A bounded-error approach to accuracy analysis in ellipsometrySMIT, M. K; VERHOOF, J. W.Mathematics and computers in simulation. 1990, Vol 32, Num 5-6, pp 545-551, issn 0378-4754Article

Double-search algorithm applied to ellipsometric dataBOCA, I; IOVAN, S.Revue roumaine des sciences techniques. Electrotechnique et énergétique. 1989, Vol 34, Num 1, pp 105-114, issn 0035-4066, 10 p.Article

Ellipsometric function of a film-substrate system: characterization and detailed studyYOUSEF, M. S. A; ZAGHLOUL, A.-R. M.Journal of the Optical Society of America. A, Optics and image science. 1989, Vol 6, Num 3, pp 355-366, issn 0740-3232Article

Choosing the optimum conditions for ellipsometric measurementsBORSHCHAGOVSKII, E. G; GETSKO, O. M.Optics and spectroscopy. 1991, Vol 70, Num 5, pp 669-670, issn 0030-400XArticle

Use of the biased estimator in the interpretation of spectroscopic ellipsometry dataJELLISON, G. E.Applied optics. 1991, Vol 30, Num 23, pp 3354-3360, issn 0003-6935Article

Ellipsometric data of cadmium oxide layers formed anodically in sodium hydroxide solutionsZERBINO, J. O; SAIDMAN, S. B; VILCHE, J. R et al.Electrochimica acta. 1989, Vol 34, Num 8, issn 0013-4686, 1167Article

The inverse problem of ellipsometry: a bootstrap approachROSA, R.Inverse problems. 1988, Vol 4, Num 3, pp 887-900, issn 0266-5611Article

Solution complète du problème inverse de l'ellipsométrie pour un système à une couche quand on fait varier l'épaisseur et l'angle d'incidence de la lumièreDAGMAN, EH. E.Optika i spektroskopiâ. 1988, Vol 65, Num 5, pp 1150-1155, issn 0030-4034Article

Performance of an automated rotating-detector ellipsometerNICK, D. C; AZZAM, R. M. A.Review of scientific instruments. 1989, Vol 60, Num 12, pp 3625-3632, issn 0034-6748Article

Au sujet de l'emploi de bandes de mesure dans les déterminations ellipsométriquesKHASANOV, T. KH.Optika i spektroskopiâ. 1988, Vol 64, Num 5, pp 1087-1090, issn 0030-4034Article

Measurement of the thickness of the surface layer on amorphous Ge films using spectroscopic ellipsometry: validity of effective medium modelingMCMARR, P. J; BLANCO, J. R.Applied optics. 1988, Vol 27, Num 20, pp 4265-4273, issn 0003-6935Article

Integrated automatic modular measuring systemBAIKIE, I. D; VAN DER WERF, K. O; HANEKAMP, L. J et al.Review of scientific instruments. 1988, Vol 59, Num 9, pp 2075-2078, issn 0034-6748Article

Improvements of phase-modulated ellipsometryACHER, O; BIGAN, E; DREVILLON, B et al.Review of scientific instruments. 1989, Vol 60, Num 1, pp 65-77, issn 0034-6748Article

An elementary model for control of a semiconductor etching processMADHUKAR, A; PARENT, T; ROSEN, I. G et al.SIAM review (Print). 2002, Vol 44, Num 4, pp 678-695, issn 0036-1445, 18 p.Article

International Conference on Spectroscopic Ellipsometry (ICSE 4)ARWIN, Hans; BECK, Uwe; SCHUBERT, Matthias et al.Physica status solidi. A, Applications and materials science (Print). 2008, Vol 205, Num 4, pp 709-948, issn 1862-6300, 239 p.Conference Paper

Refractive index profile measurement of compound thin films by ellipsometryHO, J. H; LEE, C. L; LEI, T. F et al.Electronics Letters. 1989, Vol 25, Num 16, pp 1084-1086, issn 0013-5194, 3 p.Article

L'ellipsométrie des revêtements submonomoléculaires sur des surfaces anisotropesVITLINA, R. Z; CHAPLIK, A. V.Optika i spektroskopiâ. 1988, Vol 65, Num 1, pp 204-206, issn 0030-4034Article

Cryogenic spectrometric ellipsometer for studding solid state optical propertiesBELYAEVA, A. I; GREBENNIK, T. G.SPIE proceedings series. 1998, pp 401-407, isbn 0-8194-2808-6Conference Paper

Automatic rotating element ellipsometers : calibration, operation, and real-time applicationsCOLLINS, R. W.Review of scientific instruments. 1990, Vol 61, Num 8, pp 2029-2062, issn 0034-6748, 34 p.Article

Ellipsométrie de couches «épaisses»BORSHCHAGOVSKIJ, E. G; GETSKO, O. M; SNITKO, O. V et al.Optika i spektroskopiâ. 1989, Vol 66, Num 2, pp 404-410, issn 0030-4034, 7 p.Article

Two-channel polarization modulation ellipsometerJELLISON, G. E. JR; MODINE, F. A.Applied optics. 1990, Vol 29, Num 7, pp 959-974, issn 0003-6935Article

Calibration method for rotating-analyzer ellipsometersDE NIJS, J. M. M; HOLTSLAG, A. H. M; VAN SILFHOUT, A et al.Journal of the Optical Society of America. A, Optics and image science. 1988, Vol 5, Num 9, pp 1466-1471, issn 0740-3232Article

A comparison of surface sensitive reflection spectroscopies : Linear optics at surfaces and interfacesROSEBURGH, D. S; COLE, R. J.Journal of physics. Condensed matter (Print). 2004, Vol 16, Num 39, pp S4279-S4288, issn 0953-8984Article

Fullerene embedded Langmuir-Blodgett films probed by spectroscopic ellipsometryBORTCHAGOVSKY, E. G; YURCHENKO, I. A; KAZANTSEVA, Z. I et al.SPIE proceedings series. 1998, pp 38-44, isbn 0-8194-2808-6Conference Paper

Angular scanning mechanism for ellipsometersBYRNE, D. M; MACFARLANE, D. L.Applied optics. 1991, Vol 30, Num 31, pp 4471-4473, issn 0003-6935Article