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Improvement in accuracy of spectroscopic ir ellipsometry by the use of ir retardersRÖSELER, A; MOLGEDEY, W.Infrared physics. 1984, Vol 24, Num 1, pp 1-5, issn 0020-0891Article

Eine Anordnung zur spektrophotometrischen Ellipsometrie = Un montage pour l'ellipsométrie spectrophotométrique = A mounting for spectrophotometric ellipsometryABRAHAM, M; MAHMOUDI, A; TADJEDDINE, A et al.Experimentelle Technik der Physik. 1984, Vol 32, Num 5, pp 405-412, issn 0014-4924Article

Proper choice of the error function in modeling spectroellipsometric dataKIM, S. Y; VEDAM, K.Applied optics. 1986, Vol 25, Num 12, pp 2013-2021, issn 0003-6935Article

A bounded-error approach to accuracy analysis in ellipsometrySMIT, M. K; VERHOOF, J. W.Mathematics and computers in simulation. 1990, Vol 32, Num 5-6, pp 545-551, issn 0378-4754Article

Double-search algorithm applied to ellipsometric dataBOCA, I; IOVAN, S.Revue roumaine des sciences techniques. Electrotechnique et énergétique. 1989, Vol 34, Num 1, pp 105-114, issn 0035-4066, 10 p.Article

Ellipsometry with low quality polarizersSTETIU, P.Surface science. 1983, Vol 135, Num 1-3, pp 276-283, issn 0039-6028Article

Protein adsorption on solid-liquid interfaces monitored by laser-ellipsometrySEITZ, R; BRINGS, R; GEIGER, R et al.Applied surface science. 2005, Vol 252, Num 1, pp 154-157, issn 0169-4332, 4 p.Conference Paper

Effect of annealing on composition, structure and optical properties of SrHfON thin filmsFENG, Li-Ping; WANG, Yin-Quan; HAO TIAN et al.Applied surface science. 2012, Vol 258, Num 24, pp 9706-9710, issn 0169-4332, 5 p.Article

Repeatability of ellipsometric data in cholera toxin GM1-ELISA structuresCASTRO, Leon G; THOMPSON, Daniel W; TIWALD, Thomas et al.Surface science. 2007, Vol 601, Num 8, pp 1795-1803, issn 0039-6028, 9 p.Article

A comparative study of fibrinogen adsorption onto metal oxide thin filmsSILVA-BERMUDEZ, P; MUHL, S; RODIL, S. E et al.Applied surface science. 2013, Vol 282, pp 351-362, issn 0169-4332, 12 p.Article

Optical properties of hybrid polymers as barrier materialsGEORGIOU, D; LASKARAKIS, A; LOGOTHETIDIS, S et al.Applied surface science. 2009, Vol 255, Num 18, pp 8023-8029, issn 0169-4332, 7 p.Article

Fast, self-compensating spectral-scanning ellipsometerMULLER, R. H; FARMER, J. C.Review of scientific instruments. 1984, Vol 55, Num 3, pp 371-374, issn 0034-6748Article

Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k planeURBAN, F. K; BARTON, D.Thin solid films. 2014, Vol 562, pp 49-55, issn 0040-6090, 7 p.Article

Roughness measurements by spectroscopic ellipsometryBLANCO, J. R; MCMARR, P. J; VEDAM, K et al.Applied optics. 1985, Vol 24, Num 22, pp 3773-3779, issn 0003-6935Article

The analysis of optical spectra by Fourier methodsASPNES, D. E.Surface science. 1983, Vol 135, Num 1-3, pp 284-306, issn 0039-6028Article

Surface modification methods to improve behavior of biosensor based on imaging ellipsometryYU NIU; GANG JIN.Applied surface science. 2013, Vol 281, pp 84-88, issn 0169-4332, 5 p.Conference Paper

Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin filmsVENKATACHALAM, S; SOUNDARARAJAN, D; PERANANTHAM, P et al.Materials characterization. 2007, Vol 58, Num 8-9, pp 715-720, issn 1044-5803, 6 p.Conference Paper

Spectrometric ellipsometry with static analyzer : statistical error of intensity measurement and accuracy of optical functionsMUTSCHKE, H; HOPFE, V; KLOBES, P et al.Wissenschaftliche Zeitschrift der Technischen Universität Karl-Marx-Stadt/Chemnitz. 1990, Vol 32, Num 2, pp 273-285Article

Ellipsométrie à épaisseur variable de film. Application TiO2/Ti = Multifilm thickness ellipsometry. Application to TiO2/TiGAGNAIRE, A; JOSEPH, J.Journal de physique. Colloques. 1983, Vol 44, Num 10, pp C10.195-C10.198, issn 0449-1947Article

Ellipsometric characterization of inhomogeneous non-stoichiometric silicon nitride filmsNECAS, David; FRANTA, Daniel; OHLIDAL, Ivan et al.Surface and interface analysis. 2013, Vol 45, Num 7, pp 1188-1192, issn 0142-2421, 5 p.Article

5th International Conference on Spectroscopic Ellipsometry (ICSE-V)TOMPKINS, Harland G.Thin solid films. 2011, Vol 519, Num 9, issn 0040-6090, 444 p.Conference Proceedings

Absorption and spectroscopic ellipsometry study of electron irradiated magnesium aluminate spinelSHENGHONG YANG; YUELI ZHANG; DANG MO et al.International journal of materials research. 2010, Vol 101, Num 8, pp 1024-1028, issn 1862-5282, 5 p.Article

Performance of a microscopic imaging ellipsometerBEAGLEHOLE, D.Review of scientific instruments. 1988, Vol 59, Num 12, pp 2557-2559, issn 0034-6748Article

Ellipsometric function of a film-substrate system: characterization and detailed studyYOUSEF, M. S. A; ZAGHLOUL, A.-R. M.Journal of the Optical Society of America. A, Optics and image science. 1989, Vol 6, Num 3, pp 355-366, issn 0740-3232Article

Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometryMÜNZ, F; HUMLICEK, J; MARSIK, P et al.Thin solid films. 2011, Vol 519, Num 9, pp 2703-2706, issn 0040-6090, 4 p.Conference Paper

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