Optimisation and specification of Auger electron spectrometers for signal-to-noise ratio performanceSEAH, M. P; HUNT, C. P.Journal of electron spectroscopy and related phenomena. 1994, Vol 67, Num 1, pp 151-157, issn 0368-2048Article

Factor analysis of Fe M_2,3VV spectra of oxidizing iron : the role of the background in the emergence of ghost componentsKOOI, B. J; SOMERS, M. A. J.Surface and interface analysis. 1994, Vol 21, Num 8, pp 501-513, issn 0142-2421Article

On the applicability of Tougaard background subtraction to general Auger spectraBENDER, H.Surface and interface analysis. 1994, Vol 21, Num 2, pp 101-109, issn 0142-2421Conference Paper

Design and manufacture of the dipole coil for the CEBAF high momentum spectrometerBOGENSBERGER, P; MAIX, R. K; RAMSAUER, F et al.IEEE transactions on applied superconductivity. 1993, Vol 3, Num 1, pp 797-800, issn 1051-8223, 2Conference Paper

Savitzky and Golay differentiation in AESGILMORE, I. S; SEAH, M. P.Applied surface science. 1996, Vol 93, Num 3, pp 273-280, issn 0169-4332Article

Concept of quench protection and automatic control for the HMS dipole magnet system for CEBAFKÖFLER, H; KRAINZ, G; SAMMER, J et al.IEEE transactions on applied superconductivity. 1993, Vol 3, Num 1, pp 789-792, issn 1051-8223, 2Conference Paper

Development, quantitative performance and applications of a parallel electron energy-loss spectrum imaging systemBOTTON, G; L'ESPERANCE, G.Journal of microscopy (Print). 1994, Vol 173, pp 9-25, issn 0022-2720, 1Article

Structural analysis of the 7.5 GeV superconducting dipole for the CEBAF high momentum spectrometerWINES, R; BRINDZA, P; FOWLER, M et al.IEEE transactions on applied superconductivity. 1993, Vol 3, Num 1, pp 793-796, issn 1051-8223, 2Conference Paper

Applications of work function microscopy in the onset modeSCHOLTES, J.Fresenius' journal of analytical chemistry. 1995, Vol 353, Num 5-8, pp 499-505, issn 0937-0633Conference Paper

True Auger spectral shapes : a step to standard spectraGOTO, K; SAKAKIBARA, N; TAKEICHI, Y et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 75-78, issn 0142-2421Conference Paper

Recent advances in data analysis for electron spectroscopyGAARENSTROOM, S. W.Applied surface science. 1993, Vol 70-71, Num 1-4, pp 261-265, issn 0169-4332, AConference Paper

Conversion of peak/background data for AES and coincidence spectroscopyGERGELY, G.Vacuum. 1994, Vol 45, Num 2-3, pp 317-319, issn 0042-207XConference Paper

Factor analysis, a useful tool for solving analytical problems in AES and XPS : a study of the performances and limitations of the indicator functionARRANZ, A; PALACIO, C.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 93-97, issn 0142-2421Conference Paper

Some problems of electron spectroscopy (AES, EPES) using a retarding field analyserSULYOK, A; GERGELY, G; GRUZZA, B et al.Vacuum. 1994, Vol 45, Num 2-3, pp 325-327, issn 0042-207XConference Paper

Internal scattering of electrons in a hemispherical spectrometerGREENWOOD, J. C; PRUTTON, M; ROBERTS, R. H et al.Surface and interface analysis. 1993, Vol 20, Num 11, pp 891-900, issn 0142-2421Article

AES and XPS measurements : reducing the uncertainty and improving the accuracySEAH, M. P.Applied surface science. 1993, Vol 70-71, Num 1-4, pp 1-8, issn 0169-4332, AConference Paper

Recoil broadening of the elastic peak in electron spectroscopyGERGELY, G; MENYHARD, M; BENEDEK, Zs et al.Vacuum. 2001, Vol 61, Num 2-4, pp 107-111, issn 0042-207XConference Paper

Single-electron spectroscopyASHOORI, R. C; TESSMER, S; ZHITENEV, N et al.RLE Progress report. 1997, Num 139, pp 95-102, issn 0163-9218Article

Atomic ratios determined by EELS under parallel and convergent illumination conditionsSU, D. S; WANG, H. F.Ultramicroscopy. 1995, Vol 57, Num 4, pp 323-325, issn 0304-3991Article

New technique for the simultaneous correction of topographical and backscattering artefacts in electron-excited Auger spectroscopy and microscopyCRONE, M; BARKSHIRE, I. R; PRUTTON, M et al.Surface and interface analysis. 1994, Vol 21, Num 12, pp 857-863, issn 0142-2421Article

A through the lens reflection remoderator for positronsUHLMANN, K; BRITTON, D. T; KÖGEL, G et al.Optik (Stuttgart). 1994, Vol 98, Num 1, pp 5-10, issn 0030-4026Article

Excitation processes in collisions of inert gas ions with a Mg surfaceLACOMBE, S; GUILLEMOT, L; HUELS, M et al.Surface science. 1993, Vol 295, Num 1-2, pp L1011-L1016, issn 0039-6028Article

Internal analyser inelastic scattering effects in XPS quantitative analysisBATTISTONI, C; MATTOGNO, G; RIGHINI, G et al.Surface and interface analysis. 1994, Vol 22, Num 1-12, pp 98-102, issn 0142-2421Conference Paper

Surface excitation probabilities in surface electron spectroscopiesSALMA, K; DING, Z. J; LI, H. M et al.Surface science. 2006, Vol 600, Num 7, pp 1526-1539, issn 0039-6028, 14 p.Article

The development of Auger spectroscopy as a probe of local electronic structureWEIGHTMAN, P.Microscopy microanalysis microstructures (Les Ulis). 1995, Vol 6, Num 3, pp 263-288, issn 1154-2799Article