(111) surfaceSMITH, A. E.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 36-41, issn 0108-7673, 1Article

Finite-difference method for the calculation of low-energy-electron diffractionJOLY, Y.Physical review letters. 1992, Vol 68, Num 7, pp 950-953, issn 0031-9007Article

Investigation of surface amorphization of silicon wafers during ion-millingSCHUHRKE, T; MÄNDL, M; ZWECK, J et al.Ultramicroscopy. 1992, Vol 41, Num 4, pp 429-433, issn 0304-3991Article

Quantitative TDS absorption corrections for LACBED patterns from GaP and InAsALLEN, L. J; ROSSOUW, C. J; WRIGHT, A. G et al.Ultramicroscopy. 1992, Vol 40, Num 2, pp 109-119, issn 0304-3991Article

Inversion of convergent-beam electron diffraction patternsBIRD, D. M; SAUNDERS, M.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 555-562, issn 0108-7673, 4Article

Reciprocity in electron diffractionGUNNING, J; GOODMAN, P.Acta crystallographica. Section A, Foundations of crystallography. 1992, Vol 48, pp 591-595, issn 0108-7673, 4Article

High-resolution electron microscopy of quasi-amorphous materialsTIMSIT, R. S; WADDINGTON, W. G; GALLERNEAULT, C et al.Ultramicroscopy. 1992, Vol 45, Num 1, pp 65-76, issn 0304-3991Article

Phason-strain identification for quasicrystals by high-resolution electron microscopyLI, F. H; PAN, G. Z; HUANG, D. X et al.Ultramicroscopy. 1992, Vol 45, Num 3-4, pp 299-305, issn 0304-3991Article

Local probe microscopies as a tool for local surfaces studiesDUFOUR, J. P; DE FORNEL, F; DAVID, T et al.Materials chemistry and physics. 1992, Vol 32, Num 3, pp 267-272, issn 0254-0584Conference Paper

Unified approach for computing interplanar spacing and location of projection of HOLZ reflection onto the ZOLZMAKROCZY, P.Microscopy research and technique. 1992, Vol 21, Num 1, pp 51-52Conference Paper

A study of the breakdown of Friedel's law in electron backscatter Kikuchi diffraction patterns : application to Zincblende-type structuresBABA-KISHI, K. Z.Journal of applied crystallography. 1991, Vol 24, pp 38-47, issn 0021-8898, 10 p., p.1Article

Crystal structure of the mixed compound of Cu(II) with glycine and L-serineD'YAKON, I. A; DONU, S. V; CHAPURINA, L. F et al.Soviet physics. Crystallography. 1991, Vol 36, Num 1, pp 126-128, issn 0038-5638Article

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