Mise à jour du système de contrôle d'une microsonde Auger à balayage PHI 595 = PHI 595 scanning Auger microprobe monitoring system updatingMARCHAL, F; LOUETTE, P; SPORKEN, R et al.Le Vide (1995). 1996, Vol 52, Num 279, pp 103-104, issn 1266-0167Conference Paper

Quantitative methods for the characterization of the Auger peaks of SrTiO₃HORVATH, G.Surface and interface analysis. 1995, Vol 23, Num 4, pp 227-233, issn 0142-2421Article

Desorption of positive and negative ions from SiO₂/Si surfaces by electron excitation of core levelsPETRAVIC, M.Physical review. B, Condensed matter. 1993, Vol 48, Num 4, pp 2627-2631, issn 0163-1829Article

AES and XPS depth profile analysis. A critical reviewMATHIEU, H. J.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 10, 81-91 [12 p.]Conference Paper

Classical trajectories studies of DIET from calcium fluorideCIEPLINSKI, L; JEDRZEJEK, C.Surface science. 1995, Vol 339, Num 3, pp L940-L944, issn 0039-6028Article

Monte Carlo simulation of background in AES : a comparison with experimentDING, Z.-J; NAGATOMI, T; SHIMIZU, R et al.Surface science. 1995, Vol 336, Num 3, pp 397-403, issn 0039-6028Article

Development in Auger depth profiling techniqueMENYHARD, M; KONKOL, A; GERGELY, G et al.Journal of electron spectroscopy and related phenomena. 1994, Vol 68, pp 653-657, issn 0368-2048Conference Paper

Relationship between the C KVV auger line shape and layered structure of graphiteDEMENTJEV, A. P; MASLAKOV, K. I; NAUMKIN, A. V et al.Applied surface science. 2005, Vol 245, Num 1-4, pp 128-134, issn 0169-4332, 7 p.Article

Backscattering correction for AES spectra measured at oblique (>45°) incidence of primary electron beamSHIMOTSUMA, Y; ICHIMURA, S.Surface and interface analysis. 2001, Vol 31, Num 2, pp 102-105, issn 0142-2421Article

The three-step model in electron spectroscopy revisited. I. Angular distribution of Auger electron emission from non-crystalline Al, Si and Cu surfacesWERNER, Wolfgang S. M; TRATNIK, Herbert; BRENNER, Josef et al.Surface science. 2001, Vol 495, Num 1-2, pp 107-119, issn 0039-6028Article

The excitation depth distribution function for Auger electrons created by electron impactJABLONSKI, A; TOUGAARD, S.Surface and interface analysis. 1997, Vol 25, Num 9, pp 688-698, issn 0142-2421Article

AES-XPS : état des lieuxLe Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 136 p.Conference Proceedings

Application of the pattern recognition method to electron spectroscopies (AES and XPS)LESIAK, B.Le Vide (1995). 1996, Vol 52, Num 279, pp 99-102, issn 1266-0167Conference Paper

Intrinsic Auger signal profiles derived by Monte Carlo analysisDING, Z.-J; SHIMIZU, R; GOTO, K et al.Applied surface science. 1996, Vol 100-01, pp 15-19, issn 0169-4332Conference Paper

SA : An Auger spectroscopy quantification programDOUST, T.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, p. 105Conference Paper

Quantification de la spectroscopie Auger dans des études de ségrégation : problèmes posés, solutions et limites = Quantification of Auger spectroscopy in segregation studies: problems, solutions an limitsROLLAND, A.Le Vide (1995). 1996, Vol 52, Num 279, pp 111-113, issn 1266-0167Conference Paper

Effets instrumentaux et normalisation des spectres = Instrumental effects and spectra normalisationLORANG, G.Le Vide (1995). 1996, Vol 52, Num 279, issn 1266-0167, 7, 34-43 [11 p.]Conference Paper

Low-energy Auger electron diffraction: influence of multiple scattering and angular momentumCHASSE, A; NIEBERGALL, L; KUCHERENKO, Yu et al.Surface science. 2002, Vol 501, Num 3, pp 244-252, issn 0039-6028Article

Electron beam induced oxidation of Ni₃Al surfaces: electron flux effectsKOCH, S. A; PALASANTZAS, G; VAN AGTERVELD, D. T. L et al.Surface science. 2002, Vol 507-10, pp 486-491, issn 0039-6028Conference Paper

Absolute energy calibration in Auger electron spectroscopy by using elastically backscattered primary electronsGOTO, K; JIANG, Y. Z; RAHMAN, N. Nissa et al.Surface and interface analysis. 2002, Vol 34, Num 1, pp 211-214, issn 0142-2421Conference Paper

Chemical effects in Auger electron spectra of aluminiumTIMMERMANS, B; VAECK, N; HUBIN, A et al.Surface and interface analysis. 2002, Vol 34, Num 1, pp 356-359, issn 0142-2421Conference Paper

Optimized linear decomposition of data obtained during AES depth profilingKOVAC, J; BOGATAJ, T; ZALAR, A et al.Surface and interface analysis. 2000, Vol 30, Num 1, pp 190-194, issn 0142-2421Conference Paper

High sensitivity of positron-annihilation induced Auger-electron spectroscopy to surface impuritiesOHDAIRA, T; SUZUKI, R; MIKADO, T et al.Applied surface science. 1996, Vol 100-01, pp 73-76, issn 0169-4332Conference Paper

Problèmes posés par l'analyse de matériaux isolants en spectroscopie d'électrons Auger = Problems of isolating material analysis in Auger spectroscopyJARDIN, C; RENOUD, R.Le Vide (1995). 1996, Vol 52, Num 279, pp 106-110, issn 1266-0167Conference Paper

Quantitative correction of backscattering in Auger electron spectroscopy of thin filmsLEVEQUE, G; BONNET, J.Applied surface science. 1995, Vol 89, Num 2, pp 211-219, issn 0169-4332Article