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Results 1 to 25 of 2435

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Persönliche Erinnerungen an das Entstehen des Elektronenmikroskopes und seiner Technik = Personal memories of the birth of the electron microscopes and their techniquesVON ARDENNE, M.Optik (Stuttgart). 1997, Vol 105, Num 4, pp 139-153, issn 0030-4026Article

Köhler illumination in the TEM : fundamentals and advantagesBENNER, G; PROBST, W.Journal of microscopy (Print). 1994, Vol 174, pp 133-142, issn 0022-2720, 3Article

On the aberrations of uniform fieldsCREWE, A. V.Optik (Stuttgart). 1993, Vol 94, Num 4, pp 180-184, issn 0030-4026Article

Number of sampling points required for aberration correction using off-axis electron holographyISHIZUKA, K.Ultramicroscopy. 1994, Vol 53, Num 3, pp 297-303, issn 0304-3991Article

Electron Vortex Beams with High Quanta of Orbital Angular MomentumMCMORRAN, Benjamin J; AGRAWAL, Amit; ANDERSON, Ian M et al.Science (Washington, D.C.). 2011, Vol 331, Num 6014, pp 192-195, issn 0036-8075, 4 p.Article

Variations of typical cold field emission parameters: research of conditions ensuring optimum operational performanceZINZINDOHOUE, P.Optik (Stuttgart). 1994, Vol 97, Num 1, pp 31-33, issn 0030-4026Article

A simple filter system for processing small or transparent specimensCRIBB, B; ZHU, J.Journal of microscopy (Print). 1994, Vol 173, pp 83-86, issn 0022-2720, 1Article

Étude des métaux par microscopie électronique en transmission (MET) : Microscope, échantillons et diffractionKARLIK, Miroslav; JOUFFREY, Bernard.Techniques de l'ingénieur. Matériaux métalliques. 2008, Vol MB1, Num M4134, issn 1762-8733, M4134.1-M4134.16, Doc.M4134.1Article

0.1 nm information limit with the CM30FEG-Special TübingenLICHTE, H; KESSLER, P; LENZ, F et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 575-580, issn 0304-3991Conference Paper

VI - Les détecteurs utilisés dans le microscope électronique à balayageGRILLON, François.École d'été sur la microscopie électronique à balayage et microanalyses. 2008, pp 183-206, isbn 978-2-7598-0082-7, 1Vol, 24 p.Conference Paper

A simple concept for better alignment and simplified operation of a transmission electron microscopeWILBRANDT, P.-J.Ultramicroscopy. 1993, Vol 52, Num 2, pp 193-204, issn 0304-3991Article

The application of watershed segment method in the characterization of 3D-motifWANG SHENEHUAI; XIE TIEBANG.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62801Y.1-62801Y.6, issn 0277-786X, isbn 0-8194-6351-5Conference Paper

Multi-technique application of a double reflection electron emission microscopeGRZELAKOWSKI, K.Surface science. 2000, Vol 454-56, pp 1094-1098, issn 0039-6028Conference Paper

Correction of the spherical aberration of a 200 kV TEM by means of a hexapole-correctorHAIDER, M; BRAUNSHAUSEN, G; SCHWAN, E et al.Optik (Stuttgart). 1995, Vol 99, Num 4, pp 167-179, issn 0030-4026Article

Petrographic composition and geochemical features of the metaanthracites and graphites of the Taimyr coal BasinVYALOV, V. I; KOLOMENSKAYA, V. G.Solid fuel chemistry. 1996, Vol 30, Num 1, pp 1-11, issn 0361-5219Article

One-step growth of ZnO/ZnS core-shell nanowires by thermal evaporationKAMAL MAHIR SULIEMAN; XINTANG HUANG; JINPING LIU et al.Smart materials and structures. 2007, Vol 16, Num 1, pp 89-92, issn 0964-1726, 4 p.Article

A low voltage time of flight electron emission microscopeKHURSHEED, Aniam.Optik (Stuttgart). 2002, Vol 113, Num 11, pp 505-509, issn 0030-4026, 5 p.Article

Miniature electrostatic column for a compact scanning electron microscopeAMBE, T; TANAKA, H; TEGURI, H et al.Microelectronic engineering. 2002, Vol 61-62, pp 317-321, issn 0167-9317Conference Paper

TelemicroscopyFAN, G. Y; MERCURIO, P. J; YOUNG, S. J et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 499-503, issn 0304-3991Conference Paper

Scanning with ease through the far infraredTEMKIN, R.Science (Washington, D.C.). 1998, Vol 280, Num 5365, issn 0036-8075, p. 854Article

Magnetic force microscope combined with a scanning electron microscopeKIKUKAWA, A; HOSAKA, S; HONDA, Y et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1993, Vol 11, Num 6, pp 3092-3098, issn 0734-2101Article

Transmission positron microscopesDOYAMA, Masao; KOGURE, Yoshiaki; INOUE, Miyoshi et al.Applied surface science. 2006, Vol 252, Num 9, pp 3126-3131, issn 0169-4332, 6 p.Conference Paper

Radial and spiral distortion of magnetic lenses with fields of the form B(z)αzALAMIR, A. S. A.Optik (Stuttgart). 2009, Vol 120, Num 18, pp 984-986, issn 0030-4026, 3 p.Article

High brightness electron beam from a multi-walled carbon nanotubeDE JONGE, Niels; LAMY, Yann; SCHOOTS, Koen et al.Nature (London). 2002, Vol 420, Num 6914, pp 393-395, issn 0028-0836, 3 p.Article

CART : a controlled algebraic reconstruction technique for electron microscope tomography of embedded, sectioned specimenJONGES, R; BOON, P. N. M; VAN MARLE, J et al.Ultramicroscopy. 1999, Vol 76, Num 4, pp 203-219, issn 0304-3991Article

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